发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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Semiconductor integrated circuits.Detail specification for type JC4504 of CMOS Hex TTL/CMOS to CMOS converters
Semiconductor TTL Integrated Digital Circuit Testing Method
本规范规定了半导体集成电路CMOS型门阵列器件的详细要求。 本规范适用于器件的研制、生产和采购
Semiconductor integrated circuits Specification for COMS gate array devices
本标准规定了半导体集成电路CMOS电路电特性测试方法的基本原理。 本标准适用于半导体集成电路CMOS电路电特性的测试
Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
Semiconductor integrated circuits.Detail specification for type JC4085,JC4086,JC4070,JC4077 CMOS gates
Semiconductor integrated circuits General principles of measuring methods for TTL circuits
本标准规定了半导体集成电路TTL电路PAL系列的品种(以下简称器件)的名称、引出端排列、功能框图、逻辑图和主要特性(包括输入、输出特性和主要电参数)。 器件的质量评定应符合器件有关详细规范的规定。 生产(研制)或选用器件时,应符合本标准的规定。 若特殊说明,本标准涉及的
Series and products for TTL semiconductor integrated circuits-Products of series PAL
Detailed specifications for CMOS inverters in semiconductor integrated circuits
Semiconductor integrated circuit CMOS gate array device specifications
Semiconductor integrated circuit CMOS switch (JC4066) detailed specification
Detailed specification for semiconductor integrated circuits CMOS digital gate arrays
Semiconductor integrated circuit CMOS adder (JC4008) detailed specification
Semiconductor integrated circuit CMOS decoder (JC4028) detailed specifications
本标准规了下列集成电路(IC)分类体系树(见图1)中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
Semiconductor integrated circuits.Detail specification for type JC4504 of CMOS Hex TTL/CMOS to CMOS converters
Semiconductor TTL Integrated Digital Circuit Testing Method
本规范规定了半导体集成电路CMOS型门阵列器件的详细要求。 本规范适用于器件的研制、生产和采购
Semiconductor integrated circuits Specification for COMS gate array devices
本标准规定了半导体集成电路CMOS电路电特性测试方法的基本原理。 本标准适用于半导体集成电路CMOS电路电特性的测试
Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
Semiconductor integrated circuits.Detail specification for type JC4085,JC4086,JC4070,JC4077 CMOS gates
Semiconductor integrated circuits General principles of measuring methods for TTL circuits
本标准规定了半导体集成电路TTL电路PAL系列的品种(以下简称器件)的名称、引出端排列、功能框图、逻辑图和主要特性(包括输入、输出特性和主要电参数)。 器件的质量评定应符合器件有关详细规范的规定。 生产(研制)或选用器件时,应符合本标准的规定。 若特殊说明,本标准涉及的
Series and products for TTL semiconductor integrated circuits-Products of series PAL
Detailed specifications for CMOS inverters in semiconductor integrated circuits
Semiconductor integrated circuit CMOS gate array device specifications
Semiconductor integrated circuit CMOS switch (JC4066) detailed specification
Detailed specification for semiconductor integrated circuits CMOS digital gate arrays
Semiconductor integrated circuit CMOS adder (JC4008) detailed specification
Semiconductor integrated circuit CMOS decoder (JC4028) detailed specifications
本标准规了下列集成电路(IC)分类体系树(见图1)中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits