发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Coaxial Air Line
Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Waveguide
Testing method for complex dielectric constant of nonmetallic magnetic materials at high frequencies
Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods (IEC 62810:2015); German version EN 62810:2015
The object of this International Standard is to describe a measurement method of dielectric properties in the planar direction of dielectric plate
Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
本方法适用于微波固体电介质复介电常数的测量。 适用频率范围:f=(2~18)GHz 测试范围:ε′=2~10 tanδε=1×10-4~5×10<上标-3
Test method for complex permittivity of solid dielectric materials at microwave frequencies--Perturbation method
本标准测试对象是固体电介质材料
Test method for the complex permittivity of solid dielectric materials at microwave frequencies--
本标准规定了均匀的、各向同性的固体电介质材料微波复介电常数的测试方法。 本标准适用于频率范围为2GHz~18GHz内复介电常数的测定。推荐测试频率为9.5GHz。其测定范围:相对介电常数实部ε′为2~20,介质电损耗角正切tanδ。为1×10-4~5×10 <上标-3
Test method for complex permittivity of solid dielectric materials at microwave frequencies
本标准规定了用同轴线终端开路法测试各向同性的团体、液体电介质材料的微波复介电常数。 本标准涉及的复介电常数由相对介电常数实部,和介质损耗角正切tan所表示
Detail specification for electronic components--Semiconductor integrated circuits--CT54LS00/CT74LS00 Quad 2-input positive-NAND gate
本标准规定了固体电介质微波复介电常数的"重入腔"测试方法。 本方法适用于射频、微波固体电介质复介电常数的测量
Detail specification for electronic components--Semiconductor integrated circuits--CT54LS112/CT74LS112 dual J-K negative-edge flip-flop
This part of IEC 61338 describes the measurement method of dielectric properties for dielectric resonator materials at millimetre-wave frequency
Waveguide type dielectric resonators — Part 1-4: General information and test conditions — Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
This part of IEC 61338 describes the measurement method of dielectric properties for dielectric resonator materials at millimetr-wave frequency
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency (IEC 61338-1-4:2005); German version EN 61338-1-
Standard Test Method for Complex Dielectric Constant of Nonmetallic Magnetic Materials at Microwave Frequencies
Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Coaxial Air Line
Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Waveguide
Testing method for complex dielectric constant of nonmetallic magnetic materials at high frequencies
Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods (IEC 62810:2015); German version EN 62810:2015
The object of this International Standard is to describe a measurement method of dielectric properties in the planar direction of dielectric plate
Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
本方法适用于微波固体电介质复介电常数的测量。 适用频率范围:f=(2~18)GHz 测试范围:ε′=2~10 tanδε=1×10-4~5×10<上标-3
Test method for complex permittivity of solid dielectric materials at microwave frequencies--Perturbation method
本标准测试对象是固体电介质材料
Test method for the complex permittivity of solid dielectric materials at microwave frequencies--
本标准规定了均匀的、各向同性的固体电介质材料微波复介电常数的测试方法。 本标准适用于频率范围为2GHz~18GHz内复介电常数的测定。推荐测试频率为9.5GHz。其测定范围:相对介电常数实部ε′为2~20,介质电损耗角正切tanδ。为1×10-4~5×10 <上标-3
Test method for complex permittivity of solid dielectric materials at microwave frequencies
Cavity resonator method to measure the complex permittivity of low-loss dielectric plates (IEC 62562:2010); German version EN 62562:2011
本标准规定了用同轴线终端开路法测试各向同性的团体、液体电介质材料的微波复介电常数。 本标准涉及的复介电常数由相对介电常数实部,和介质损耗角正切tan所表示
Detail specification for electronic components--Semiconductor integrated circuits--CT54LS00/CT74LS00 Quad 2-input positive-NAND gate
本标准规定了固体电介质微波复介电常数的"重入腔"测试方法。 本方法适用于射频、微波固体电介质复介电常数的测量
Detail specification for electronic components--Semiconductor integrated circuits--CT54LS112/CT74LS112 dual J-K negative-edge flip-flop
This part of IEC 61338 describes the measurement method of dielectric properties for dielectric resonator materials at millimetre-wave frequency
Waveguide type dielectric resonators — Part 1-4: General information and test conditions — Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
This part of IEC 61338 describes the measurement method of dielectric properties for dielectric resonator materials at millimetr-wave frequency
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency (IEC 61338-1-4:2005); German version EN 61338-1-