半导体分立器件和集成电路光电子器件检测

GB/T 15651-1995 半导体器件 分立器件和集成电路 第5部分:光电子器件

本标准给出了下列类型和分类型器件的标准： ·半导体光发射器件，包括： --发光二极管（LED_S）； --红外发射二极管（IRED） --激光二极管和激光二极管组件 --光电子显示器件（在考虑中）。 .半导体光电探测器件，包括

Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices

IEC 60747-5:1992 半导体器件.分立器件和集成电路.第5部分:光电子器件

Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices

KS C IEC 60747-5:2004 半导体分立器件和集成电路第5部分:光电子器件

이 규격은 소자의 다음 범주 또는 하위 범주에 적용된다:다음을 포함하는 반도체 포토

Semiconductor devices－Discrete devices－Part 5：Optoelectronic devices

IEC 60747-5-1:2002 半导体分立器件和集成电路.第5-1部分:光电子器件.总则

Deals with the terminology relating to the semiconductor optoelectronic devices

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General

IEC 60747-5-1:1997/AMD2:2002 半导体分立器件和集成电路.第5-1部分:光电子器件.总则

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment 2

KS C IEC 60747-5-1:2004 半导体分立器件和集成电路第5-1部分:光电子器件总规范

이 규격은 반도체 광전 소자와 관련된 용어에 대하여 취급한다

Discrete semiconductor devices and integrated circuits－Part 5－1：Optoelectronic devices－General

0 半导体分立器件和集成电路 第5-1部分:光电子器件 总规范

This part of IEC 60747 deals with the terminology relating to the semiconductor optoelectronic devices

GB/T 15651.3-2003 半导体分立器件和集成电路第5-3部分;光电子器件测试方法

本部分适用于光电子器件的测试方法，用于光纤系统或子系统的除外

Discrete semiconductor devices and integrated circuits Part 5-3:Optoelectronic devices Measuring methods

KS C IEC 60747-5-3:2004 半导体分立器件和集成电路.第5-3部分:光电子器件.测试方法

이 규격은 광섬유 시스템 또는 서브시스템 분야에 사용하지 않는 광전 소자의 측정 방법에

Semiconductor devices－Discrete devices－Part 5－3：optoelectronic devices－Measuring method

0 半导体分立器件和集成电路 第5-3部分:光电子器件 测试方法

This part of IEC 60747 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic

GB/T 15651.2-2003 半导体分立器件和集成电路 第5-2部分;光电子器件基本额定值和特性

本部分给出了下列各类及分类的光电子器件的基本额定值和特性，用于光纤系统或子系统的除外。 ——半导体光电子发射器件，包括： 发光二极管（LEDs)； 红外发射二极管（IREDs)； 激光二极管。 ——半导体光电探测器件，包括

Discrete semiconductor devices and integrated circuits Part 5-2:Optoelectronic devices Essential ratings and characteristics

IEC 60747-5-1:1997/AMD1:2001 半导体分立器件和集成电路 第5-1部分:光电子器件 总规范 修改1

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment 1

GB/T 15651.2-2003/IEC 60747-5-2:1997 半导体分立器件和集成电路 第5-2部分:光电子器件基本额定值和特性

0 半导体分立器件和集成电路 第5-2部分:光电子器件 基本额定值和特性

This part of IEC 60747 gives the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which

IEC 60747-5-2:1997/AMD1:2002 半导体分立器件和集成电路.第5-2部分:光电子器件.基础额定值及特性

This part of IEC 60747 gives the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which

Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices; Essential ratings and characteristics; Amendment 2

GB/T 15651-1995 半导体器件 分立器件和集成电路 第5部分:光电子器件

本标准给出了下列类型和分类型器件的标准： ·半导体光发射器件，包括： --发光二极管（LED_S）； --红外发射二极管（IRED） --激光二极管和激光二极管组件 --光电子显示器件（在考虑中）。 .半导体光电探测器件，包括

Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices

IEC 60747-5:1992 半导体器件.分立器件和集成电路.第5部分:光电子器件

Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices

KS C IEC 60747-5:2004 半导体分立器件和集成电路第5部分:光电子器件

이 규격은 소자의 다음 범주 또는 하위 범주에 적용된다:다음을 포함하는 반도체 포토

Semiconductor devices－Discrete devices－Part 5：Optoelectronic devices

IEC 60747-5-1:2002 半导体分立器件和集成电路.第5-1部分:光电子器件.总则

Deals with the terminology relating to the semiconductor optoelectronic devices

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General

IEC 60747-5-1:1997/AMD2:2002 半导体分立器件和集成电路.第5-1部分:光电子器件.总则

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment 2

KS C IEC 60747-5-1:2004 半导体分立器件和集成电路第5-1部分:光电子器件总规范

이 규격은 반도체 광전 소자와 관련된 용어에 대하여 취급한다

Discrete semiconductor devices and integrated circuits－Part 5－1：Optoelectronic devices－General

0 半导体分立器件和集成电路 第5-1部分:光电子器件 总规范

This part of IEC 60747 deals with the terminology relating to the semiconductor optoelectronic devices

GB/T 15651.3-2003 半导体分立器件和集成电路第5-3部分;光电子器件测试方法

本部分适用于光电子器件的测试方法，用于光纤系统或子系统的除外

Discrete semiconductor devices and integrated circuits Part 5-3:Optoelectronic devices Measuring methods

KS C IEC 60747-5-3:2004 半导体分立器件和集成电路.第5-3部分:光电子器件.测试方法

이 규격은 광섬유 시스템 또는 서브시스템 분야에 사용하지 않는 광전 소자의 측정 방법에

Semiconductor devices－Discrete devices－Part 5－3：optoelectronic devices－Measuring method

0 半导体分立器件和集成电路 第5-3部分:光电子器件 测试方法

This part of IEC 60747 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic

GB/T 15651.2-2003 半导体分立器件和集成电路 第5-2部分;光电子器件基本额定值和特性

本部分给出了下列各类及分类的光电子器件的基本额定值和特性，用于光纤系统或子系统的除外。 ——半导体光电子发射器件，包括： 发光二极管（LEDs)； 红外发射二极管（IREDs)； 激光二极管。 ——半导体光电探测器件，包括

Discrete semiconductor devices and integrated circuits Part 5-2:Optoelectronic devices Essential ratings and characteristics

IEC 60747-5-1:1997/AMD1:2001 半导体分立器件和集成电路 第5-1部分:光电子器件 总规范 修改1

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment 1

GB/T 15651.2-2003/IEC 60747-5-2:1997 半导体分立器件和集成电路 第5-2部分:光电子器件基本额定值和特性

0 半导体分立器件和集成电路 第5-2部分:光电子器件 基本额定值和特性

This part of IEC 60747 gives the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which

IEC 60747-5-2:1997/AMD1:2002 半导体分立器件和集成电路.第5-2部分:光电子器件.基础额定值及特性

This part of IEC 60747 gives the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which

Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices; Essential ratings and characteristics; Amendment 2