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本标准规定了高介电常数、低损耗、小温度系数微波介质材料的分类、技术要求和试验方法、检验规则、包装、贮存和运输。 本标准适用于"微波介质材料 A-陶瓷
Dielectric materials for microwave.A-Ceramic
本标准规定了电容器用陶瓷介质材料的分类、要求、试验方法、检验规则、标志、包装、运输和贮存等。 本标准适用于制造电容器用陶瓷介质材料（以下简称电容器瓷料
Ceramic dielectric materials used for capacitors
IPC Standards and Publications are designed to serve the public interest throughIPC Standards and Publications are designed to serve the public
Shear Strength Flexible Dielectric Materials
本文件规定了采用闭腔法测量频率在1 GHz~20 GHz范围内的固体电介质和复合板材料的介电常数和损耗角正切值的方法。其中，介电常数的测试范围为5~100，损耗角正切值的测试范围为0.00005~0.005。 本文件适用于可加工为柱状的氧化硅、氧化铝、氮化铝、氧化锆、氮化硼等
Measurement of dielectric properties of solid-state dielectric materials in microwave frequency range—The closed cavity method
This standard provides the principles and details for declarations necessary between members of a supply chain. Although this standard contains only
Dimensional Stability, Flexible Dielectric Materials Revision C
本标准采用光学腔，即半共焦准光腔作为测试腔体来测试固体电介质的介电特性。 本标准适用于可加工成片状的固体电介质材料
Test method for complex permittivity of solid dielectric materials at millimeter wave frequencies using "Quasi-Optic cavity" technique
本标准适用于加工成圆筒状的均匀固体电介质材料的介电常数ε′和损耗角正切tanδ的测试
Test method for dielectric properties of microwave solid dielectric materials Coaxial terminal short circuit method
本标准规定了用同轴线终端开路法测试各向同性的团体、液体电介质材料的微波复介电常数。 本标准涉及的复介电常数由相对介电常数实部，和介质损耗角正切tan所表示
Detail specification for electronic components--Semiconductor integrated circuits--CT54LS00/CT74LS00 Quad 2-input positive-NAND gate
This standard establishes requirements and other considerations
Volume and Surface Resistivity of Dielectric Materials; Revision A - December 1994
Classification and designation for names and models of ceramic dielectric materials for capacitors
This test method covers the evaluation and comparison of the resistance of solid organic dielectric materials to the initiation or growth, or both
Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields
1.1 This test method covers the evaluation and comparison of the resistance of solid organic dielectric materials to the initiation or growth, or both
Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields
Résonateurs diélectriques à modes guidés - Partie 1-3 : informations générales et conditions d'essais - Méthode de mesure de la permittivité relative complexe des matériaux diélectriques pour les résonateurs diélectriques fonctionnant aux ...
本标准规定了高介电常数、低损耗、小温度系数微波介质材料的分类、技术要求和试验方法、检验规则、包装、贮存和运输。 本标准适用于"微波介质材料 A-陶瓷
Dielectric materials for microwave.A-Ceramic
本标准规定了电容器用陶瓷介质材料的分类、要求、试验方法、检验规则、标志、包装、运输和贮存等。 本标准适用于制造电容器用陶瓷介质材料（以下简称电容器瓷料
Ceramic dielectric materials used for capacitors
IPC Standards and Publications are designed to serve the public interest throughIPC Standards and Publications are designed to serve the public
Shear Strength Flexible Dielectric Materials
本文件规定了采用闭腔法测量频率在1 GHz~20 GHz范围内的固体电介质和复合板材料的介电常数和损耗角正切值的方法。其中，介电常数的测试范围为5~100，损耗角正切值的测试范围为0.00005~0.005。 本文件适用于可加工为柱状的氧化硅、氧化铝、氮化铝、氧化锆、氮化硼等
Measurement of dielectric properties of solid-state dielectric materials in microwave frequency range—The closed cavity method
This standard provides the principles and details for declarations necessary between members of a supply chain. Although this standard contains only
Dimensional Stability, Flexible Dielectric Materials Revision C
本标准采用光学腔，即半共焦准光腔作为测试腔体来测试固体电介质的介电特性。 本标准适用于可加工成片状的固体电介质材料
Test method for complex permittivity of solid dielectric materials at millimeter wave frequencies using "Quasi-Optic cavity" technique
本标准适用于加工成圆筒状的均匀固体电介质材料的介电常数ε′和损耗角正切tanδ的测试
Test method for dielectric properties of microwave solid dielectric materials Coaxial terminal short circuit method
本标准规定了用同轴线终端开路法测试各向同性的团体、液体电介质材料的微波复介电常数。 本标准涉及的复介电常数由相对介电常数实部，和介质损耗角正切tan所表示
Detail specification for electronic components--Semiconductor integrated circuits--CT54LS00/CT74LS00 Quad 2-input positive-NAND gate
This standard establishes requirements and other considerations
Volume and Surface Resistivity of Dielectric Materials; Revision A - December 1994
Classification and designation for names and models of ceramic dielectric materials for capacitors
This test method covers the evaluation and comparison of the resistance of solid organic dielectric materials to the initiation or growth, or both
Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields
1.1 This test method covers the evaluation and comparison of the resistance of solid organic dielectric materials to the initiation or growth, or both
Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields
Résonateurs diélectriques à modes guidés - Partie 1-3 : informations générales et conditions d'essais - Méthode de mesure de la permittivité relative complexe des matériaux diélectriques pour les résonateurs diélectriques fonctionnant aux ...
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