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半导体集成电路电压调整器检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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军工检测 其他检测

GB/T 4377-2018 测试方法

本标准规定了电压调整器(以下称为器件)参数测试方法。 本标准适用于半导体集成电路领域中电压调整器参数的测试

Semiconductor integrated circuits.Measuring method of voltage regulators

GB/T 4376-1994 系列和品种

本标准规定了半导体集成电路电压调整器(以下简称器件)的系列和品种,并给出了每一品种的引出端排列、推荐线路或功能框图及主要电参数。 本标准适用于器件的生产、研制或使用时的选型

Series and products of voltage regulators for semiconductor integrated circuits

GB/T 4377-1996 测试方法的基本原理

本标准规定了半导体集成电路电压调整器(以下简称器件)电特性测试方法的基本原理。 本标准适用于半导体集成电路电压调整器电特性的测试,不适用于双端(单端口)器件

Semiconductor integrated circuits. General principles of measuring methods of voltage regulator

GJB 597/4A-1996 三端固定输出系列详细规范

GJB 597/14-1996 JW78L、JW79L系列三端固定输出详细规范

SJ 50597/16-1994 .JW137、JW137M、JW137L型三端可负输出详细规范

Semiconductor integrated circuits.Detail specification for type JW137,JW137M and JW137L three terminal adjustabale negative voltage regulators

SJ 50597/60-2004 JW117/JW150/JW138型三端可正输出详细规范

Semiconductor integrated circuits Detail specification for types JW117/JW150/JW138 three terminal adjustable positive voltage reference

SJ 50597/61-2005 JW1083/JW1084/JW1085/JW1086型三端可正输出低.详细规范

本规范规定了硅单片集成电路JW1083/JW1084/JW1085/JW1086型三端可调正输出低压差电压调整器(以下简称器件)的详细要求

Semiconductor integrated circuits detail specification for types JW1083/JW1084/JW1085/JW1086 three terminal adjustable low dropout positive voltage regulators

BS IEC 60748-2-20:2008 件..数字.类规范.低

Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits

BS IEC 60748-4:1997 件..接口

Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS

Semiconductor devices. Integrated circuits. Interface integrated circuits

BS IEC 60748-2:1997 件..数字

This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits

Semiconductor devices - Integrated circuits - Digital integrated circuits

BS IEC 60748-2:1998 数字

Semiconductor devices. Integrated circuits. Digital integrated circuits

BS IEC 60748-11:2000 件..(混合除外)的分规范

Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated

Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits

BS IEC 60748-11:1991 (混合除外)的分规范

Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits

PN T01305-1992 件..除混合外的分规范

Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

GB/T 4377-2018 测试方法

本标准规定了电压调整器(以下称为器件)参数测试方法。 本标准适用于半导体集成电路领域中电压调整器参数的测试

Semiconductor integrated circuits.Measuring method of voltage regulators

GB/T 4376-1994 系列和品种

本标准规定了半导体集成电路电压调整器(以下简称器件)的系列和品种,并给出了每一品种的引出端排列、推荐线路或功能框图及主要电参数。 本标准适用于器件的生产、研制或使用时的选型

Series and products of voltage regulators for semiconductor integrated circuits

GB/T 4377-1996 测试方法的基本原理

本标准规定了半导体集成电路电压调整器(以下简称器件)电特性测试方法的基本原理。 本标准适用于半导体集成电路电压调整器电特性的测试,不适用于双端(单端口)器件

Semiconductor integrated circuits. General principles of measuring methods of voltage regulator

GJB 597/4A-1996 三端固定输出系列详细规范

GJB 597/14-1996 JW78L、JW79L系列三端固定输出详细规范

SJ 50597/16-1994 .JW137、JW137M、JW137L型三端可负输出详细规范

Semiconductor integrated circuits.Detail specification for type JW137,JW137M and JW137L three terminal adjustabale negative voltage regulators

SJ 50597/60-2004 JW117/JW150/JW138型三端可正输出详细规范

Semiconductor integrated circuits Detail specification for types JW117/JW150/JW138 three terminal adjustable positive voltage reference

SJ 50597/61-2005 JW1083/JW1084/JW1085/JW1086型三端可正输出低.详细规范

本规范规定了硅单片集成电路JW1083/JW1084/JW1085/JW1086型三端可调正输出低压差电压调整器(以下简称器件)的详细要求

Semiconductor integrated circuits detail specification for types JW1083/JW1084/JW1085/JW1086 three terminal adjustable low dropout positive voltage regulators

BS IEC 60748-2-20:2008 件..数字.类规范.低

Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits

BS IEC 60748-4:1997 件..接口

Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS

Semiconductor devices. Integrated circuits. Interface integrated circuits

BS IEC 60748-2:1997 件..数字

This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits

Semiconductor devices - Integrated circuits - Digital integrated circuits

BS IEC 60748-2:1998 数字

Semiconductor devices. Integrated circuits. Digital integrated circuits

BS IEC 60748-11:2000 件..(混合除外)的分规范

Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated

Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits

BS IEC 60748-11:1991 (混合除外)的分规范

Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits

PN T01305-1992 件..除混合外的分规范

Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

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