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数字/模拟转换器(DAC)检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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GB/T 18500.1-2001 半导体件 集成电路 第4部分;接口集成电路 第一篇: 线性/(DAC)空白详细规范

本标准等同采用国际电工委员会(IEC)标准IEC 748-4-1:1993《半导体器件 集成电路 第4部分: 接口集成电路 第一篇: 线性数字/模拟转换器(DAC)空白详细规范》,以促进我国该类产品的国际贸易、技术和经济交流。 本标准可作为编制线性DAC详细规范的依据

Semiconductor devices Integrated circuits Part 4: Interface integrated circuits Section 1: Blank detail specification for linear digital-to-analogue converters(DAC)

GOST 24736-1981 集成

Digital-analogue and analogue-digital integrated converters. Basic parameters

GJB 9388-2018 集成电路测试方法

Test methods for integrated circuit analog-to-digital and digital-to-analog converters

SJ/T 10818-1996 半导体集成非线性电路//测试方法的基本原理

Semiconductor integrated circuits - General principles of measuring methods for D/A and A/D converters of non-linear circuits

CNS 5766-1980 设备

本标准用于模拟至数字转换器设备

Analog-to-Digital Conversion Equipment

ESDU 92044-1992

ESDU 92044 examines the replacement of an analogue controller element by an equivalent digital controller element while retaining for the new hybrid

Analogue to digital transformation.

IEEE 1241-2001 -的术语和试验方法

Provides common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). It considers only those ADCs whose

Terminology and test methods for analog-to-digital converters

GB/T 42839-2023 半导体集成电路 (AD)

Semiconductor integrated circuit analog-to-digital (AD) converter

GB/T 42973-2023 半导体集成电路 (DA)

Semiconductor integrated circuit digital-to-analog (DA) converters

DLA SMD-5962-90632 REV B-2012 微电路,-线性,-,12 位,单片硅

MICROCIRCUIT, DIGITAL-LINEAR, ANALOG-TODIGITAL CONVERTER, 12-BIT, MONOLITHIC SILICON

SJ 2480-1984 混合集成电路.静态测试方法的基本原理

本标准规定了混合集成电路数字-模拟转换器的静态测试方法的基本原理

General principles of static measurement for D/A converters for hybrid integrated circuits

EJ/T 1049-1997 谱仪

Spectroscopic analog-to-digital converter

DLA SMD-5962-92039 REV A-2006 ,12比特直线式混合微型电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes

MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 12-BIT, ANALOG TO DIGITAL CONVERTER

DLA SMD-5962-00504 REV A-2008 微电路,-线性,-,8 位,1 GSPS,单片硅

MICROCIRCUIT, DIGITAL-LINEAR, ANALOG-TO-DIGITAL, CONVERTER, 8-BIT, 1 GSPS, MONOLITHIC SILICON

DLA SMD-5962-88505 REV A-2001 硅单片10位线性微电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, 10-BIT ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON

GB/T 18500.1-2001 半导体件 集成电路 第4部分;接口集成电路 第一篇: 线性/(DAC)空白详细规范

本标准等同采用国际电工委员会(IEC)标准IEC 748-4-1:1993《半导体器件 集成电路 第4部分: 接口集成电路 第一篇: 线性数字/模拟转换器(DAC)空白详细规范》,以促进我国该类产品的国际贸易、技术和经济交流。 本标准可作为编制线性DAC详细规范的依据

Semiconductor devices Integrated circuits Part 4: Interface integrated circuits Section 1: Blank detail specification for linear digital-to-analogue converters(DAC)

GOST 24736-1981 集成

Digital-analogue and analogue-digital integrated converters. Basic parameters

GJB 9388-2018 集成电路测试方法

Test methods for integrated circuit analog-to-digital and digital-to-analog converters

SJ/T 10818-1996 半导体集成非线性电路//测试方法的基本原理

Semiconductor integrated circuits - General principles of measuring methods for D/A and A/D converters of non-linear circuits

CNS 5766-1980 设备

本标准用于模拟至数字转换器设备

Analog-to-Digital Conversion Equipment

ESDU 92044-1992

ESDU 92044 examines the replacement of an analogue controller element by an equivalent digital controller element while retaining for the new hybrid

Analogue to digital transformation.

IEEE 1241-2001 -的术语和试验方法

Provides common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). It considers only those ADCs whose

Terminology and test methods for analog-to-digital converters

GB/T 42839-2023 半导体集成电路 (AD)

Semiconductor integrated circuit analog-to-digital (AD) converter

GB/T 42973-2023 半导体集成电路 (DA)

Semiconductor integrated circuit digital-to-analog (DA) converters

DLA SMD-5962-90632 REV B-2012 微电路,-线性,-,12 位,单片硅

MICROCIRCUIT, DIGITAL-LINEAR, ANALOG-TODIGITAL CONVERTER, 12-BIT, MONOLITHIC SILICON

SJ 2480-1984 混合集成电路.静态测试方法的基本原理

本标准规定了混合集成电路数字-模拟转换器的静态测试方法的基本原理

General principles of static measurement for D/A converters for hybrid integrated circuits

EJ/T 1049-1997 谱仪

Spectroscopic analog-to-digital converter

DLA SMD-5962-92039 REV A-2006 ,12比特直线式混合微型电路

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes

MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 12-BIT, ANALOG TO DIGITAL CONVERTER

DLA SMD-5962-00504 REV A-2008 微电路,-线性,-,8 位,1 GSPS,单片硅

MICROCIRCUIT, DIGITAL-LINEAR, ANALOG-TO-DIGITAL, CONVERTER, 8-BIT, 1 GSPS, MONOLITHIC SILICON

DLA SMD-5962-88505 REV A-2001 硅单片10位线性微电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix

MICROCIRCUIT, LINEAR, 10-BIT ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON

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