电子探针和X射线能谱定量分析检测

GB/T 17359-1998 电子探针和扫描电镜X射线能谱定量分析通则

本标准规定了与电子探针和扫描电镜联用的X射线能谱仪的定量分析方法的技术要求和规范。本标准适用于电子探针和扫描电镜X射线能谱仪对块状试样的定量分析

General specification of X-ray EDS quantitative analysis for EPMA and SEM

NF X21-003:2006 微光束分析.电子探针显微分析.波长分布X射线光谱测量法定量分析指南

Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.

NF X21-006:2007 微光束分析.电子探针微量分析.用波长色散X-射线光谱测量法进行块状样品的定量点分析

Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.

DB35/T 110-2000 油漆物证检测电子探针和扫描电镜X射线能谱分析方法

本标准规定了用电子探针或扫描电镜X射线能谱仪对油漆物证进行分析的方法原理、试样制备、测量条件、测量步骤及分析结果的判定。本标准适用于油漆物证中颜料和填料的机成分比对分析

Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

GB/T 20726-2015 微束分析 电子探针显微分析X射线能谱仪主要性能参数及核查方法

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪(EDS)特性最重要的性能参数。本标准仅适用于基于固态电离原理的半导体探测器能谱仪。本标准规定了与扫描电镜(SEM)或电子探针(EPMA)联用的EDS性能参数的最低要求以及核查方法。至于实际分析过程，在ISO 22309

Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis

ISO 17470:2014 微束分析. 电子探针微量分析. 用波长色散X射线光谱测定法定性点分析指南

This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within

Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

19/30394914 DC BS ISO 15632 微束分析 用于电子探针显微镜或电子探针微量分析仪(EPMA)的能量色散 X 射线光谱仪的规格和检查的选定仪器性能参数

BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)

NF X21-071:2011 表面化学分析.X射线光电子能谱法.分析用导则

Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.

ISO 22489:2016 微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品

Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

ISO 22489:2006 微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品

This International Standard specifies requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through

Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

KS D ISO 22489:2012 微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品

이 표준은 전자 탐침 미소분석기 또는 주사전자현미경(SEM)과 결합한 파장 분산 분광계(W

Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy

KS D ISO 22489:2018 微束分析 - 电子探针微量分析 - 使用波长色散X射线光谱法的批量样品的定量点分析

Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

KS D ISO 22489-2018 微束分析 - 电子探针微量分析 - 使用波长色散X射线光谱法的批量样品的定量点分析

Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

KS D ISO 15632:2018 微束分析 - 用于电子探针微量分析的能量色散X射线光谱仪的规范和检查的选定仪器性能参数

Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

KS D ISO 15632-2018 微束分析 - 用于电子探针微量分析的能量色散X射线光谱仪的规范和检查的选定仪器性能参数

Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

GB/T 17359-1998 电子探针和扫描电镜X射线能谱定量分析通则

本标准规定了与电子探针和扫描电镜联用的X射线能谱仪的定量分析方法的技术要求和规范。本标准适用于电子探针和扫描电镜X射线能谱仪对块状试样的定量分析

General specification of X-ray EDS quantitative analysis for EPMA and SEM

NF X21-003:2006 微光束分析.电子探针显微分析.波长分布X射线光谱测量法定量分析指南

Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.

NF X21-006:2007 微光束分析.电子探针微量分析.用波长色散X-射线光谱测量法进行块状样品的定量点分析

Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.

DB35/T 110-2000 油漆物证检测电子探针和扫描电镜X射线能谱分析方法

本标准规定了用电子探针或扫描电镜X射线能谱仪对油漆物证进行分析的方法原理、试样制备、测量条件、测量步骤及分析结果的判定。本标准适用于油漆物证中颜料和填料的机成分比对分析

Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

GB/T 20726-2015 微束分析 电子探针显微分析X射线能谱仪主要性能参数及核查方法

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪(EDS)特性最重要的性能参数。本标准仅适用于基于固态电离原理的半导体探测器能谱仪。本标准规定了与扫描电镜(SEM)或电子探针(EPMA)联用的EDS性能参数的最低要求以及核查方法。至于实际分析过程，在ISO 22309

Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis

ISO 17470:2014 微束分析. 电子探针微量分析. 用波长色散X射线光谱测定法定性点分析指南

This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within

Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

19/30394914 DC BS ISO 15632 微束分析 用于电子探针显微镜或电子探针微量分析仪(EPMA)的能量色散 X 射线光谱仪的规格和检查的选定仪器性能参数

BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)

NF X21-071:2011 表面化学分析.X射线光电子能谱法.分析用导则

Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.

ISO 22489:2016 微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品

Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

ISO 22489:2006 微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品

This International Standard specifies requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through

Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

KS D ISO 22489:2012 微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品

이 표준은 전자 탐침 미소분석기 또는 주사전자현미경(SEM)과 결합한 파장 분산 분광계(W

Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy

KS D ISO 22489:2018 微束分析 - 电子探针微量分析 - 使用波长色散X射线光谱法的批量样品的定量点分析

Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

KS D ISO 22489-2018 微束分析 - 电子探针微量分析 - 使用波长色散X射线光谱法的批量样品的定量点分析

Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

KS D ISO 15632:2018 微束分析 - 用于电子探针微量分析的能量色散X射线光谱仪的规范和检查的选定仪器性能参数

Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

KS D ISO 15632-2018 微束分析 - 用于电子探针微量分析的能量色散X射线光谱仪的规范和检查的选定仪器性能参数

Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis