DB61/T 1448-2021 大功率半导体分立器件间歇寿命试验规程
本文件规定了大功率半导体分立器件（以下简称器件）间歇寿命试验的术语和定义、试验系统、试 验程序、失效判据及试验报告的要求。 本文件适用于大功率双极型晶体管、场效应晶体管、绝缘栅场效应晶体管、二极管等半导体分立器 件的间歇寿命试验
T/ZAQ 10113-2022 半导体器件间歇工作寿命试验设备
本文件规定了半导体器件间歇工作寿命试验设备（以下简称寿命试验设备）的术语和定义、基本参数、技术要求、试验方法、检验规则、标志、使用说明书、包装、运输和贮存
JEITA EDR-4704A-2007 半导体器件用加速寿命试验的应用指南
Recent progresses in science and technology have brought electronic devices closer to our daily life. With respect to the lifecycles of the electronic
Application guide of the accelerated life test for semiconductor devices
JEDEC JESD74A-2007 半导体器件的早期寿命故障运价计算程序
Early life failure rate (ELFR) measurement of a product is typically performed during product qualifications or as part of ongoing product
Early Life Failure Rate Calculation Procedure for Semiconductor Components
GJB 128-1986 半导体分立器件试验方法
本标准规定了军用地形图测量航空摄影装备、器材、技术、成果质量和成果管理的基本要求。本标准适用于测制与更新1:10 000~1:100 000基本比例尺军用地形图的黑白胶片航空摄影、彩色胶片航空摄影、数字航空摄影
Aerial photographic specification for military topographic mapping
GB/T 249-2017 半导体分立器件型号命名方法
The rule of type designation for discrete semiconductor devices
GB/T 249-1989 半导体分立器件型号命名方法
本标准规定了半导体分立器件型号的命名方法。 本标准适用于各种半导体分立器件
The rule of type designation for discrete semiconductor devices
GJB 128B-2021 半导体分立器件试验方法
GJB 128A-1997 半导体分立器件试验方法
BS EN 60749-23:2004 半导体器件.机械和气候试验方法.高温操作寿命
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating
Semiconductor devices - Mechanical and climatic test methods - High temperature operating life
BS EN 60749-23:2004+A1:2011 半导体器件.机械和气候试验方法.高温使用寿命
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating
Semiconductor devices. Mechanical and climatic test methods. High temperature operating life
BS IEC 60747-14-4:2011 半导体器件.分立器件.半导体加速器
Semiconductor devices. Discrete devices. Semiconductor accelerometers
QJ 1511A-1998 半导体分立器件验收规范
BS IEC 60747-6:2016 半导体器件.分立器件.半导体闸流管
Semiconductor devices. Discrete devices. Thyristors
KS C IEC 60749-23:2006 半导体器件.机械和气候试验方法.第23部分:高温操作寿命
이 시험은 시간이 지남에 따라 바이어스 조건과 온도가 고체 상태 소자에 미치는 영향을 알아
Semiconductor devices－Mechanical and climatic test methods－Part 23：High temperature operating life
DB61/T 1448-2021 大功率半导体分立器件间歇寿命试验规程
本文件规定了大功率半导体分立器件（以下简称器件）间歇寿命试验的术语和定义、试验系统、试 验程序、失效判据及试验报告的要求。 本文件适用于大功率双极型晶体管、场效应晶体管、绝缘栅场效应晶体管、二极管等半导体分立器 件的间歇寿命试验
T/ZAQ 10113-2022 半导体器件间歇工作寿命试验设备
本文件规定了半导体器件间歇工作寿命试验设备（以下简称寿命试验设备）的术语和定义、基本参数、技术要求、试验方法、检验规则、标志、使用说明书、包装、运输和贮存
JEITA EDR-4704A-2007 半导体器件用加速寿命试验的应用指南
Recent progresses in science and technology have brought electronic devices closer to our daily life. With respect to the lifecycles of the electronic
Application guide of the accelerated life test for semiconductor devices
JEDEC JESD74A-2007 半导体器件的早期寿命故障运价计算程序
Early life failure rate (ELFR) measurement of a product is typically performed during product qualifications or as part of ongoing product
Early Life Failure Rate Calculation Procedure for Semiconductor Components
GJB 128-1986 半导体分立器件试验方法
本标准规定了军用地形图测量航空摄影装备、器材、技术、成果质量和成果管理的基本要求。本标准适用于测制与更新1:10 000~1:100 000基本比例尺军用地形图的黑白胶片航空摄影、彩色胶片航空摄影、数字航空摄影
Aerial photographic specification for military topographic mapping
GB/T 249-2017 半导体分立器件型号命名方法
The rule of type designation for discrete semiconductor devices
GB/T 249-1989 半导体分立器件型号命名方法
本标准规定了半导体分立器件型号的命名方法。 本标准适用于各种半导体分立器件
The rule of type designation for discrete semiconductor devices
GJB 128B-2021 半导体分立器件试验方法
GJB 128A-1997 半导体分立器件试验方法
BS EN 60749-23:2004 半导体器件.机械和气候试验方法.高温操作寿命
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating
Semiconductor devices - Mechanical and climatic test methods - High temperature operating life
BS EN 60749-23:2004+A1:2011 半导体器件.机械和气候试验方法.高温使用寿命
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating
Semiconductor devices. Mechanical and climatic test methods. High temperature operating life
BS IEC 60747-14-4:2011 半导体器件.分立器件.半导体加速器
Semiconductor devices. Discrete devices. Semiconductor accelerometers
QJ 1511A-1998 半导体分立器件验收规范
BS IEC 60747-6:2016 半导体器件.分立器件.半导体闸流管
Semiconductor devices. Discrete devices. Thyristors
KS C IEC 60749-23:2006 半导体器件.机械和气候试验方法.第23部分:高温操作寿命
이 시험은 시간이 지남에 따라 바이어스 조건과 온도가 고체 상태 소자에 미치는 영향을 알아
Semiconductor devices－Mechanical and climatic test methods－Part 23：High temperature operating life
编辑：北检院编辑部
