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Semiconductor Integrated Circuit Hall Circuit Test Method
This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect
Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect
Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
本标准规定了霍尔锚的产品分类、技术条件等。 本标准适用于各类船舶和海上建筑物用的霍尔锚
Hall anchor
本标准规定了霍尔电流传感器的分类、技术要求、试验方法、检验规则及标志、包装、运输和贮存。 本标准适用于采用霍尔元件制作的电流传感器
Hall effect current sensor
本标准规定了霍尔锚的型式、结构和基本尺寸、标记、要求、试验方法、检验规则和标志等。 本标准适用于各类船舶和水上建筑物用霍尔锚的设计、制造和验收
Hall anchor
Przedmiotem normy s? kotwice Halla o masie nominalnej 50 r 29.000 kg, stosowane na statkach wodnych
Hall anchors
本标准规定了霍尔电流传感器的分类、技术要求、试验方法、检验规则及标志、包装、运输和贮存。 本标准适用于采用霍尔元件制作的电流传感器
Hall current sensor
本标准规定了霍尔效应磁强计产品分类、要求、试验方法、检验规则、标志、使用说明书、包装、运输和贮存。 本标准适用于以霍尔元件做传感器，通过测量霍尔电势而间接测量直流磁场和交流磁场的模拟式和数字式仪器
Hall effect magnetometers
本标准适用于单芯片之电阻率，霍尔系数及霍尔移动率之测量及计算
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
Calibration Specifications for Hall Current Sensors
Hall current sensor calibration specifications
1.1 These test methods cover two procedures for measuring the resistivity and Hall coefficient of single-crystal semiconductor specimens
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall coefficient
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Semiconductor Integrated Circuit Hall Circuit Test Method
This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect
Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect
Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
本标准规定了霍尔锚的产品分类、技术条件等。 本标准适用于各类船舶和海上建筑物用的霍尔锚
Hall anchor
本标准规定了霍尔电流传感器的分类、技术要求、试验方法、检验规则及标志、包装、运输和贮存。 本标准适用于采用霍尔元件制作的电流传感器
Hall effect current sensor
本标准规定了霍尔锚的型式、结构和基本尺寸、标记、要求、试验方法、检验规则和标志等。 本标准适用于各类船舶和水上建筑物用霍尔锚的设计、制造和验收
Hall anchor
Przedmiotem normy s? kotwice Halla o masie nominalnej 50 r 29.000 kg, stosowane na statkach wodnych
Hall anchors
本标准规定了霍尔电流传感器的分类、技术要求、试验方法、检验规则及标志、包装、运输和贮存。 本标准适用于采用霍尔元件制作的电流传感器
Hall current sensor
本标准规定了霍尔效应磁强计产品分类、要求、试验方法、检验规则、标志、使用说明书、包装、运输和贮存。 本标准适用于以霍尔元件做传感器，通过测量霍尔电势而间接测量直流磁场和交流磁场的模拟式和数字式仪器
Hall effect magnetometers
本标准适用于单芯片之电阻率，霍尔系数及霍尔移动率之测量及计算
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
Calibration Specifications for Hall Current Sensors
Hall current sensor calibration specifications
1.1 These test methods cover two procedures for measuring the resistivity and Hall coefficient of single-crystal semiconductor specimens
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall coefficient
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
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