DLA SMD-5962-06252-2007 四信道模拟开关混合微型电路
This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes
MICROCIRCUIT, HYBRID, ANALOG SWITCH, QUAD CHANNEL
DLA SMD-5962-90737 REV C-2001 硅单块 模拟开关直线型微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, ANALOG SWITCH, MONOLITHIC SILICON
SIS SS CECC 90203-1985 空白详细规范．集成模拟开关电路
Blank detail specification: Integrated analogue switching circuits
DLA SMD-5962-78014 REV K-2005 硅单片双重模拟开关,线性微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, DUAL ANALOG SWITCH, MONOLITHIC SILICON
GB/T 14028-2018 半导体集成电路 模拟开关测试方法
Semiconductor integrated circuits—Measuring method of analogue switch
NP 2994/4-1985 电子元件．集成模拟开关，详细的规格说明
DLA SMD-5962-87673 REV B-2002 硅单块 带驱动器模拟开关,直线型微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, ANALOG SWITCH WITH DRIVER, MONOLITHIC SILICON
GB/T 14028-1992 半导体集成电路模拟开关测试方法的基本原理
本标准规定了MOS和结型场效应半导体集成电路模拟开关（以下简称器件或模拟开关）电参数测试的基本原理
General principles of measuring methods of analogue switches for semiconductor integrated circuits
DLA SMD-5962-89763 REV B-2004 硅单片,单刀双掷模拟开关,双重线性微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M and space application (device class
MICROCIRCUIT, LINEAR, DUAL, SPDT ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-89961 REV A-2002 硅单片,双重单刀双掷模拟开关,线性微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, DUAL, DPST, ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-90569 REV A-2001 硅单片,双重单刀单掷模拟开关,线性微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, DUAL, SPST ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-90891 REV A-2002 硅单块 四列单刀单掷模拟开关直线式微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, ANALOG SWITCH, SPST, QUAD, MONOLITHIC SILICON
SJ 50597/27-1994 半导体集成电路.JC4067型CMOS16选1模拟开关详细规范
Semiconductor integrated circuits.Detail specification for type JC4067 of CMOS single 16-channel analog switches
GB 14028-2018 半导体集成电路模拟开关测试方法的基本原理
DLA SMD-5962-92041 REV B-2001 硅单块 4沟道单刀单掷模拟开关直线式微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, ANALOG SWITCH, SPST, 4-CHANNEL, MONOLITHIC SILICON
DLA SMD-5962-06252-2007 四信道模拟开关混合微型电路
This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes
MICROCIRCUIT, HYBRID, ANALOG SWITCH, QUAD CHANNEL
DLA SMD-5962-90737 REV C-2001 硅单块 模拟开关直线型微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, ANALOG SWITCH, MONOLITHIC SILICON
SIS SS CECC 90203-1985 空白详细规范．集成模拟开关电路
Blank detail specification: Integrated analogue switching circuits
DLA SMD-5962-78014 REV K-2005 硅单片双重模拟开关,线性微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, DUAL ANALOG SWITCH, MONOLITHIC SILICON
GB/T 14028-2018 半导体集成电路 模拟开关测试方法
Semiconductor integrated circuits—Measuring method of analogue switch
NP 2994/4-1985 电子元件．集成模拟开关，详细的规格说明
DLA SMD-5962-87673 REV B-2002 硅单块 带驱动器模拟开关,直线型微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, ANALOG SWITCH WITH DRIVER, MONOLITHIC SILICON
GB/T 14028-1992 半导体集成电路模拟开关测试方法的基本原理
本标准规定了MOS和结型场效应半导体集成电路模拟开关（以下简称器件或模拟开关）电参数测试的基本原理
General principles of measuring methods of analogue switches for semiconductor integrated circuits
DLA SMD-5962-89763 REV B-2004 硅单片,单刀双掷模拟开关,双重线性微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M and space application (device class
MICROCIRCUIT, LINEAR, DUAL, SPDT ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-89961 REV A-2002 硅单片,双重单刀双掷模拟开关,线性微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, DUAL, DPST, ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-90569 REV A-2001 硅单片,双重单刀单掷模拟开关,线性微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, DUAL, SPST ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-90891 REV A-2002 硅单块 四列单刀单掷模拟开关直线式微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, ANALOG SWITCH, SPST, QUAD, MONOLITHIC SILICON
SJ 50597/27-1994 半导体集成电路.JC4067型CMOS16选1模拟开关详细规范
Semiconductor integrated circuits.Detail specification for type JC4067 of CMOS single 16-channel analog switches
GB 14028-2018 半导体集成电路模拟开关测试方法的基本原理
DLA SMD-5962-92041 REV B-2001 硅单块 4沟道单刀单掷模拟开关直线式微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, ANALOG SWITCH, SPST, 4-CHANNEL, MONOLITHIC SILICON
编辑：北检院编辑部
