发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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This standard (Part I) lays down guiding requirements for the design of cold chamber required for carrying out cold tests in accordance
This standard ( Part 13/Sec 3 ) lays down guiding requirements for the design and manufacture of liquid bath for conducting the change of temperature
This standard ( Part 8 ) lays down guiding requirements for the design of dust chamber required for carrying out dust test in accordance
This standard ( Part 7 ) lays down guiding requirements for the design of bump test machine required for carrying out bump tests in accordance
This standard ( Part 9 ) lays down the salient features of an accelera-tion ( steady state ) test machine required for carrying out acceleration
This standard ( Part IV ) lays down guiding requirements for the design of mould growth chamber required for carrying out mould growth test
This standard ( Part XIII) deals with the test procedure for low air pressure test for electronic and electrical items as a part of basic
This standard ( Part IV ) deals with the procedure for application of high relative humidity on electronic and electrical items as a part of basic
This standard ( Part XI/Sec 1) deals with rapid change of tempe-rature test by two-chamber method
This standard ( Part 11 ) lays down guiding requirements for the design of drop, topple and free fall test machine/plaiform required for carrying out
This standard ( Part 13/Sec 1 ) lays down guiding requirements for the design and manufacture of chamber for conducting the change of temperature
This standard ( Part VIII) gives procedure for vibration (sinusoidal) test for electronic and electrical items as a part of basic environmental
This standard ( Part II/Sec 1 ) gives general information on cold tests applicable both to non-heat dissipating and heat dissipating items
This standard ( Part VI) deals with a composite temperature/humidity cyclic ( moisture resistance) test procedure designed to reveal defects in test
This standard ( Part VII/Sec 1 ) deals with the procedure for application of shock test on electronic and electrical items as a part of basic
This standard (Part I) lays down guiding requirements for the design of cold chamber required for carrying out cold tests in accordance
This standard ( Part 13/Sec 3 ) lays down guiding requirements for the design and manufacture of liquid bath for conducting the change of temperature
This standard ( Part 8 ) lays down guiding requirements for the design of dust chamber required for carrying out dust test in accordance
This standard ( Part 7 ) lays down guiding requirements for the design of bump test machine required for carrying out bump tests in accordance
This standard ( Part 9 ) lays down the salient features of an accelera-tion ( steady state ) test machine required for carrying out acceleration
This standard ( Part IV ) lays down guiding requirements for the design of mould growth chamber required for carrying out mould growth test
This standard ( Part XIII) deals with the test procedure for low air pressure test for electronic and electrical items as a part of basic
This standard ( Part IV ) deals with the procedure for application of high relative humidity on electronic and electrical items as a part of basic
This standard ( Part XI/Sec 1) deals with rapid change of tempe-rature test by two-chamber method
This standard ( Part 11 ) lays down guiding requirements for the design of drop, topple and free fall test machine/plaiform required for carrying out
This standard ( Part 13/Sec 1 ) lays down guiding requirements for the design and manufacture of chamber for conducting the change of temperature
This standard ( Part VIII) gives procedure for vibration (sinusoidal) test for electronic and electrical items as a part of basic environmental
This standard ( Part II/Sec 1 ) gives general information on cold tests applicable both to non-heat dissipating and heat dissipating items
This standard ( Part VI) deals with a composite temperature/humidity cyclic ( moisture resistance) test procedure designed to reveal defects in test
This standard ( Part VII/Sec 1 ) deals with the procedure for application of shock test on electronic and electrical items as a part of basic