X射线能谱仪检测

GB/T 20726-2006 半导体探测器X射线能谱仪通则

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪（EDS）特性最重要的量值。本标准仅适用于国态电离作用原理的半导体探测器EDS。本标准只规定了与电子探针（EPMA）或扫描电镜（SEM）联用的此类EDS的最低要求，至于如何实现分析则不在本标准的规定范围之内

Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

IEC 60759:1983 半导体X射线能谱仪的标准试验程序

Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer

Standard test procedures for semiconductor X-ray energy spectrometers

CSN 35 6575 Z1-1997 半导体X射线能谱仪的标准测试程序

Standard test procedureds for semiconductor X-ray energy spectrometers

KS C IEC 60759:2009 半导体X射线能谱仪的标准试验程序

이 표준은 반도체 X-선 에너지 분광계에 대한 표준 시험절차를 제시한다. 해당 계통은 반도

Standard test procedures for semiconductor X-ray energy spectrometers

KS C IEC 60759-2009(2019 半导体X射线能谱仪的标准测试程序

Standard test procedures for semiconductor X-ray energy spectrometers

ANSI/IEEE Std 759-1984 半导体 X 射线能谱仪的 IEEE 标准测试程序

Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced

IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

SIS SS IEC 759:1986 核检测仪表．半导体X射线能谱仪检测程序

Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers

IEC 60759:1983/AMD1:1991 半导体X射线能谱仪的标准试验程序 修改1

Replaces one sentence in sub-clause 7.4.1 (page 55) and the Figure 15a (page 94

Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1

GB/T 11685-2003 半导体X射线探测器系统和半导体X射线能谱仪的测量方法

本标准规定了半导体X射线探测器系统和半导体X射线能谱仪主要特性的测量方法。 本标准适用于半导体X射线探测器系统和半导体X射线能谱仪主要性能的测量

Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers

GB/T 20726-2015 微束分析 电子探针显微分析X射线能谱仪主要性能参数及核查方法

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪(EDS)特性最重要的性能参数。本标准仅适用于基于固态电离原理的半导体探测器能谱仪。本标准规定了与扫描电镜(SEM)或电子探针(EPMA)联用的EDS性能参数的最低要求以及核查方法。至于实际分析过程，在ISO 22309

Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis

GB/T 25184-2010 X射线光电子能谱仪鉴定方法

本标准规定了X射线光电子能谱仪的检定方法。本标准适用于使用非单色化Al或Mg X射线或单色化Al X射线，且带有溅射清洁用离子枪的X射线光电子能谱仪的检定

Verification method for X-ray photoelectron spectrometers

IS 12737-1988 半导体 X 射线能量光谱仪的标准测试程序

This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation

ISO 16129:2018 表面化学分析 - X射线光电子能谱 - 评估X射线光电子能谱仪日常性能的方法

This document is designed to allow the user to assess, on a regular basis, several key parameters of an X-ray photoelectron spectrometer

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

ISO 16129:2012 表面化学分析.X射线光电子能光谱学.X射线光电子能谱仪日常性能评估规程

Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

BS ISO 16129:2012 表面化学分析.X射线光电子能光谱学.X射线光电子能谱仪日常性能评估规程

Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

GB/T 20726-2006 半导体探测器X射线能谱仪通则

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪（EDS）特性最重要的量值。本标准仅适用于国态电离作用原理的半导体探测器EDS。本标准只规定了与电子探针（EPMA）或扫描电镜（SEM）联用的此类EDS的最低要求，至于如何实现分析则不在本标准的规定范围之内

Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

IEC 60759:1983 半导体X射线能谱仪的标准试验程序

Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer

Standard test procedures for semiconductor X-ray energy spectrometers

CSN 35 6575 Z1-1997 半导体X射线能谱仪的标准测试程序

Standard test procedureds for semiconductor X-ray energy spectrometers

KS C IEC 60759:2009 半导体X射线能谱仪的标准试验程序

이 표준은 반도체 X-선 에너지 분광계에 대한 표준 시험절차를 제시한다. 해당 계통은 반도

Standard test procedures for semiconductor X-ray energy spectrometers

KS C IEC 60759-2009(2019 半导体X射线能谱仪的标准测试程序

Standard test procedures for semiconductor X-ray energy spectrometers

ANSI/IEEE Std 759-1984 半导体 X 射线能谱仪的 IEEE 标准测试程序

Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced

IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

SIS SS IEC 759:1986 核检测仪表．半导体X射线能谱仪检测程序

Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers

IEC 60759:1983/AMD1:1991 半导体X射线能谱仪的标准试验程序 修改1

Replaces one sentence in sub-clause 7.4.1 (page 55) and the Figure 15a (page 94

Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1

GB/T 11685-2003 半导体X射线探测器系统和半导体X射线能谱仪的测量方法

本标准规定了半导体X射线探测器系统和半导体X射线能谱仪主要特性的测量方法。 本标准适用于半导体X射线探测器系统和半导体X射线能谱仪主要性能的测量

Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers

GB/T 20726-2015 微束分析 电子探针显微分析X射线能谱仪主要性能参数及核查方法

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪(EDS)特性最重要的性能参数。本标准仅适用于基于固态电离原理的半导体探测器能谱仪。本标准规定了与扫描电镜(SEM)或电子探针(EPMA)联用的EDS性能参数的最低要求以及核查方法。至于实际分析过程，在ISO 22309

Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis

GB/T 25184-2010 X射线光电子能谱仪鉴定方法

本标准规定了X射线光电子能谱仪的检定方法。本标准适用于使用非单色化Al或Mg X射线或单色化Al X射线，且带有溅射清洁用离子枪的X射线光电子能谱仪的检定

Verification method for X-ray photoelectron spectrometers

IS 12737-1988 半导体 X 射线能量光谱仪的标准测试程序

This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation

ISO 16129:2018 表面化学分析 - X射线光电子能谱 - 评估X射线光电子能谱仪日常性能的方法

This document is designed to allow the user to assess, on a regular basis, several key parameters of an X-ray photoelectron spectrometer

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

ISO 16129:2012 表面化学分析.X射线光电子能光谱学.X射线光电子能谱仪日常性能评估规程

Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

BS ISO 16129:2012 表面化学分析.X射线光电子能光谱学.X射线光电子能谱仪日常性能评估规程

Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer