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模拟/数字转换器(ADC)检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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BS IEC 60748-4-3:2007 半导体件.集成电路.接口集成电路.(ADC)的动态标准

This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated

Semiconductor devices - Integrated circuits - Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

IEC 60748-4-3:2006 半导体件.集成电路.第4-3部分:接口集成电路./(ADC)的动力学标准

This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated

Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

GB/T 18500.2-2001 半导体件 集成电路 第4部分;接口集成电路 第二篇: 线性/(ADC)空白详细规范

本标准等同采用国际电工委员会(IEC)标准IEC 748-4-2:1993《半导体器件 集成电路 第4部分: 接口集成电路 第二篇: 线性模拟/数字转换器(ADC)空白详细规范》,以促进我国该类产品的国际贸易、技术和经济交流。 本标准可作为编制线性ADC详细规范的依据

Semiconductor devices Integrated circuits Part 4: Interface integrated circuits Section 2: Blank detail specification for linear analogue-to-digital converters(ADC)

GOST 24736-1981 集成

Digital-analogue and analogue-digital integrated converters. Basic parameters

GJB 9388-2018 集成电路测试方法

Test methods for integrated circuit analog-to-digital and digital-to-analog converters

CNS 5766-1980 设备

本标准用于模拟至数字转换器设备

Analog-to-Digital Conversion Equipment

ESDU 92044-1992

ESDU 92044 examines the replacement of an analogue controller element by an equivalent digital controller element while retaining for the new hybrid

Analogue to digital transformation.

SJ/T 10818-1996 半导体集成非线性电路//测试方法的基本原理

Semiconductor integrated circuits - General principles of measuring methods for D/A and A/D converters of non-linear circuits

IEEE 1241-2001 -的术语和试验方法

Provides common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). It considers only those ADCs whose

Terminology and test methods for analog-to-digital converters

GB/T 42839-2023 半导体集成电路 (AD)

Semiconductor integrated circuit analog-to-digital (AD) converter

GB/T 42973-2023 半导体集成电路 (DA)

Semiconductor integrated circuit digital-to-analog (DA) converters

DLA SMD-5962-90632 REV B-2012 微电路,-线性,-,12 位,单片硅

MICROCIRCUIT, DIGITAL-LINEAR, ANALOG-TODIGITAL CONVERTER, 12-BIT, MONOLITHIC SILICON

EJ/T 1049-1997 谱仪

Spectroscopic analog-to-digital converter

DLA SMD-5962-92039 REV A-2006 ,12比特直线式混合微型电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes

MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 12-BIT, ANALOG TO DIGITAL CONVERTER

DLA SMD-5962-00504 REV A-2008 微电路,-线性,-,8 位,1 GSPS,单片硅

MICROCIRCUIT, DIGITAL-LINEAR, ANALOG-TO-DIGITAL, CONVERTER, 8-BIT, 1 GSPS, MONOLITHIC SILICON

BS IEC 60748-4-3:2007 半导体件.集成电路.接口集成电路.(ADC)的动态标准

This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated

Semiconductor devices - Integrated circuits - Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

IEC 60748-4-3:2006 半导体件.集成电路.第4-3部分:接口集成电路./(ADC)的动力学标准

This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated

Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

GB/T 18500.2-2001 半导体件 集成电路 第4部分;接口集成电路 第二篇: 线性/(ADC)空白详细规范

本标准等同采用国际电工委员会(IEC)标准IEC 748-4-2:1993《半导体器件 集成电路 第4部分: 接口集成电路 第二篇: 线性模拟/数字转换器(ADC)空白详细规范》,以促进我国该类产品的国际贸易、技术和经济交流。 本标准可作为编制线性ADC详细规范的依据

Semiconductor devices Integrated circuits Part 4: Interface integrated circuits Section 2: Blank detail specification for linear analogue-to-digital converters(ADC)

GOST 24736-1981 集成

Digital-analogue and analogue-digital integrated converters. Basic parameters

GJB 9388-2018 集成电路测试方法

Test methods for integrated circuit analog-to-digital and digital-to-analog converters

CNS 5766-1980 设备

本标准用于模拟至数字转换器设备

Analog-to-Digital Conversion Equipment

ESDU 92044-1992

ESDU 92044 examines the replacement of an analogue controller element by an equivalent digital controller element while retaining for the new hybrid

Analogue to digital transformation.

SJ/T 10818-1996 半导体集成非线性电路//测试方法的基本原理

Semiconductor integrated circuits - General principles of measuring methods for D/A and A/D converters of non-linear circuits

IEEE 1241-2001 -的术语和试验方法

Provides common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). It considers only those ADCs whose

Terminology and test methods for analog-to-digital converters

GB/T 42839-2023 半导体集成电路 (AD)

Semiconductor integrated circuit analog-to-digital (AD) converter

GB/T 42973-2023 半导体集成电路 (DA)

Semiconductor integrated circuit digital-to-analog (DA) converters

DLA SMD-5962-90632 REV B-2012 微电路,-线性,-,12 位,单片硅

MICROCIRCUIT, DIGITAL-LINEAR, ANALOG-TODIGITAL CONVERTER, 12-BIT, MONOLITHIC SILICON

EJ/T 1049-1997 谱仪

Spectroscopic analog-to-digital converter

DLA SMD-5962-92039 REV A-2006 ,12比特直线式混合微型电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes

MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 12-BIT, ANALOG TO DIGITAL CONVERTER

DLA SMD-5962-00504 REV A-2008 微电路,-线性,-,8 位,1 GSPS,单片硅

MICROCIRCUIT, DIGITAL-LINEAR, ANALOG-TO-DIGITAL, CONVERTER, 8-BIT, 1 GSPS, MONOLITHIC SILICON

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