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半导体检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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军工检测 其他检测

CSN 35 8701-1975 器件的术语

Terminology of semiconductors and semiconductor devices

BS IEC 60747-14-5:2010 器件.传感器.PN-结点温度传感器

Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor

BS IEC 60747-6:2016 器件.分立器件.闸流管

Semiconductor devices. Discrete devices. Thyristors

BS IEC 60747-14-4:2011 器件.分立器件.加速器

Semiconductor devices. Discrete devices. Semiconductor accelerometers

BS IEC 60747-14-2:2000 分立器件和集成电路.器件.传感器.霍尔元件

This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect

Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements

BS IEC 60747-14-2:2001 分立器件和集成电路.器件.传感器.霍尔元件

This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect

Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements

BS IEC 60747-14-3:2009 设备.传感器.压力传感器

Semiconductor devices - Semiconductor sensors - Pressure sensors

IEC 60747-14-5:2010 器件.第14-5部分:传感器.PN-结点温度传感器

This standard is applicable to semiconductor PN-junction temperature sensors and defines terms@ definitions@ symbols@ essential ratings

Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

DIN IEC 60747-11:1992 器件.第11部分:器件分规范

The standard contains the sectional specification for discrete semiconductor devices within the IEC-quality assessment system for electronic devices

Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985

CSN 35 8701 Z1-1997 命名

BS IEC 60747-14-1:2001 分立式器件和集成电路.器件.传感器.总则和分类.传感器总则和传感器分类

Describes general items concerning the specifications for sensors

Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors

GJB 33/16-2011 光电子器件 3DU32型光敏晶管详细规范

本规范规定了3DU32型半导体光敏晶体管(以下简称“器件”)的详细要求。 本规范适用于器件的研制、生产和采购

Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor

SJ 2433-1984 管焊片

Bonding sheet for semiconductor tubes

JUS N.R1.322-1979 装置的术语及定义.闸流管

Terms and definitions for semiconductor ?evices. Thyristors

BS EN 60747-15:2004 分立器件.绝缘的功率器件

This part of IEC 60747 gives the product specific standards, requirements and test methods for isolated power semiconductor devices

Discrete semiconductor devices. Isolated power semiconductor devices

CSN 35 8701-1975 器件的术语

Terminology of semiconductors and semiconductor devices

BS IEC 60747-14-5:2010 器件.传感器.PN-结点温度传感器

Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor

BS IEC 60747-6:2016 器件.分立器件.闸流管

Semiconductor devices. Discrete devices. Thyristors

BS IEC 60747-14-4:2011 器件.分立器件.加速器

Semiconductor devices. Discrete devices. Semiconductor accelerometers

BS IEC 60747-14-2:2000 分立器件和集成电路.器件.传感器.霍尔元件

This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect

Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements

BS IEC 60747-14-2:2001 分立器件和集成电路.器件.传感器.霍尔元件

This part of IEC 60747 provides standards for packaged semiconductor Hall elements which utilize the Hall effect

Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements

BS IEC 60747-14-3:2009 设备.传感器.压力传感器

Semiconductor devices - Semiconductor sensors - Pressure sensors

IEC 60747-14-5:2010 器件.第14-5部分:传感器.PN-结点温度传感器

This standard is applicable to semiconductor PN-junction temperature sensors and defines terms@ definitions@ symbols@ essential ratings

Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

DIN IEC 60747-11:1992 器件.第11部分:器件分规范

The standard contains the sectional specification for discrete semiconductor devices within the IEC-quality assessment system for electronic devices

Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985

CSN 35 8701 Z1-1997 命名

BS IEC 60747-14-1:2001 分立式器件和集成电路.器件.传感器.总则和分类.传感器总则和传感器分类

Describes general items concerning the specifications for sensors

Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors

GJB 33/16-2011 光电子器件 3DU32型光敏晶管详细规范

本规范规定了3DU32型半导体光敏晶体管(以下简称“器件”)的详细要求。 本规范适用于器件的研制、生产和采购

Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor

SJ 2433-1984 管焊片

Bonding sheet for semiconductor tubes

JUS N.R1.322-1979 装置的术语及定义.闸流管

Terms and definitions for semiconductor ?evices. Thyristors

BS EN 60747-15:2004 分立器件.绝缘的功率器件

This part of IEC 60747 gives the product specific standards, requirements and test methods for isolated power semiconductor devices

Discrete semiconductor devices. Isolated power semiconductor devices

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