电压比较器检测

📅 发布时间:2024-05-27 👤 来源:北检院 👁 阅读:

DLA SMD-5962-06253 REV A-2006 双信道混合微型

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes

MICROCIRCUIT, HYBRID, VOLTAGE COMPARATOR, DUAL CHANNEL

DLA SMD-5962-90627 REV C-2003 硅单片,,线性微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, VOLTAGE COMPARATOR, MONOLITHIC SILICON

SIS SS CECC 90302-1986 空白详细规范.集成

Blank detail specification: Integrated voltage comparators

DLA SMD-5962-77008 REV F-2003 硅单片四重线性微型

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, QUAD VOLTAGE COMPARATOR, MONOLITHIC SILICON

DLA SMD-5962-87545 REV B-2006 硅单块 高速差分,直线型微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, HIGH SPEED DIFFERENTIAL VOLTAGE COMPARATOR, MONOLITHIC SILICON

SJ/T 10805-2018 半导体集成测试方法

DLA SMD-5962-96798 REV D-2005 双重硅单片路线型微

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, HIGH SPEED, DUAL, VOLTAGE COMPARATOR, MONOLITHIC SILICON

DLA SMD-5962-87572 REV D-2005 硅单块 差异,直线型微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, DIFFERENTIAL VOLTAGE COMPARATORS, MONOLITHIC SILICON

DLA SMD-5962-91619 REV A-2000 硅单块 窗口,直线式微型

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, WINDOW VOLTAGE COMPARATOR, MONOLITHIC SILICON

GJB 597/3-1990 半导体集成详细规范

DLA SMD-5962-87739 REV H-2007 硅单片辐射硬化四方线性微

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON

DLA SMD-5962-86860 REV B-2004 硅单块 精密方形,,直线式微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, VOLTAGE COMPARATOR, QUAD, PRECISION, MONOLITHIC SILICON

DLA SMD-5962-95551 REV B-2001 双重的功率硅单片路线型微

This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q

MICROCIRCUIT, LINEAR, DUAL MICROPOWER VOLTAGE COMPARATORS, MONOLITHIC SILICON

DLA SMD-5962-78019 REV E-2006 硅单片高速,双极线性微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, DUAL, HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON

DLA SMD-5962-01510 REV D-2007 单片硅辐射硬化线性微路四

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, RADIATION HARDENED, QUAD VOLTAGE COMPARATOR, MONOLITHIC SILICON

DLA SMD-5962-06253 REV A-2006 双信道混合微型

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes

MICROCIRCUIT, HYBRID, VOLTAGE COMPARATOR, DUAL CHANNEL

DLA SMD-5962-90627 REV C-2003 硅单片,,线性微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, VOLTAGE COMPARATOR, MONOLITHIC SILICON

SIS SS CECC 90302-1986 空白详细规范.集成

Blank detail specification: Integrated voltage comparators

DLA SMD-5962-77008 REV F-2003 硅单片四重线性微型

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, QUAD VOLTAGE COMPARATOR, MONOLITHIC SILICON

DLA SMD-5962-87545 REV B-2006 硅单块 高速差分,直线型微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, HIGH SPEED DIFFERENTIAL VOLTAGE COMPARATOR, MONOLITHIC SILICON

SJ/T 10805-2018 半导体集成测试方法

DLA SMD-5962-96798 REV D-2005 双重硅单片路线型微

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, HIGH SPEED, DUAL, VOLTAGE COMPARATOR, MONOLITHIC SILICON

DLA SMD-5962-87572 REV D-2005 硅单块 差异,直线型微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, DIFFERENTIAL VOLTAGE COMPARATORS, MONOLITHIC SILICON

DLA SMD-5962-91619 REV A-2000 硅单块 窗口,直线式微型

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, WINDOW VOLTAGE COMPARATOR, MONOLITHIC SILICON

GJB 597/3-1990 半导体集成详细规范

DLA SMD-5962-87739 REV H-2007 硅单片辐射硬化四方线性微

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON

DLA SMD-5962-86860 REV B-2004 硅单块 精密方形,,直线式微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, VOLTAGE COMPARATOR, QUAD, PRECISION, MONOLITHIC SILICON

DLA SMD-5962-95551 REV B-2001 双重的功率硅单片路线型微

This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q

MICROCIRCUIT, LINEAR, DUAL MICROPOWER VOLTAGE COMPARATORS, MONOLITHIC SILICON

DLA SMD-5962-78019 REV E-2006 硅单片高速,双极线性微型

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, DUAL, HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON

DLA SMD-5962-01510 REV D-2007 单片硅辐射硬化线性微路四

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, RADIATION HARDENED, QUAD VOLTAGE COMPARATOR, MONOLITHIC SILICON

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标准检测周期短至3个工作日,加急服务24小时出具报告,全程一对一工程师跟进,确保高效交付。

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总部位于北京,山东设立分部,服务覆盖全国,为20万+客户提供便捷的一站式检测解决方案。

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CNAS 实验室认可证书

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