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运算放大器集成电路检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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军工检测 其他检测

GB/T 3436-1996 半导体 系列和品种

本标准规定了半导体集成电路运算放大器的系列和品种(以下简称器件)的引出端排列、完整的型号、推荐原理电路图(框图)和主要电特性。 本标准适用于研制、生产、使用和采购器件时的选型

Semiconductor integrated circuits. Series and products of operational amplifier

QJ 2491-1993 半导体测试方法

Test methods for operational amplifiers in semiconductor integrated circuits

GJB 597/5A-1997 半导体详细规范

GJB 597/5-1990 半导体详细规范

GJB 9147-2017 半导体测试方法

GOST 23089.12-1986 微型.噪声测量方法

Intergated microcircuits. Methods for measuring noise parameters of operational amplifiers

KS C 7203-1990 保证可靠性的单块

이 규격은 전자기기에 사용하는 모놀리틱 연산증폭기 중, 특히 신뢰성 보증이 요구되는 것에

Reliability Assured Monolithic Operational Amplifier

QJ 1526-1988 半导体特殊参数测试方法

器件

GOST 23089.2-1983 微型.输出压测量方法

Integrated circuits. Method of measuring the operational amplifiers maximum output voltage

GB/T 9425-1988 半导体空白详细规范(可供认证用)

本规范规定了编制半导体集成电路运算放大器(以下简称器件)详细规范的基本原则

Blank detail specification for semiconductor integrated circuit operational amplifiers

STAS 11206-1980 线性.主要参数的测量方法

1 Prezentul standard stabile?te metodele de m?surare a parametrilor principali ai amplificatoarelor opera?ionale, denumite ?n cuprinsul standardului

Linear integrated circuits OPERATIONAL AMPLIFIERS Methods of measurement for the main parameters

GOST 23089.1-1983 微型.压比较系数测量方法

Integrated circuits. Method of measuring the operational amplifiers and voltage comparators gain

GOST 23089.13-1986 微型.单元频率和截止频率测量方法

Настоящий стандарт распространяется на операционные усилители и устанавливает методы измерения частоты среза f

Integrated microcircuits. Measurement methods of the operational amplifiers cut-off frequency and unitary-gain frequency

KS C IEC 60748-3-1:2002 半导体件..第3部分:模拟.第1节:单块

서 문 이 규격은 1991년에 초판으로 발행된 IEC 60748-3-1 Semic

Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers

GOST 23089.6-1983 微型.输出压阻尼时间的测量方法

Integrated circuits. Method of measuring the operational amplifiers output voltage settling time

GB/T 3436-1996 半导体 系列和品种

本标准规定了半导体集成电路运算放大器的系列和品种(以下简称器件)的引出端排列、完整的型号、推荐原理电路图(框图)和主要电特性。 本标准适用于研制、生产、使用和采购器件时的选型

Semiconductor integrated circuits. Series and products of operational amplifier

QJ 2491-1993 半导体测试方法

Test methods for operational amplifiers in semiconductor integrated circuits

GJB 597/5A-1997 半导体详细规范

GJB 597/5-1990 半导体详细规范

GJB 9147-2017 半导体测试方法

GOST 23089.12-1986 微型.噪声测量方法

Intergated microcircuits. Methods for measuring noise parameters of operational amplifiers

KS C 7203-1990 保证可靠性的单块

이 규격은 전자기기에 사용하는 모놀리틱 연산증폭기 중, 특히 신뢰성 보증이 요구되는 것에

Reliability Assured Monolithic Operational Amplifier

QJ 1526-1988 半导体特殊参数测试方法

器件

GOST 23089.2-1983 微型.输出压测量方法

Integrated circuits. Method of measuring the operational amplifiers maximum output voltage

GB/T 9425-1988 半导体空白详细规范(可供认证用)

本规范规定了编制半导体集成电路运算放大器(以下简称器件)详细规范的基本原则

Blank detail specification for semiconductor integrated circuit operational amplifiers

STAS 11206-1980 线性.主要参数的测量方法

1 Prezentul standard stabile?te metodele de m?surare a parametrilor principali ai amplificatoarelor opera?ionale, denumite ?n cuprinsul standardului

Linear integrated circuits OPERATIONAL AMPLIFIERS Methods of measurement for the main parameters

GOST 23089.1-1983 微型.压比较系数测量方法

Integrated circuits. Method of measuring the operational amplifiers and voltage comparators gain

GOST 23089.13-1986 微型.单元频率和截止频率测量方法

Настоящий стандарт распространяется на операционные усилители и устанавливает методы измерения частоты среза f

Integrated microcircuits. Measurement methods of the operational amplifiers cut-off frequency and unitary-gain frequency

KS C IEC 60748-3-1:2002 半导体件..第3部分:模拟.第1节:单块

서 문 이 규격은 1991년에 초판으로 발행된 IEC 60748-3-1 Semic

Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers

GOST 23089.6-1983 微型.输出压阻尼时间的测量方法

Integrated circuits. Method of measuring the operational amplifiers output voltage settling time

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