发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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本标准适用于电热式红外辐射加热器(以下简称加热器)的光谱法向发射率测量。测量波长范围为2.5~15μm,温度范围为500~900K
Measuring method for normal spectral emittance of infrared heater
本标准适用于金属和非金属材料试样的光谱法向发射率的精确测定。测试波长范围不小于2.5~25.0μm,温度范围为700~1300K
Test method for normal spectral emittance of metals and nonmetallic materials
本标准适用于电热式红外辐射加热器(以下简称加热器)的全法向发射率测量。测量波长范围不小于1~25μm,温度范围为500~900K
Measuring method for normal total emittance of infrared heater
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
This International Standard describes three methods for measuring the lateral resolution achievable in Auger electron spectrometers and X-ray
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO 18516:2006 describes three methods for measuring the lateral resolution achievable in Auger electron spectrometers and X-ray photoelectron
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
Standard Test Method for Normal Spectral Emittance at Elevated Temperatures
本标准规定了锌中的铅、镉、铁、铜、锡量的测定方法。 本标准适用于锌中的铅、镉、铁、铜、锡量的测定。测定范围见表1
Methods for analysis of zinc.The optical emission spectrometry
本标准规定平纤壳之单模(1)和 Ia 级多模光纤的折射率径向分布图,其中包括纤核、纤壳和保护层之检验法。
通常沿着光纤之直径扫描,所量测之数据既为以半径为函数的相对折射率。正规化后,纤核与纤壳折射率之差应在准确度 +-0.001 内,折射率之绝对值较不精确,分辨率的误
Method of Test for Fiber Optic Devices ( FOTP-44 Refractive Index Profile, Refracted Ray Method)
本规程适用于发射光谱仪(以下简称仪器)的首次检定、后续检定和使用中检验。仪器的定型鉴定和样机试验中有关计量性能试验可参照本规程进行
Emission Spectrometer
이 규격은 티타늄의 방출 분광 분석 방법에 대하여 규정한다. 정량 원소 및 정량 범위는
Method for atomic emission spectrometric analysis of titanium
本标准规定了钨及钨化合物中铁、硅、铝、锰、镁、镍、钛、钒、钴、镉、砷、铅、铋、锡、锑、铜、铬、钙、钼含量的测定方法。 本标准规定了钨及钨化合物中铁、硅、铝、锰、镁、镍、钛、钒、钴、镉、砷、铅、铋、锡、锑、铜、铬、钙、钼含量的测定
Methods for emission spectrum analysis of tungsten
本标准规定了钼及钼化合物中铁、钴、铬、镉、锰、镁、钙、钛、铜、硅、锡、镍、铝、锑、铅、铋、钒含量的测定方法。 本标准适用于钼及钼化合物中铁、钴、铬、镉、锰、镁、钙、钛、铜、硅、锡、镍、铝、锑、铅、铋、钒含量的测定
Methods for emission spectrum analysis of molybdenum
Methods of measurement for semiconductor infrared diodes Methods of measurement for normal radiance
本标准适用于电热式红外辐射加热器(以下简称加热器)的光谱法向发射率测量。测量波长范围为2.5~15μm,温度范围为500~900K
Measuring method for normal spectral emittance of infrared heater
本标准适用于金属和非金属材料试样的光谱法向发射率的精确测定。测试波长范围不小于2.5~25.0μm,温度范围为700~1300K
Test method for normal spectral emittance of metals and nonmetallic materials
本标准适用于电热式红外辐射加热器(以下简称加热器)的全法向发射率测量。测量波长范围不小于1~25μm,温度范围为500~900K
Measuring method for normal total emittance of infrared heater
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
This International Standard describes three methods for measuring the lateral resolution achievable in Auger electron spectrometers and X-ray
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO 18516:2006 describes three methods for measuring the lateral resolution achievable in Auger electron spectrometers and X-ray photoelectron
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
Standard Test Method for Normal Spectral Emittance at Elevated Temperatures
本标准规定了锌中的铅、镉、铁、铜、锡量的测定方法。 本标准适用于锌中的铅、镉、铁、铜、锡量的测定。测定范围见表1
Methods for analysis of zinc.The optical emission spectrometry
本标准规定平纤壳之单模(1)和 Ia 级多模光纤的折射率径向分布图,其中包括纤核、纤壳和保护层之检验法。
通常沿着光纤之直径扫描,所量测之数据既为以半径为函数的相对折射率。正规化后,纤核与纤壳折射率之差应在准确度 +-0.001 内,折射率之绝对值较不精确,分辨率的误
Method of Test for Fiber Optic Devices ( FOTP-44 Refractive Index Profile, Refracted Ray Method)
本规程适用于发射光谱仪(以下简称仪器)的首次检定、后续检定和使用中检验。仪器的定型鉴定和样机试验中有关计量性能试验可参照本规程进行
Emission Spectrometer
이 규격은 티타늄의 방출 분광 분석 방법에 대하여 규정한다. 정량 원소 및 정량 범위는
Method for atomic emission spectrometric analysis of titanium
本标准规定了钨及钨化合物中铁、硅、铝、锰、镁、镍、钛、钒、钴、镉、砷、铅、铋、锡、锑、铜、铬、钙、钼含量的测定方法。 本标准规定了钨及钨化合物中铁、硅、铝、锰、镁、镍、钛、钒、钴、镉、砷、铅、铋、锡、锑、铜、铬、钙、钼含量的测定
Methods for emission spectrum analysis of tungsten
本标准规定了钼及钼化合物中铁、钴、铬、镉、锰、镁、钙、钛、铜、硅、锡、镍、铝、锑、铅、铋、钒含量的测定方法。 本标准适用于钼及钼化合物中铁、钴、铬、镉、锰、镁、钙、钛、铜、硅、锡、镍、铝、锑、铅、铋、钒含量的测定
Methods for emission spectrum analysis of molybdenum
Methods of measurement for semiconductor infrared diodes Methods of measurement for normal radiance