
发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
点击量:0
本标准规定了半导体集成电路采样/保持放大器(以下简称器件)电参数测试方法的基本原理。 本标准适用于半导体集成电路采样/保持放大器的电参数测试
General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
本标准规定了半导体集成电路采样/保持放大器(以下简称器件)的引出端排列、功能框图和主要电参数。器件的质量评定应符合器件详细规范的规定。 本标准适用于生产(研制)或使用器件时的选型
Series and products of nonlinear circuits for semiconductor integrated circuits--Products of sample/hold amplifiers
This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit
Semiconductor devices — Part 16-1: Microwave integrated circuits — Amplifiers
This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit
Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers
Test method for broadband amplifier of semiconductor integrated circuit
Test methods for operational amplifiers in semiconductor integrated circuits
MICROCIRCUIT, HYBRID, HIGH SPEED TRACK AND HOLD AMPLIFIER
本部分规定了微波集成电路放大器的术语、基本额定值、特性以及测试方法
Semiconductor devices Part 16-1 Microwave integrated circuits Amplifiers
本标准规定了半导体集成电路运算放大器的系列和品种(以下简称器件)的引出端排列、完整的型号、推荐原理电路图(框图)和主要电特性。 本标准适用于研制、生产、使用和采购器件时的选型
Semiconductor integrated circuits. Series and products of operational amplifier
本标准规定了半导体集成电路线性放大器(以下简称器件)各系列和品种的外引线排列、推荐线路和主要电参数
Families and products of linear amplifier for semiconductor integrated circuits
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
本标准规定了半导体集成电路采样/保持放大器(以下简称器件)电参数测试方法的基本原理。 本标准适用于半导体集成电路采样/保持放大器的电参数测试
General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
本标准规定了半导体集成电路采样/保持放大器(以下简称器件)的引出端排列、功能框图和主要电参数。器件的质量评定应符合器件详细规范的规定。 本标准适用于生产(研制)或使用器件时的选型
Series and products of nonlinear circuits for semiconductor integrated circuits--Products of sample/hold amplifiers
This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit
Semiconductor devices — Part 16-1: Microwave integrated circuits — Amplifiers
This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit
Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers
Test method for broadband amplifier of semiconductor integrated circuit
Test methods for operational amplifiers in semiconductor integrated circuits
MICROCIRCUIT, HYBRID, HIGH SPEED TRACK AND HOLD AMPLIFIER
本部分规定了微波集成电路放大器的术语、基本额定值、特性以及测试方法
Semiconductor devices Part 16-1 Microwave integrated circuits Amplifiers
本标准规定了半导体集成电路运算放大器的系列和品种(以下简称器件)的引出端排列、完整的型号、推荐原理电路图(框图)和主要电特性。 本标准适用于研制、生产、使用和采购器件时的选型
Semiconductor integrated circuits. Series and products of operational amplifier
本标准规定了半导体集成电路线性放大器(以下简称器件)各系列和品种的外引线排列、推荐线路和主要电参数
Families and products of linear amplifier for semiconductor integrated circuits
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers








