纳米薄膜检测

GB/T 30447-2013 纳米薄膜接触角测量方法

本标准规定了纳米薄膜接触角测量中涉及的术语、原理、试验设备、环境、样品制备、分析步骤、结果计算和试验报告等。本标准适用于衬底为表面平整的纳米薄膜涂层

Measurement method for contact angle of nano-film surface

IEC/TR 63258-2021 纳米技术.评估纳米薄膜厚度的椭偏仪应用指南

Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films

ISO/TS 80004-11:2017 纳米技术 - 词汇 - 第11部分:纳米层 纳米涂层 纳米薄膜和相关术语

Nanotechnologies — Vocabulary — Part 11: Nanolayer, nanocoating, nanofilm, and related terms

IEC TR 63258-2021 纳米技术.用于评估纳米薄膜厚度的椭偏仪应用指南

Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films

GB/T 36969-2018 纳米技术 原子力显微术测定纳米薄膜厚度的方法

Nanotechnology—Method for the measurement of the nanofilm-thickness by atomic force microscopy

GB/T 33826-2017 玻璃衬底上纳米薄膜厚度测量 触针式轮廓仪法

Measurement of nanofilm thickness on glass substrate—Profilometric method

DIN CEN ISO/TS 80004-11:2020 纳米技术. 词汇. 第11部分: 纳米层、纳米涂层、纳米薄膜和相关术语(ISO/TS 80004-11-2017); 德文版 CEN ISO/TS 80004-11-2020

ISO/TS 80004-11:2017 lists terms and definitions, and specifies an extensible taxonomic terminology framework for nanolayers, nanocoatings, nanofilms

Nanotechnologies - Vocabulary - Part 11: Nanolayer, nanocoating, nanofilm, and related terms (ISO/TS 80004-11:2017); German version CEN ISO/TS 80004-11:2020

KS D 2715-2006 单晶硅和多晶硅纳米/微薄膜拉伸的试样

이 규격은 반도체 공정을 이용하여 만들어지는 나노/마이크로 크기의 두께를 가지는 단결정

Tensile specimen of single- and poly-crystal nano/micro thin film materials

IEC/TS 62607-2-1-2012 纳米制造.碳纳米管薄膜应用的关键控制特性.电阻率.第2-1部分:

Nanomanufacturing - key control characteristics for CNT film applications - Resistivity — Part 2-1:

BS PD IEC TR 63258:2021 纳米技术 椭圆偏振法应用于评估纳米级薄膜厚度的指南

Nanotechnologies. A guideline for ellipsometry application to evaluate the thickness of nanoscale films

BS PD IEC/TS 62607-5-1:2014 纳米制造. 关键控制特性. 有机薄膜/纳米电子器件. 载波传输测量

Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Carrier transport measurements

GM 9986321-2008 薄膜.纳米厚度(NT)预处理通用质量标准

Thin Film; Nanometers Thick (NT) Pretreatment Generic Qualifications

IEC TS 62607-2-1:2012 纳米制造.关键控制特性.第2-1部分:碳纳米管材料.薄膜电阻

Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance

IEC TS 62607-2-1-2012 纳米制造.关键控制特性.第2-1部分:碳纳米管材料.薄膜电阻

Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance

KS D 2715-2006(2011 单和多晶纳米的拉伸试样/微薄膜材料

Tensile specimen of single- and poly-crystal nano/micro thin film materials

GB/T 30447-2013 纳米薄膜接触角测量方法

本标准规定了纳米薄膜接触角测量中涉及的术语、原理、试验设备、环境、样品制备、分析步骤、结果计算和试验报告等。本标准适用于衬底为表面平整的纳米薄膜涂层

Measurement method for contact angle of nano-film surface

IEC/TR 63258-2021 纳米技术.评估纳米薄膜厚度的椭偏仪应用指南

Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films

ISO/TS 80004-11:2017 纳米技术 - 词汇 - 第11部分:纳米层 纳米涂层 纳米薄膜和相关术语

Nanotechnologies — Vocabulary — Part 11: Nanolayer, nanocoating, nanofilm, and related terms

IEC TR 63258-2021 纳米技术.用于评估纳米薄膜厚度的椭偏仪应用指南

Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films

GB/T 36969-2018 纳米技术 原子力显微术测定纳米薄膜厚度的方法

Nanotechnology—Method for the measurement of the nanofilm-thickness by atomic force microscopy

GB/T 33826-2017 玻璃衬底上纳米薄膜厚度测量 触针式轮廓仪法

Measurement of nanofilm thickness on glass substrate—Profilometric method

DIN CEN ISO/TS 80004-11:2020 纳米技术. 词汇. 第11部分: 纳米层、纳米涂层、纳米薄膜和相关术语(ISO/TS 80004-11-2017); 德文版 CEN ISO/TS 80004-11-2020

ISO/TS 80004-11:2017 lists terms and definitions, and specifies an extensible taxonomic terminology framework for nanolayers, nanocoatings, nanofilms

Nanotechnologies - Vocabulary - Part 11: Nanolayer, nanocoating, nanofilm, and related terms (ISO/TS 80004-11:2017); German version CEN ISO/TS 80004-11:2020

KS D 2715-2006 单晶硅和多晶硅纳米/微薄膜拉伸的试样

이 규격은 반도체 공정을 이용하여 만들어지는 나노/마이크로 크기의 두께를 가지는 단결정

Tensile specimen of single- and poly-crystal nano/micro thin film materials

IEC/TS 62607-2-1-2012 纳米制造.碳纳米管薄膜应用的关键控制特性.电阻率.第2-1部分:

Nanomanufacturing - key control characteristics for CNT film applications - Resistivity — Part 2-1:

BS PD IEC TR 63258:2021 纳米技术 椭圆偏振法应用于评估纳米级薄膜厚度的指南

Nanotechnologies. A guideline for ellipsometry application to evaluate the thickness of nanoscale films

BS PD IEC/TS 62607-5-1:2014 纳米制造. 关键控制特性. 有机薄膜/纳米电子器件. 载波传输测量

Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Carrier transport measurements

GM 9986321-2008 薄膜.纳米厚度(NT)预处理通用质量标准

Thin Film; Nanometers Thick (NT) Pretreatment Generic Qualifications

IEC TS 62607-2-1:2012 纳米制造.关键控制特性.第2-1部分:碳纳米管材料.薄膜电阻

Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance

IEC TS 62607-2-1-2012 纳米制造.关键控制特性.第2-1部分:碳纳米管材料.薄膜电阻

Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance

KS D 2715-2006(2011 单和多晶纳米的拉伸试样/微薄膜材料

Tensile specimen of single- and poly-crystal nano/micro thin film materials