JB/T 10033-1999 测微头
本标准规定了测微头的型式、基本参数、尺寸、技术要求、检验规则、标志与包装。 本标准适用于分度值为 0.01mm、0.001mm，测微螺杆螺纹的螺距为 0.5mm 或 1mm，测量范围为 0～15、0～25 和 0～50mm 的测微头
Micrometer head
KS B 5240-1994 测微头
Micrometer heads
JB/T 10033-2018 测微头
Micrometer head
BS 1734:1951 测微头规范
Heads for assembly with measuring or machine tools. Three types, thimble diameters below 1 in, 1 in and below 2 in, 2 in and over; measuring ranges
Specification for micrometer heads
JIS B 7504:1980 千分尺测微头
Micrometer heads
GB/T 22092-2008 电子数显测微头和深度千分尺
本标准规定了电子数显测微头和深度千分尺的术语和定义、型式与基本参数、要求、试验方法、检验方法、标志与包装等。 本标准适用于分辨率高于或等于0.001mm，量程小于或等于30mm的电子数显测微头和深度千分尺。量程等于50mm的电子数显测微头和深度千分尺参见附录
Fixed micrometer and depth micrometer with electronic digital display
JB/T 54285-1999 量具量仪产品质量分等 测微头
Measuring tools, measuring instruments, product quality grading, micrometer head
GOST 28798-1990 扭簧测微头.一般技术要求
Настоящий стандарт распространяется на измерительные пружинные головки осевого действия и устанавливает обязательные требования пп. 1.2-1
Spring measuring heads. General specifications
TCVN 4103-1985 外径千分尺.测微头.基本尺寸
Outside micrometers.Micrometer heads.Basic dimensions
GB/T 22092-2018 电子数显测微头和深度千分尺
本标准规定了电子数显测微头和电子数显深度千分尺的术语和定义、型式与基本参数、要求、检验方法、试验方法、标志与包装。 本标准适用于分辨力为0.001 mm，量程小于或等于50 mm的电子数显测微头和测量范围上限至300 mm的电子数显深度千分尺
Micrometer head and depth micrometer with electronic digital display
IS 9483-1980 带可旋转和不可旋转测砧的测微头规格
Covers requirements of micrometer heads with rotatable and non-rotatable anvils having measuring ranges of 2·5, 15 and 25 mm
CSN 25 1406-1986 测微计头．基本尺寸
Schválení ST SEV 345-76 doporu?ilo federální ministerstvo v?eobecného strojírenství. Zpracovatel a oborové normaliza?ní st?edisko: Továrny
Micrometer heads. Fundamental dimensions
VDI/VDE/DGQ 2618 Blatt 10.4-2008 测量和试验设备的检查 几何量测量和试验设备的检查指南 测微头的试验指南
This part of the guideline applies to the testing of micrometer heads conforming to DIN 863-2, with analogue or digital display. The necessary working
Inspection of measuring and test equipment - Instructions to inspect measuring and test equipment for geometrical quantities - Test instruction for micrometer heads
ASTM E1813-96e1 扫描探测显微镜探头测量和报告的标准实施规程
1.1 This practice covers scanning probe microscopy and describes the parameters needed for probe shape and orientation.
1.2 This practice
Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E1813-96(2002 扫描探测显微镜探头测量和报告的标准实施规程
1.1 This practice covers scanning probe microscopy and describes the parameters needed for probe shape and orientation.
1.2 This practice
Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
JB/T 10033-1999 测微头
本标准规定了测微头的型式、基本参数、尺寸、技术要求、检验规则、标志与包装。 本标准适用于分度值为 0.01mm、0.001mm，测微螺杆螺纹的螺距为 0.5mm 或 1mm，测量范围为 0～15、0～25 和 0～50mm 的测微头
Micrometer head
KS B 5240-1994 测微头
Micrometer heads
JB/T 10033-2018 测微头
Micrometer head
BS 1734:1951 测微头规范
Heads for assembly with measuring or machine tools. Three types, thimble diameters below 1 in, 1 in and below 2 in, 2 in and over; measuring ranges
Specification for micrometer heads
JIS B 7504:1980 千分尺测微头
Micrometer heads
GB/T 22092-2008 电子数显测微头和深度千分尺
本标准规定了电子数显测微头和深度千分尺的术语和定义、型式与基本参数、要求、试验方法、检验方法、标志与包装等。 本标准适用于分辨率高于或等于0.001mm，量程小于或等于30mm的电子数显测微头和深度千分尺。量程等于50mm的电子数显测微头和深度千分尺参见附录
Fixed micrometer and depth micrometer with electronic digital display
JB/T 54285-1999 量具量仪产品质量分等 测微头
Measuring tools, measuring instruments, product quality grading, micrometer head
GOST 28798-1990 扭簧测微头.一般技术要求
Настоящий стандарт распространяется на измерительные пружинные головки осевого действия и устанавливает обязательные требования пп. 1.2-1
Spring measuring heads. General specifications
TCVN 4103-1985 外径千分尺.测微头.基本尺寸
Outside micrometers.Micrometer heads.Basic dimensions
GB/T 22092-2018 电子数显测微头和深度千分尺
本标准规定了电子数显测微头和电子数显深度千分尺的术语和定义、型式与基本参数、要求、检验方法、试验方法、标志与包装。 本标准适用于分辨力为0.001 mm，量程小于或等于50 mm的电子数显测微头和测量范围上限至300 mm的电子数显深度千分尺
Micrometer head and depth micrometer with electronic digital display
IS 9483-1980 带可旋转和不可旋转测砧的测微头规格
Covers requirements of micrometer heads with rotatable and non-rotatable anvils having measuring ranges of 2·5, 15 and 25 mm
CSN 25 1406-1986 测微计头．基本尺寸
Schválení ST SEV 345-76 doporu?ilo federální ministerstvo v?eobecného strojírenství. Zpracovatel a oborové normaliza?ní st?edisko: Továrny
Micrometer heads. Fundamental dimensions
VDI/VDE/DGQ 2618 Blatt 10.4-2008 测量和试验设备的检查 几何量测量和试验设备的检查指南 测微头的试验指南
This part of the guideline applies to the testing of micrometer heads conforming to DIN 863-2, with analogue or digital display. The necessary working
Inspection of measuring and test equipment - Instructions to inspect measuring and test equipment for geometrical quantities - Test instruction for micrometer heads
ASTM E1813-96e1 扫描探测显微镜探头测量和报告的标准实施规程
1.1 This practice covers scanning probe microscopy and describes the parameters needed for probe shape and orientation.
1.2 This practice
Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E1813-96(2002 扫描探测显微镜探头测量和报告的标准实施规程
1.1 This practice covers scanning probe microscopy and describes the parameters needed for probe shape and orientation.
1.2 This practice
Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
编辑：北检院编辑部
