发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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Specification for verification of capacitor parameter testers for semiconductor discrete devices
Specification for verification of DC parameter testers for semiconductor discrete devices
Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification.
Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic sevices
本标准规定了计算机辅助设计印制板(PCB)用电子元器件图形库中的半导体分立器件图形设计规范。 本标准适用于计算机辅助设计印制板。 手工设计印制板也可参照采用
Graphic base of electronic components graphics of semiconductor discrete device
Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers
本标准给出了下列类型和分类型器件的标准: ·半导体光发射器件,包括: --发光二极管(LEDS); --红外发射二极管(IRED) --激光二极管和激光二极管组件 --光电子显示器件(在考虑中)。 .半导体光电探测器件,包括
Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices
Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
이 규격은 소자의 다음 범주 또는 하위 범주에 적용된다:다음을 포함하는 반도체 포토
Semiconductor devices-Discrete devices-Part 5:Optoelectronic devices
This part of IEC 60747 deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
Electronic components. Long-term storage of electronic semiconductor devices. Micro-electromechanical devices
Specification for verification of capacitor parameter testers for semiconductor discrete devices
Specification for verification of DC parameter testers for semiconductor discrete devices
Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification.
Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic sevices
本标准规定了计算机辅助设计印制板(PCB)用电子元器件图形库中的半导体分立器件图形设计规范。 本标准适用于计算机辅助设计印制板。 手工设计印制板也可参照采用
Graphic base of electronic components graphics of semiconductor discrete device
Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers
本标准给出了下列类型和分类型器件的标准: ·半导体光发射器件,包括: --发光二极管(LEDS); --红外发射二极管(IRED) --激光二极管和激光二极管组件 --光电子显示器件(在考虑中)。 .半导体光电探测器件,包括
Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices
Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
이 규격은 소자의 다음 범주 또는 하위 범주에 적용된다:다음을 포함하는 반도체 포토
Semiconductor devices-Discrete devices-Part 5:Optoelectronic devices
This part of IEC 60747 deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
Electronic components. Long-term storage of electronic semiconductor devices. Micro-electromechanical devices