服务热线:400-635-0567

调整二极管检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

点击量:0

军工检测 其他检测

BS IEC 60747-3:2013 半导体器件.分立器件:信号、开关

Semiconductor devices. Discrete devices: Signal, switching and regulator diodes

GB/T 6589-2002 半导体器件 分立器件 第3-2部分;信号(包括开关)和电压和电压基准(不包括温度补偿精密基准)空白详细规范

本空白详细规范是半导体器件的一系列空白详细规范之一,并应与下列国家标准和IEC标准一起使用。 GB/T12560--1999半导体器件分立器件分规范(idt IEC 60747—11:1985) IEC 60747—10(QC 700000):1991 半导体器件第l0部分分立器件和

Semiconductor devices discrete devices Part 3-2: Signal (including switching) and regulator diodes blank detail specification for voltage-regulator diodes and voltage-reference diodes (excluding temperature-compensated precision reference diodes)

IEC 60747-3:2013 半导体器件.第3部分:分立器件:信号、开关

This part of IEC 60747 gives the requirements for the following devices: ?C signal diodes (excluding diodes designed to operate at frequencies above

Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes

IEC 60747-3-2:1986 半导体器件 分立器件 第3部分:信号(包括开关)及 第2节:电压和电压基准(不包括温度补偿精密基准)空白详细规范

Applicable to quality assessment for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference

Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes. Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference d

GB 9595-1988 电子元器件详细规范 2CW412~473型硅电压

IEC 60747-3:1985 半导体器件 分立器件 第3部分:信号(包括开关)及

Deals with terminology and letter symbols, essential ratings and characteristics, measuring methods, acceptance and reliability, completing

Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes.

SJ 50033/161-2002 半导体分立器件.2CW210~251型硅电压.详细规范

Semiconductor discrete device Detail specification for silicon voltage-regulator diode for type 2CW210~251

SJ 20186-1992 半导体分立器件2CW2970~3015型硅电压详细规范

Semiconductor discrete device--Detail specification for silicon voltage regulate diodes for Types 2CW2970~3015

SJ 50033/25-1994 半导体分立器件2CW1001~2CW1005型硅电压详细规范

Semiconductor discrete device Detail specification for type 2CW1001~2CW1005 silicon voltage-regulator diode

SJ 20188-1992 半导体分立器件2CW3016~3051型电压详细规范

Semiconductor discrete device--Detail specification for silicon voltage regulate diodes for Types 2CWl3016~3051

SJ 50033/162-2003 半导体分立器件2CW1022型硅双向电压详细规范

Semiconductor discrete device Detail specification of type 2CW1022 for silicon bidirectional voltage regulator diodes

SJ 50033/26-1994 半导体分立器件.2CW1006~2CW1015型硅电压详细规范

Semiconductor discrete device.Detail specification for type 2CW1006~2CW1015 silicon voltage-regulator diode

IEC 60747-3/AMD1:1991 半导体器件 分立器件 第3部分:信号(包括开关)及 修改1

Replaces the existing sub-clauses: 2.4.3 (on page 17), 1.3 and 1.4 (on page 23), 1.2 (on page 25), 1.3 (on page 27) and 4.1 (on page 51

Semiconductor devices; discrete devices; part 3: signal (including switching) and regulator diodes; amendment 1

IEC 60747-3/AMD2:1993 半导体器件 分立器件 第3部分:信号(包括开关)及 修改2

Replaces clause 2 (Terms related to ratings and characteristics) and subclause 3.4.3 (Forward recovery time), amends the table in subclause 3.3

Semiconductor devices; discrete devices; part 3: signal (including switching) and regulator diodes; amendment 2

GJB/Z 41.2-1993 军用半导体分立器件系列型谱 信号、开关和

BS IEC 60747-3:2013 半导体器件.分立器件:信号、开关

Semiconductor devices. Discrete devices: Signal, switching and regulator diodes

GB/T 6589-2002 半导体器件 分立器件 第3-2部分;信号(包括开关)和电压和电压基准(不包括温度补偿精密基准)空白详细规范

本空白详细规范是半导体器件的一系列空白详细规范之一,并应与下列国家标准和IEC标准一起使用。 GB/T12560--1999半导体器件分立器件分规范(idt IEC 60747—11:1985) IEC 60747—10(QC 700000):1991 半导体器件第l0部分分立器件和

