采样保持放大器检测

DLA SMD-5962-90730 REV C-2009 微电路、混合、高速采样保持放大器

MICROCIRCUIT, HYBRID, HIGH SPEED TRACK AND HOLD AMPLIFIER

SJ 50597/14-1994 混合微电路详细规范HSH91型精密双采样/保持放大器

Detail specification for hybrid microcircuits HSH91 precision dual sample/hold amplifier

SJ 50597/13-1994 混合微电路详细规范HSH4860型高速精密采样/保持放大器

Detail specification for hybrid microcircuits HSH4860 high speed,precision sample/hold amplifier

GB/T 14115-1993 半导体集成电路采样/保持放大器测试方法的基本原理

本标准规定了半导体集成电路采样/保持放大器（以下简称器件）电参数测试方法的基本原理。 本标准适用于半导体集成电路采样/保持放大器的电参数测试

General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits

DLA SMD-5962-87540 REV D-2009 微电路，线性，高速，采样和保持放大器，单片硅

MICROCIRCUIT, LINEAR, HIGH SPEED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-87677 REV C-2009 微电路、线性、高速采样和保持放大器、单片硅

MICROCIRCUIT, LINEAR, HIGH SPEED SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-89940 REV B-2011 微电路、混合、线性、采样和保持、高速放大器

MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER

DLA SMD-5962-89940 REV A-2003 高速取样保持放大器,线性混合微型电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes

MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER

DLA SMD-5962-87540 REV C-2002 硅单块 取样与保持放大器高速直线式微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, HIGH SPEED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-87677 REV B-2002 硅单块 高速取样与保持放大器,直线型微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, HIGH SPEED SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-93063 REV C-2007 硅单片,高速准确取样保持放大器,线性微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-92013 REV B-2007 硅单块 四沟道取样与保持放大器,直线式微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, FOUR CHANNEL SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

JJG 956-2013 大气采样器

本规程适用于大气采样器的首次检定、后续检定和使用中检查

Air Samplers

KS A 4726-2013 放射性碘采样器

Radioactive iodine samplers

KS A 4422-1997(2022 放射性粉尘采样器

Radioactive dust samplers

DLA SMD-5962-90730 REV C-2009 微电路、混合、高速采样保持放大器

MICROCIRCUIT, HYBRID, HIGH SPEED TRACK AND HOLD AMPLIFIER

SJ 50597/14-1994 混合微电路详细规范HSH91型精密双采样/保持放大器

Detail specification for hybrid microcircuits HSH91 precision dual sample/hold amplifier

SJ 50597/13-1994 混合微电路详细规范HSH4860型高速精密采样/保持放大器

Detail specification for hybrid microcircuits HSH4860 high speed,precision sample/hold amplifier

GB/T 14115-1993 半导体集成电路采样/保持放大器测试方法的基本原理

本标准规定了半导体集成电路采样/保持放大器（以下简称器件）电参数测试方法的基本原理。 本标准适用于半导体集成电路采样/保持放大器的电参数测试

General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits

DLA SMD-5962-87540 REV D-2009 微电路，线性，高速，采样和保持放大器，单片硅

MICROCIRCUIT, LINEAR, HIGH SPEED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-87677 REV C-2009 微电路、线性、高速采样和保持放大器、单片硅

MICROCIRCUIT, LINEAR, HIGH SPEED SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-89940 REV B-2011 微电路、混合、线性、采样和保持、高速放大器

MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER

DLA SMD-5962-89940 REV A-2003 高速取样保持放大器,线性混合微型电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes

MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER

DLA SMD-5962-87540 REV C-2002 硅单块 取样与保持放大器高速直线式微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, HIGH SPEED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-87677 REV B-2002 硅单块 高速取样与保持放大器,直线型微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, HIGH SPEED SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-93063 REV C-2007 硅单片,高速准确取样保持放大器,线性微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-92013 REV B-2007 硅单块 四沟道取样与保持放大器,直线式微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, FOUR CHANNEL SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

JJG 956-2013 大气采样器

本规程适用于大气采样器的首次检定、后续检定和使用中检查

Air Samplers

KS A 4726-2013 放射性碘采样器

Radioactive iodine samplers

KS A 4422-1997(2022 放射性粉尘采样器

Radioactive dust samplers