发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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本标准适用于科研、生产及商贸等领域所使用的石英晶体元件术语
Quartz crystal unit terms
Ovens for Quartz Crystal Units
General specification for quartz crystal components
GB/T 22319的本部分规定了在温度范围内石英晶体元件活性跳变的测量方法
Measurement of quartz crystal unit parameters.Part 7:Measurement of activity dips of quartz crystal units
This standard applies to activity and frequency dips for quartz crystal units over a temperature range
Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units
This part of IEC 60444 explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent
Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
GB/T 22319 的本部分规定了能精确测量引线表面贴装石英晶体元件的谐振频率、谐振电阻及等效电路参数的测量夹具,测量方法采用IEC 60444-4-1988和IEC 60444-5-1995规定的零相位技术。 使用该测量夹具的等效电路和适用的频率范围见随后条款。 此外,本部分也适用于IEC
Measurement of quartz crystal unit parameters.Part 8:Test fixture for surface mounted quartz crystal units
General specification for quartz crystal components
本规范适用于军用电子设备中使用的JA 538型石英晶体元件
Crystal unit,quartz,type JA 538,detail specification for
本标准适用于振荡器用石英晶体元件的质量分等。 本标准只给出了部分试验项目和技术指标的质量分等,不是一个完整的标准,必须与GB 12273-90《石英晶体元件总规范》和有关详细规范一起使用
Quality grading standard for quartz crystal units
Detailed specifications for XJ36 quartz crystal elements
Detailed specifications for XJ17 quartz crystal elements
Detailed specifications for XJ39 quartz crystal elements
Detail specification for XJ42 type quartz crystal element
本标准适用于科研、生产及商贸等领域所使用的石英晶体元件术语
Quartz crystal unit terms
Ovens for Quartz Crystal Units
General specification for quartz crystal components
GB/T 22319的本部分规定了在温度范围内石英晶体元件活性跳变的测量方法
Measurement of quartz crystal unit parameters.Part 7:Measurement of activity dips of quartz crystal units
This standard applies to activity and frequency dips for quartz crystal units over a temperature range
Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units
This part of IEC 60444 explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent
Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
GB/T 22319 的本部分规定了能精确测量引线表面贴装石英晶体元件的谐振频率、谐振电阻及等效电路参数的测量夹具,测量方法采用IEC 60444-4-1988和IEC 60444-5-1995规定的零相位技术。 使用该测量夹具的等效电路和适用的频率范围见随后条款。 此外,本部分也适用于IEC
Measurement of quartz crystal unit parameters.Part 8:Test fixture for surface mounted quartz crystal units
General specification for quartz crystal components
本规范适用于军用电子设备中使用的JA 538型石英晶体元件
Crystal unit,quartz,type JA 538,detail specification for
本标准适用于振荡器用石英晶体元件的质量分等。 本标准只给出了部分试验项目和技术指标的质量分等,不是一个完整的标准,必须与GB 12273-90《石英晶体元件总规范》和有关详细规范一起使用
Quality grading standard for quartz crystal units
Detailed specifications for XJ36 quartz crystal elements
Detailed specifications for XJ17 quartz crystal elements
Detailed specifications for XJ39 quartz crystal elements
Detail specification for XJ42 type quartz crystal element