Semiconductor devices discrete devices Part 3-2: Signal (including switching) and regulator diodes blank detail specification for voltage-regulator diodes and voltage-reference diodes (excluding temperature-compensated precision reference diodes)

IEC 60747-3:2013 半导体器件.第3部分:分立器件:信号、开关

This part of IEC 60747 gives the requirements for the following devices: ?C signal diodes (excluding diodes designed to operate at frequencies above

Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes

IEC 60747-3-2:1986 半导体器件 分立器件 第3部分:信号(包括开关)及 第2节:电压和电压基准(不包括温度补偿精密基准)空白详细规范

Applicable to quality assessment for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference

Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes. Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference d

GB 9595-1988 电子元器件详细规范 2CW412~473型硅电压

IEC 60747-3:1985 半导体器件 分立器件 第3部分:信号(包括开关)及

Deals with terminology and letter symbols, essential ratings and characteristics, measuring methods, acceptance and reliability, completing

Semiconductor devices. Discrete devices. Part 3 : Signal (including switching) and regulator diodes.

SJ 50033/161-2002 半导体分立器件.2CW210~251型硅电压.详细规范

Semiconductor discrete device Detail specification for silicon voltage-regulator diode for type 2CW210~251

SJ 20186-1992 半导体分立器件2CW2970~3015型硅电压详细规范

Semiconductor discrete device--Detail specification for silicon voltage regulate diodes for Types 2CW2970~3015

SJ 50033/25-1994 半导体分立器件2CW1001~2CW1005型硅电压详细规范

Semiconductor discrete device Detail specification for type 2CW1001~2CW1005 silicon voltage-regulator diode

SJ 20188-1992 半导体分立器件2CW3016~3051型电压详细规范

Semiconductor discrete device--Detail specification for silicon voltage regulate diodes for Types 2CWl3016~3051

SJ 50033/162-2003 半导体分立器件2CW1022型硅双向电压详细规范

Semiconductor discrete device Detail specification of type 2CW1022 for silicon bidirectional voltage regulator diodes

SJ 50033/26-1994 半导体分立器件.2CW1006~2CW1015型硅电压详细规范

Semiconductor discrete device.Detail specification for type 2CW1006~2CW1015 silicon voltage-regulator diode

IEC 60747-3/AMD1:1991 半导体器件 分立器件 第3部分:信号(包括开关)及 修改1

Replaces the existing sub-clauses: 2.4.3 (on page 17), 1.3 and 1.4 (on page 23), 1.2 (on page 25), 1.3 (on page 27) and 4.1 (on page 51

Semiconductor devices; discrete devices; part 3: signal (including switching) and regulator diodes; amendment 1

IEC 60747-3/AMD2:1993 半导体器件 分立器件 第3部分:信号(包括开关)及 修改2

Replaces clause 2 (Terms related to ratings and characteristics) and subclause 3.4.3 (Forward recovery time), amends the table in subclause 3.3

Semiconductor devices; discrete devices; part 3: signal (including switching) and regulator diodes; amendment 2

GJB/Z 41.2-1993 军用半导体分立器件系列型谱 信号、开关和

检测流程
填写并提交定制服务需求表
技术评估和方案讨论
对选定的试验方法进行报价
合同签定与付款
按期交付检测报告和相关数据
想了解更多检测项目
请点击咨询在线工程师
点击咨询
联系我们
服务热线:400-635-0567
地址:北京市丰台区航丰路8号院1号楼1层121
邮编:10000
总机:400-635-0567
联系我们

服务热线:400-635-0567

投诉建议:010-82491398

报告问题解答:010-8646-0567-8

周期、价格等

咨询

技术咨询