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本标准规定了电压调整器(以下称为器件)参数测试方法。 本标准适用于半导体集成电路领域中电压调整器参数的测试
Semiconductor integrated circuits.Measuring method of voltage regulators
本标准规定了半导体集成电路电压调整器（以下简称器件）的系列和品种，并给出了每一品种的引出端排列、推荐线路或功能框图及主要电参数。 本标准适用于器件的生产、研制或使用时的选型
Series and products of voltage regulators for semiconductor integrated circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
本标准规定了半导体集成电路电压调整器（以下简称器件）电特性测试方法的基本原理。 本标准适用于半导体集成电路电压调整器电特性的测试，不适用于双端（单端口）器件
Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated
Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
Semiconductor devices. Integrated circuits. Digital integrated circuits
Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Purpose of the tests is to check the internal materials, construction and workmanship for compliance with the requirements of the applicable
Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
本标准规了下列集成电路（IC）分类体系树（见图1）中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable
Harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits - Internal visual examination for semiconductor integ
이 규격의 목적은 적용 가능한 규격 요구 사항에 부합하도록 집적 회로의 내부 재료, 구
Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
本标准规定了电压调整器(以下称为器件)参数测试方法。 本标准适用于半导体集成电路领域中电压调整器参数的测试
Semiconductor integrated circuits.Measuring method of voltage regulators
本标准规定了半导体集成电路电压调整器（以下简称器件）的系列和品种，并给出了每一品种的引出端排列、推荐线路或功能框图及主要电参数。 本标准适用于器件的生产、研制或使用时的选型
Series and products of voltage regulators for semiconductor integrated circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
本标准规定了半导体集成电路电压调整器（以下简称器件）电特性测试方法的基本原理。 本标准适用于半导体集成电路电压调整器电特性的测试，不适用于双端（单端口）器件
Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated
Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
Semiconductor devices. Integrated circuits. Digital integrated circuits
Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Purpose of the tests is to check the internal materials, construction and workmanship for compliance with the requirements of the applicable
Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
本标准规了下列集成电路（IC）分类体系树（见图1）中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable
Harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits - Internal visual examination for semiconductor integ
이 규격의 목적은 적용 가능한 규격 요구 사항에 부합하도록 집적 회로의 내부 재료, 구
Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
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