GB/T 4377-2018 半导体集成电路 电压调整器测试方法
本标准规定了电压调整器(以下称为器件)参数测试方法。 本标准适用于半导体集成电路领域中电压调整器参数的测试
Semiconductor integrated circuits.Measuring method of voltage regulators
GB/T 4376-1994 半导体集成电路 电压调整器系列和品种
本标准规定了半导体集成电路电压调整器（以下简称器件）的系列和品种，并给出了每一品种的引出端排列、推荐线路或功能框图及主要电参数。 本标准适用于器件的生产、研制或使用时的选型
Series and products of voltage regulators for semiconductor integrated circuits
BS IEC 60748-2-20:2008 半导体器件.集成电路.数字集成电路.类规范.低压集成电路
Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
GB/T 4377-1996 半导体集成电路 电压调整器测试方法的基本原理
本标准规定了半导体集成电路电压调整器（以下简称器件）电特性测试方法的基本原理。 本标准适用于半导体集成电路电压调整器电特性的测试，不适用于双端（单端口）器件
Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
BS IEC 60748-11:2000 半导体器件.集成电路.半导体集成电路(混合电路除外)的分规范
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated
Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-11:1991 半导体器件 集成电路 半导体集成电路（混合电路除外）的分规范
Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
PN T01305-1992 半导体器件．集成电路．除混合电路外的半导体集成电路分规范
Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-4:1997 半导体器件.集成电路.接口集成电路
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
BS IEC 60748-2:1997 半导体器件.集成电路.数字集成电路
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
BS IEC 60748-2:1998 半导体器件 集成电路 数字集成电路
Semiconductor devices. Integrated circuits. Digital integrated circuits
GOST R IEC 60748-11-1:2001 半导体装置集成电路.第11部分.第1节.半导体集成电路(不包括混合电路)内部目检
Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
IEC 60748-11-1:1992 半导体器件 集成电路 第11部分:第1节:半导体集成电路(不包括混合电路)内部目检
Purpose of the tests is to check the internal materials, construction and workmanship for compliance with the requirements of the applicable
Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GB/T 20515-2006 半导体器件 集成电路 第5部分:半定制集成电路
本标准规了下列集成电路（IC）分类体系树（见图1）中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
BS QC 790101:1992 电子元器件质量评估协调体系.半导体器件.集成电路.不包括混合电路的半导体集成电路分规范.不包括混合电路的半导体集成电路分规范.不包括混合电路的半导体集成电路的内目测检验
Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable
Harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits - Internal visual examination for semiconductor integ
KS C IEC 60748-11-1:2004 半导体器件.集成电路.第11部分第1节:半导体集成电路(混合电路除外)内部目视检查
이 규격의 목적은 적용 가능한 규격 요구 사항에 부합하도록 집적 회로의 내부 재료, 구
Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GB/T 4377-2018 半导体集成电路 电压调整器测试方法
本标准规定了电压调整器(以下称为器件)参数测试方法。 本标准适用于半导体集成电路领域中电压调整器参数的测试
Semiconductor integrated circuits.Measuring method of voltage regulators
GB/T 4376-1994 半导体集成电路 电压调整器系列和品种
本标准规定了半导体集成电路电压调整器（以下简称器件）的系列和品种，并给出了每一品种的引出端排列、推荐线路或功能框图及主要电参数。 本标准适用于器件的生产、研制或使用时的选型
Series and products of voltage regulators for semiconductor integrated circuits
BS IEC 60748-2-20:2008 半导体器件.集成电路.数字集成电路.类规范.低压集成电路
Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
GB/T 4377-1996 半导体集成电路 电压调整器测试方法的基本原理
本标准规定了半导体集成电路电压调整器（以下简称器件）电特性测试方法的基本原理。 本标准适用于半导体集成电路电压调整器电特性的测试，不适用于双端（单端口）器件
Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
BS IEC 60748-11:2000 半导体器件.集成电路.半导体集成电路(混合电路除外)的分规范
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated
Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-11:1991 半导体器件 集成电路 半导体集成电路（混合电路除外）的分规范
Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
PN T01305-1992 半导体器件．集成电路．除混合电路外的半导体集成电路分规范
Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-4:1997 半导体器件.集成电路.接口集成电路
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
BS IEC 60748-2:1997 半导体器件.集成电路.数字集成电路
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
BS IEC 60748-2:1998 半导体器件 集成电路 数字集成电路
Semiconductor devices. Integrated circuits. Digital integrated circuits
GOST R IEC 60748-11-1:2001 半导体装置集成电路.第11部分.第1节.半导体集成电路(不包括混合电路)内部目检
Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
IEC 60748-11-1:1992 半导体器件 集成电路 第11部分:第1节:半导体集成电路(不包括混合电路)内部目检
Purpose of the tests is to check the internal materials, construction and workmanship for compliance with the requirements of the applicable
Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GB/T 20515-2006 半导体器件 集成电路 第5部分:半定制集成电路
本标准规了下列集成电路（IC）分类体系树（见图1）中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
BS QC 790101:1992 电子元器件质量评估协调体系.半导体器件.集成电路.不包括混合电路的半导体集成电路分规范.不包括混合电路的半导体集成电路分规范.不包括混合电路的半导体集成电路的内目测检验
Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable
Harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits - Internal visual examination for semiconductor integ
KS C IEC 60748-11-1:2004 半导体器件.集成电路.第11部分第1节:半导体集成电路(混合电路除外)内部目视检查
이 규격의 목적은 적용 가능한 규격 요구 사항에 부합하도록 집적 회로의 내부 재료, 구
Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
编辑：北检院编辑部
