发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
点击量:0
FS: AC MOS DIGITAL INTEGRATED CIRCUITS. (Endorsed by AENOR in September of 1996.)
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
Semiconductor devices. Integrated circuits. Digital integrated circuits
IEC电子元器件质量评定体系遵循IEC章程并在IEC授权下工作。该体系的目的是确定质量评定程序,以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本族规范是半导体器件的一系列空白详细规范之一,并应与下列IEC标准一起使用。747-10
Semiconductor devices--Integrated circuits. Part 2: Digital integrated circuits. Section four--Family specification for complementary MOS digital integrated circuits, series 4000B and 4000UB
Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 3:Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
IEC电子元器件质量评定体系遵循IEC章程并在IEC授权下工作。该体系的目的是确定质量评定程序,以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本空白详细规范是半导体器件的一系列空白详细规范之一,并应与下列IEC标准一起使用
Semiconductor devices lntegrated circuits Part 2: Digital integrated circuits Section five--Blank detail specification for complementary MOS digital integrated circuits, series 4000B and 4000UB
IEC电子元器件质量评定体系遵循IEC的章程,并在IEC授权下进行工作。这个体系的目的是确定质量评定程序,使得由一个成员国根据相应规范要求认为合格而放行的电子元器件,在所有其他成员国内不需要再进行检验就能同样地承认其合格。 本族规范是与半导体器件有关的一系列空白详细规范之一,并且与下列
Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Section two-Family specification for HCMOS digital integrated circuits series 54/74HC, 54/74HCT, 54/74HCU
Defines quality assessment procedures and shall be used with the following IEC publications: 747-10/QC 700000 and 747-11/QC 790100
Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section four: family specification for complementary MOS digital integrated circuits; series 4000 B and 4000 UB
IEC电子元器件质量评定体系遵循IEC的章程,并在IEC授权下进行工作。这个体系的目的是确定质量评定程序,使得由一个成员国根据相应规范要求认为合格而放行的电子元器件,在所有其他成员国内不需要再进行检验就能同样地承认其合格。 本空白详细规范是与半导体器件有关的一系列空白详细规范之一,并且
Semiconductor devices. Integrated circuits--Part 2: Digital integrated circuits. Section three--Blank detail specification for HCMOS digital integrated circuits series 54/74HC, 54/74HCT, 54/74HCU
Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 12:Digital integrated circuits-Blank detail specification for programmable logic devices(PLDs)
Family Specification: AC MOS Digital Integrated Circuits
Sectional specification : digital monolithic integrated circuits
Measuring methods for MOS digital integrated circuits
Defines quality assessment procedures and shall be used with the following IEC publication: 747-10/QC 700000
Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section five: blank detail specification for complementary MOS digital integrated circuits; series 4000 B and 4000 UB
Part of the IEC Quality Assessment System for Electronic Components, it is one of a series of blank detail specifications for semiconductor devices
Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section 2: familiy specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
FS: AC MOS DIGITAL INTEGRATED CIRCUITS. (Endorsed by AENOR in September of 1996.)
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
Semiconductor devices. Integrated circuits. Digital integrated circuits
IEC电子元器件质量评定体系遵循IEC章程并在IEC授权下工作。该体系的目的是确定质量评定程序,以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本族规范是半导体器件的一系列空白详细规范之一,并应与下列IEC标准一起使用。747-10
Semiconductor devices--Integrated circuits. Part 2: Digital integrated circuits. Section four--Family specification for complementary MOS digital integrated circuits, series 4000B and 4000UB
Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 3:Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
IEC电子元器件质量评定体系遵循IEC章程并在IEC授权下工作。该体系的目的是确定质量评定程序,以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本空白详细规范是半导体器件的一系列空白详细规范之一,并应与下列IEC标准一起使用
Semiconductor devices lntegrated circuits Part 2: Digital integrated circuits Section five--Blank detail specification for complementary MOS digital integrated circuits, series 4000B and 4000UB
IEC电子元器件质量评定体系遵循IEC的章程,并在IEC授权下进行工作。这个体系的目的是确定质量评定程序,使得由一个成员国根据相应规范要求认为合格而放行的电子元器件,在所有其他成员国内不需要再进行检验就能同样地承认其合格。 本族规范是与半导体器件有关的一系列空白详细规范之一,并且与下列
Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Section two-Family specification for HCMOS digital integrated circuits series 54/74HC, 54/74HCT, 54/74HCU
Defines quality assessment procedures and shall be used with the following IEC publications: 747-10/QC 700000 and 747-11/QC 790100
Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section four: family specification for complementary MOS digital integrated circuits; series 4000 B and 4000 UB
IEC电子元器件质量评定体系遵循IEC的章程,并在IEC授权下进行工作。这个体系的目的是确定质量评定程序,使得由一个成员国根据相应规范要求认为合格而放行的电子元器件,在所有其他成员国内不需要再进行检验就能同样地承认其合格。 本空白详细规范是与半导体器件有关的一系列空白详细规范之一,并且
Semiconductor devices. Integrated circuits--Part 2: Digital integrated circuits. Section three--Blank detail specification for HCMOS digital integrated circuits series 54/74HC, 54/74HCT, 54/74HCU
Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 12:Digital integrated circuits-Blank detail specification for programmable logic devices(PLDs)
Family Specification: AC MOS Digital Integrated Circuits
Sectional specification : digital monolithic integrated circuits
Measuring methods for MOS digital integrated circuits
Defines quality assessment procedures and shall be used with the following IEC publication: 747-10/QC 700000
Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section five: blank detail specification for complementary MOS digital integrated circuits; series 4000 B and 4000 UB
Part of the IEC Quality Assessment System for Electronic Components, it is one of a series of blank detail specifications for semiconductor devices
Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section 2: familiy specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU