GB/T 42838-2023 半导体集成电路 霍尔电路测试方法
Semiconductor Integrated Circuit Hall Circuit Test Method
BS IEC 60747-14-2:2001 分立半导体器件和集成电路.半导体器件.半导体传感器.霍尔元件
This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect
Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-2:2000 分立半导体器件和集成电路.半导体器件.半导体传感器.霍尔元件
This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect
Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
GB/T 546-1997 霍尔锚
本标准规定了霍尔锚的产品分类、技术条件等。 本标准适用于各类船舶和海上建筑物用的霍尔锚
Hall anchor
JB/T 7490-2007 霍尔电流传感器
本标准规定了霍尔电流传感器的分类、技术要求、试验方法、检验规则及标志、包装、运输和贮存。 本标准适用于采用霍尔元件制作的电流传感器
Hall effect current sensor
GB/T 546-2016 霍尔锚
本标准规定了霍尔锚的型式、结构和基本尺寸、标记、要求、试验方法、检验规则和标志等。 本标准适用于各类船舶和水上建筑物用霍尔锚的设计、制造和验收
Hall anchor
PN W83052-1991 霍尔锚
Przedmiotem normy s? kotwice Halla o masie nominalnej 50 r 29.000 kg, stosowane na statkach wodnych
Hall anchors
JB/T 7490-1994 霍尔电流传感器
本标准规定了霍尔电流传感器的分类、技术要求、试验方法、检验规则及标志、包装、运输和贮存。 本标准适用于采用霍尔元件制作的电流传感器
Hall current sensor
JB/T 9296-1999 霍尔效应磁强计
本标准规定了霍尔效应磁强计产品分类、要求、试验方法、检验规则、标志、使用说明书、包装、运输和贮存。 本标准适用于以霍尔元件做传感器，通过测量霍尔电势而间接测量直流磁场和交流磁场的模拟式和数字式仪器
Hall effect magnetometers
CNS 13623-1995 单芯片之电阻率、霍尔系数及霍尔移动率之测定法（范德普法）
本标准适用于单芯片之电阻率，霍尔系数及霍尔移动率之测量及计算
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
JJF(机械) 1067-2021 霍尔电流传感器校准规范
Calibration Specifications for Hall Current Sensors
JJF(机械)1067-2021 霍尔电流传感器校准规范
Hall current sensor calibration specifications
ASTM F76-86(1996)e1 测量单晶半导体的电阻率、霍尔系数及霍尔迁移率的试验方法
1.1 These test methods cover two procedures for measuring the resistivity and Hall coefficient of single-crystal semiconductor specimens
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F76-86(2002 测量单晶半导体的电阻率、霍尔系数及霍尔迁移率的试验方法
In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F76-08 测量单晶半导体的电阻率、霍尔系数及霍尔迁移率的试验方法
In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall coefficient
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
GB/T 42838-2023 半导体集成电路 霍尔电路测试方法
Semiconductor Integrated Circuit Hall Circuit Test Method
BS IEC 60747-14-2:2001 分立半导体器件和集成电路.半导体器件.半导体传感器.霍尔元件
This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect
Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
BS IEC 60747-14-2:2000 分立半导体器件和集成电路.半导体器件.半导体传感器.霍尔元件
This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect
Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
GB/T 546-1997 霍尔锚
本标准规定了霍尔锚的产品分类、技术条件等。 本标准适用于各类船舶和海上建筑物用的霍尔锚
Hall anchor
JB/T 7490-2007 霍尔电流传感器
本标准规定了霍尔电流传感器的分类、技术要求、试验方法、检验规则及标志、包装、运输和贮存。 本标准适用于采用霍尔元件制作的电流传感器
Hall effect current sensor
GB/T 546-2016 霍尔锚
本标准规定了霍尔锚的型式、结构和基本尺寸、标记、要求、试验方法、检验规则和标志等。 本标准适用于各类船舶和水上建筑物用霍尔锚的设计、制造和验收
Hall anchor
PN W83052-1991 霍尔锚
Przedmiotem normy s? kotwice Halla o masie nominalnej 50 r 29.000 kg, stosowane na statkach wodnych
Hall anchors
JB/T 7490-1994 霍尔电流传感器
本标准规定了霍尔电流传感器的分类、技术要求、试验方法、检验规则及标志、包装、运输和贮存。 本标准适用于采用霍尔元件制作的电流传感器
Hall current sensor
JB/T 9296-1999 霍尔效应磁强计
本标准规定了霍尔效应磁强计产品分类、要求、试验方法、检验规则、标志、使用说明书、包装、运输和贮存。 本标准适用于以霍尔元件做传感器，通过测量霍尔电势而间接测量直流磁场和交流磁场的模拟式和数字式仪器
Hall effect magnetometers
CNS 13623-1995 单芯片之电阻率、霍尔系数及霍尔移动率之测定法（范德普法）
本标准适用于单芯片之电阻率，霍尔系数及霍尔移动率之测量及计算
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
JJF(机械) 1067-2021 霍尔电流传感器校准规范
Calibration Specifications for Hall Current Sensors
JJF(机械)1067-2021 霍尔电流传感器校准规范
Hall current sensor calibration specifications
ASTM F76-86(1996)e1 测量单晶半导体的电阻率、霍尔系数及霍尔迁移率的试验方法
1.1 These test methods cover two procedures for measuring the resistivity and Hall coefficient of single-crystal semiconductor specimens
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F76-86(2002 测量单晶半导体的电阻率、霍尔系数及霍尔迁移率的试验方法
In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F76-08 测量单晶半导体的电阻率、霍尔系数及霍尔迁移率的试验方法
In order to choose the proper material for producing semiconductor devices, knowledge of material properties such as resistivity, Hall coefficient
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
编辑：北检院编辑部
