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运算放大器比较器检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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工业诊断 动物实验 植物学检测 环境试验

GOST 23089.1-1983 微型集成电路.和电压系数测量方法

Integrated circuits. Method of measuring the operational amplifiers and voltage comparators gain

GOST 23089.0-1978 微型集成电路.和电压的电参数测量的一般要求

Integrated circuits. General requirements at measuring electrical parameters of operational amplifiers and voltage comparators

GOST 23089.3-1983 微型集成电路.和电压零位移电动势和电压测量方法

Integrated circuits. Methods of measuring the operational amplifiers and voltage comparators zero offset voltage and emf

GOST 23089.11-1983 微型集成电路.和电压同相输入电压衰减系数测量方法

Integrated circuits. Methods of measuring the operational amplifiers and voltage comparators input common mode voltage rejection ratio

GOST 23089.4-1983 微型集成电路.和电压的输入电流差与输入电流测量方法

Integrated circuits. Method of measuring the input currents and input bias current of operational amplifiers and voltage comparators

GOST 23089.5-1983 微型集成电路.和电压的消耗电流和消耗功率的测量方法

Integrated circuits. Method of measuring the operational amplifiers and voltage comparators consumption current and power

AIR FORCE A-A-58089 NOTICE 1-2013 ,台式,电子

COMPARATOR, BENCH TYPE, ELECTRONICALLY AMPLIFIED

DLA SMD-5962-93003 REV C-2006 硅单片,装有双通道及电压基准的双重,线性微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, DUAL OPERATIONAL AMPLIFIER WITH DUAL COMPARATORS AND VOLTAGE REFERENCE, MONOLITHIC SILICON

QJ/Z 32-1977 半导体集成测试方法

Testing methods for semi-conductor integrated comparison amplifiers

DLA SMD-5962-96737-1996 精密高回转率率宽带硅单片电路线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, PRECISION, HIGH SLEW RATE, WIDEBAND OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

KS C 7201-2002 的测量方法

MEASURING METHODS FOR OPERATIONAL AMPLIFIERS

KS C 7203-1990(2017 可靠性ASSURED单片

Reliability Assured Monolithic Operational Amplifier

KS C 7201-1990(2001 通用测量方法

MEASURING METHODS FOR OPERATIONAL AMPLIFIERS

DLA DSCC-VID-V62/06641 REV A-2012 微电路、CMOS、、单片硅

MICROCIRCUIT, CMOS, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-87620 REV E-2009 微电路、混合、线性、功率

MICROCIRCUIT, HYBRID, LINEAR, HIGH POWER OPERATIONAL AMPLIFIER

GOST 23089.1-1983 微型集成电路.和电压系数测量方法

Integrated circuits. Method of measuring the operational amplifiers and voltage comparators gain

GOST 23089.0-1978 微型集成电路.和电压的电参数测量的一般要求

Integrated circuits. General requirements at measuring electrical parameters of operational amplifiers and voltage comparators

GOST 23089.3-1983 微型集成电路.和电压零位移电动势和电压测量方法

Integrated circuits. Methods of measuring the operational amplifiers and voltage comparators zero offset voltage and emf

GOST 23089.11-1983 微型集成电路.和电压同相输入电压衰减系数测量方法

Integrated circuits. Methods of measuring the operational amplifiers and voltage comparators input common mode voltage rejection ratio

GOST 23089.4-1983 微型集成电路.和电压的输入电流差与输入电流测量方法

Integrated circuits. Method of measuring the input currents and input bias current of operational amplifiers and voltage comparators

GOST 23089.5-1983 微型集成电路.和电压的消耗电流和消耗功率的测量方法

Integrated circuits. Method of measuring the operational amplifiers and voltage comparators consumption current and power

AIR FORCE A-A-58089 NOTICE 1-2013 ,台式,电子

COMPARATOR, BENCH TYPE, ELECTRONICALLY AMPLIFIED

DLA SMD-5962-93003 REV C-2006 硅单片,装有双通道及电压基准的双重,线性微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, DUAL OPERATIONAL AMPLIFIER WITH DUAL COMPARATORS AND VOLTAGE REFERENCE, MONOLITHIC SILICON

QJ/Z 32-1977 半导体集成测试方法

Testing methods for semi-conductor integrated comparison amplifiers

DLA SMD-5962-96737-1996 精密高回转率率宽带硅单片电路线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, PRECISION, HIGH SLEW RATE, WIDEBAND OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

KS C 7201-2002 的测量方法

MEASURING METHODS FOR OPERATIONAL AMPLIFIERS

KS C 7203-1990(2017 可靠性ASSURED单片

Reliability Assured Monolithic Operational Amplifier

KS C 7201-1990(2001 通用测量方法

MEASURING METHODS FOR OPERATIONAL AMPLIFIERS

DLA DSCC-VID-V62/06641 REV A-2012 微电路、CMOS、、单片硅

MICROCIRCUIT, CMOS, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-87620 REV E-2009 微电路、混合、线性、功率

MICROCIRCUIT, HYBRID, LINEAR, HIGH POWER OPERATIONAL AMPLIFIER

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