
发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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本标准规定了半导体集成电路运算放大器的系列和品种(以下简称器件)的引出端排列、完整的型号、推荐原理电路图(框图)和主要电特性。 本标准适用于研制、生产、使用和采购器件时的选型
Semiconductor integrated circuits. Series and products of operational amplifier
Test methods for operational amplifiers in semiconductor integrated circuits
Intergated microcircuits. Methods for measuring noise parameters of operational amplifiers
이 규격은 전자기기에 사용하는 모놀리틱 연산증폭기 중, 특히 신뢰성 보증이 요구되는 것에
Reliability Assured Monolithic Operational Amplifier
器件
Integrated circuits. Method of measuring the operational amplifiers maximum output voltage
本规范规定了编制半导体集成电路运算放大器(以下简称器件)详细规范的基本原则
Blank detail specification for semiconductor integrated circuit operational amplifiers
1 Prezentul standard stabile?te metodele de m?surare a parametrilor principali ai amplificatoarelor opera?ionale, denumite ?n cuprinsul standardului
Linear integrated circuits OPERATIONAL AMPLIFIERS Methods of measurement for the main parameters
Integrated circuits. Method of measuring the operational amplifiers and voltage comparators gain
Настоящий стандарт распространяется на операционные усилители и устанавливает методы измерения частоты среза f
Integrated microcircuits. Measurement methods of the operational amplifiers cut-off frequency and unitary-gain frequency
서 문 이 규격은 1991년에 초판으로 발행된 IEC 60748-3-1 Semic
Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers
Integrated circuits. Method of measuring the operational amplifiers output voltage settling time
本标准规定了半导体集成电路运算放大器的系列和品种(以下简称器件)的引出端排列、完整的型号、推荐原理电路图(框图)和主要电特性。 本标准适用于研制、生产、使用和采购器件时的选型
Semiconductor integrated circuits. Series and products of operational amplifier
Test methods for operational amplifiers in semiconductor integrated circuits
Intergated microcircuits. Methods for measuring noise parameters of operational amplifiers
이 규격은 전자기기에 사용하는 모놀리틱 연산증폭기 중, 특히 신뢰성 보증이 요구되는 것에
Reliability Assured Monolithic Operational Amplifier
器件
Integrated circuits. Method of measuring the operational amplifiers maximum output voltage
本规范规定了编制半导体集成电路运算放大器(以下简称器件)详细规范的基本原则
Blank detail specification for semiconductor integrated circuit operational amplifiers
1 Prezentul standard stabile?te metodele de m?surare a parametrilor principali ai amplificatoarelor opera?ionale, denumite ?n cuprinsul standardului
Linear integrated circuits OPERATIONAL AMPLIFIERS Methods of measurement for the main parameters
Integrated circuits. Method of measuring the operational amplifiers and voltage comparators gain
Настоящий стандарт распространяется на операционные усилители и устанавливает методы измерения частоты среза f
Integrated microcircuits. Measurement methods of the operational amplifiers cut-off frequency and unitary-gain frequency
서 문 이 규격은 1991년에 초판으로 발행된 IEC 60748-3-1 Semic
Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers
Integrated circuits. Method of measuring the operational amplifiers output voltage settling time








