发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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本标准规定了静电偏转类电子束管侧引出线的相对位置和取向图的表示方法。 本标准适用于有侧引出线的电子束管
Graphic representation for arrangement of side output of electron beam tubes
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Microwave diodes and transistors
It is often required to measure the lead temperature of a packaged transistor under various load conditions
Recommend Practice for Measurement of Transistor Lead Temperature
本标准适用于半导体分立器件中表面安装器件的外形及其引线框架
Semiconductor discrete device Dimensions of outline and lead-frame for the surface mounting device
Semiconductor devices Discrete devices Part 4: Microwave diodes and transistors
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
J-Lead Installation Multi-Lead Method
Pipe Isometric Drawing Index and Segment Table Index
Water conduit for fire extinguishing - Planning and installation of fire hose systems and water conduit for fire extinguishing, Corrigenda to DIN 14462:2007-01
Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode Silver Case@ Axial Lead@ Elastomeric Seal@ Polarized@ Nickel Positive@ Copper Negative Leads@ Insulated
INDUCTOR, SURFACE MOUNT, LEADLESS
This standard provides a method for the packaging of axial/radid components, (diodes, transistors, resistors capacitors, etc.) in blister packages
Axial/Radial Lead Components, Individual Packaging of (Rev. 2)
This industry standard covers *e general requirements for cermet or metal film type resistor networks, prhrily intended for incorporation
Leaded Surface Mount Resistor Networks Fixed Film
Surface mounting technology.discrete devices.part 9: insulated.gate bipolar transistors (igbts)
本标准规定了半导体光电二极管和光电晶体管(以下简称“器件”)光电参数的测试方法。本标准适用于半导体光电二极管和光电晶体管光电参数的测试。本标准不适用PIN、雪崩光电二极管的测试
Measuring methods for semiconductor photodiode and phototransistor
本标准规定了静电偏转类电子束管侧引出线的相对位置和取向图的表示方法。 本标准适用于有侧引出线的电子束管
Graphic representation for arrangement of side output of electron beam tubes
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Microwave diodes and transistors
It is often required to measure the lead temperature of a packaged transistor under various load conditions
Recommend Practice for Measurement of Transistor Lead Temperature
本标准适用于半导体分立器件中表面安装器件的外形及其引线框架
Semiconductor discrete device Dimensions of outline and lead-frame for the surface mounting device
Semiconductor devices Discrete devices Part 4: Microwave diodes and transistors
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
J-Lead Installation Multi-Lead Method
Pipe Isometric Drawing Index and Segment Table Index
Water conduit for fire extinguishing - Planning and installation of fire hose systems and water conduit for fire extinguishing, Corrigenda to DIN 14462:2007-01
Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode Silver Case@ Axial Lead@ Elastomeric Seal@ Polarized@ Nickel Positive@ Copper Negative Leads@ Insulated
INDUCTOR, SURFACE MOUNT, LEADLESS
This standard provides a method for the packaging of axial/radid components, (diodes, transistors, resistors capacitors, etc.) in blister packages
Axial/Radial Lead Components, Individual Packaging of (Rev. 2)
This industry standard covers *e general requirements for cermet or metal film type resistor networks, prhrily intended for incorporation
Leaded Surface Mount Resistor Networks Fixed Film
Surface mounting technology.discrete devices.part 9: insulated.gate bipolar transistors (igbts)
本标准规定了半导体光电二极管和光电晶体管(以下简称“器件”)光电参数的测试方法。本标准适用于半导体光电二极管和光电晶体管光电参数的测试。本标准不适用PIN、雪崩光电二极管的测试
Measuring methods for semiconductor photodiode and phototransistor