DLA SMD-5962-90730 REV C-2009 微电路、混合、高速采样保持放大器
MICROCIRCUIT, HYBRID, HIGH SPEED TRACK AND HOLD AMPLIFIER
SJ 50597/14-1994 混合微电路详细规范HSH91型精密双采样/保持放大器
Detail specification for hybrid microcircuits HSH91 precision dual sample/hold amplifier
SJ 50597/13-1994 混合微电路详细规范HSH4860型高速精密采样/保持放大器
Detail specification for hybrid microcircuits HSH4860 high speed,precision sample/hold amplifier
GB/T 14115-1993 半导体集成电路采样/保持放大器测试方法的基本原理
本标准规定了半导体集成电路采样/保持放大器（以下简称器件）电参数测试方法的基本原理。 本标准适用于半导体集成电路采样/保持放大器的电参数测试
General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
GB/T 12844-1991 半导体集成电路非线性电路系列和品种 采样/保持放大器的品种
本标准规定了半导体集成电路采样/保持放大器（以下简称器件）的引出端排列、功能框图和主要电参数。器件的质量评定应符合器件详细规范的规定。 本标准适用于生产（研制）或使用器件时的选型
Series and products of nonlinear circuits for semiconductor integrated circuits--Products of sample/hold amplifiers
DLA SMD-5962-87540 REV D-2009 微电路，线性，高速，采样和保持放大器，单片硅
MICROCIRCUIT, LINEAR, HIGH SPEED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-87677 REV C-2009 微电路、线性、高速采样和保持放大器、单片硅
MICROCIRCUIT, LINEAR, HIGH SPEED SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-89940 REV B-2011 微电路、混合、线性、采样和保持、高速放大器
MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER
DLA SMD-5962-89940 REV A-2003 高速取样保持放大器,线性混合微型电路
This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes
MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER
DLA SMD-5962-87540 REV C-2002 硅单块 取样与保持放大器高速直线式微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, HIGH SPEED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-87677 REV B-2002 硅单块 高速取样与保持放大器,直线型微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, HIGH SPEED SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-93063 REV C-2007 硅单片,高速准确取样保持放大器,线性微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-92013 REV B-2007 硅单块 四沟道取样与保持放大器,直线式微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, FOUR CHANNEL SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
JJG 956-2013 大气采样器
本规程适用于大气采样器的首次检定、后续检定和使用中检查
Air Samplers
KS A 4726-2013 放射性碘采样器
Radioactive iodine samplers
DLA SMD-5962-90730 REV C-2009 微电路、混合、高速采样保持放大器
MICROCIRCUIT, HYBRID, HIGH SPEED TRACK AND HOLD AMPLIFIER
SJ 50597/14-1994 混合微电路详细规范HSH91型精密双采样/保持放大器
Detail specification for hybrid microcircuits HSH91 precision dual sample/hold amplifier
SJ 50597/13-1994 混合微电路详细规范HSH4860型高速精密采样/保持放大器
Detail specification for hybrid microcircuits HSH4860 high speed,precision sample/hold amplifier
GB/T 14115-1993 半导体集成电路采样/保持放大器测试方法的基本原理
本标准规定了半导体集成电路采样/保持放大器（以下简称器件）电参数测试方法的基本原理。 本标准适用于半导体集成电路采样/保持放大器的电参数测试
General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
GB/T 12844-1991 半导体集成电路非线性电路系列和品种 采样/保持放大器的品种
本标准规定了半导体集成电路采样/保持放大器（以下简称器件）的引出端排列、功能框图和主要电参数。器件的质量评定应符合器件详细规范的规定。 本标准适用于生产（研制）或使用器件时的选型
Series and products of nonlinear circuits for semiconductor integrated circuits--Products of sample/hold amplifiers
DLA SMD-5962-87540 REV D-2009 微电路，线性，高速，采样和保持放大器，单片硅
MICROCIRCUIT, LINEAR, HIGH SPEED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-87677 REV C-2009 微电路、线性、高速采样和保持放大器、单片硅
MICROCIRCUIT, LINEAR, HIGH SPEED SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-89940 REV B-2011 微电路、混合、线性、采样和保持、高速放大器
MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER
DLA SMD-5962-89940 REV A-2003 高速取样保持放大器,线性混合微型电路
This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes
MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER
DLA SMD-5962-87540 REV C-2002 硅单块 取样与保持放大器高速直线式微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, HIGH SPEED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-87677 REV B-2002 硅单块 高速取样与保持放大器,直线型微型电路
This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix
MICROCIRCUIT, LINEAR, HIGH SPEED SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-93063 REV C-2007 硅单片,高速准确取样保持放大器,线性微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-92013 REV B-2007 硅单块 四沟道取样与保持放大器,直线式微型电路
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class
MICROCIRCUIT, LINEAR, FOUR CHANNEL SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
JJG 956-2013 大气采样器
本规程适用于大气采样器的首次检定、后续检定和使用中检查
Air Samplers
KS A 4726-2013 放射性碘采样器
Radioactive iodine samplers
编辑：北检院编辑部
