集成电路/电子元器件（电磁兼容）检测

SJ/T 10987-1996 电子元器件详细规范 半导体电视集成电路CD5435CP磁场扫描电路

Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits

SJ 3181-1989 电子元器件图形库.集成电路图形库

本标准规定了计算机辅助设计印制板用电子元器件图形库中的集成电路图形的设计规范。 本标准适用于计算机辅助设计印制板或借助于计算机帮助设计印制板。 手工设计印制板也可参考

Graphic base of electronic elements.IC Graphic

SAE J1752/1-1997 集成电路电磁兼容性测量规程-集成电路EMC测量规程-总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752. The near

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurement Procedures-General and Definition

SAE J1752/1-2006 集成电路电磁兼容性测量程序-集成电路EMC测量程序-总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits—Integrated Circuit EMC Measurement Procedures—General and Definitions

SAE J1752-3-2003 集成电路的电磁兼容性测量程序集成电路EMC测量程序总则和定义

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

SAE J1752-1-2016 集成电路的电磁兼容性测量程序集成电路EMC测量程序总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

SAE J1752-1-1997 集成电路的电磁兼容性测量程序 集成电路 EMC 测量程序 概述和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

SAE J1752-1-2021 集成电路的电磁兼容性测量程序集成电路EMC测量程序总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

SAE J1752/1-2016 集成电路的电磁兼容性测量程序 集成电路 EMC 测量程序 概述和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

SAE J1752/1-2021 集成电路的电磁兼容性测量程序 集成电路 EMC 测量程序 概述和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

SAE J1752-3-2017 集成电路的电磁兼容性测量程序集成电路EMC测量程序总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

SAE J1752-1-2006 集成电路电磁兼容性(EMC)测量方法总则和定义用电磁兼容性(EMC)测量方法

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J 1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

IEC 62228-1:2018 集成电路收发器的电磁兼容性评估. 第1部分:一般条件和定义

This part of IEC 62228 provides general information and definitions for electromagnetic compatibility (EMC) evaluation of integrated circuits (IC

Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions

SJ/T 10831-1996 电子元器件详细规范 半导体集成电路CD7193CP色处理电路

Detailed specifications for electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits

SJ/T 10991-1996 电子元器件详细规范 半导体集成电路CW574CS电子调谐器稳压器

Detailed specifications for electronic components - Semiconductor integrated circuits - CW574CS voltage regulators for electronic tuners

SJ/T 10987-1996 电子元器件详细规范 半导体电视集成电路CD5435CP磁场扫描电路

Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits

SJ 3181-1989 电子元器件图形库.集成电路图形库

本标准规定了计算机辅助设计印制板用电子元器件图形库中的集成电路图形的设计规范。 本标准适用于计算机辅助设计印制板或借助于计算机帮助设计印制板。 手工设计印制板也可参考

Graphic base of electronic elements.IC Graphic

SAE J1752/1-1997 集成电路电磁兼容性测量规程-集成电路EMC测量规程-总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752. The near

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurement Procedures-General and Definition

SAE J1752/1-2006 集成电路电磁兼容性测量程序-集成电路EMC测量程序-总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits—Integrated Circuit EMC Measurement Procedures—General and Definitions

SAE J1752-3-2003 集成电路的电磁兼容性测量程序集成电路EMC测量程序总则和定义

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

SAE J1752-1-2016 集成电路的电磁兼容性测量程序集成电路EMC测量程序总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

SAE J1752-1-1997 集成电路的电磁兼容性测量程序 集成电路 EMC 测量程序 概述和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

SAE J1752-1-2021 集成电路的电磁兼容性测量程序集成电路EMC测量程序总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

SAE J1752/1-2016 集成电路的电磁兼容性测量程序 集成电路 EMC 测量程序 概述和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

SAE J1752/1-2021 集成电路的电磁兼容性测量程序 集成电路 EMC 测量程序 概述和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

SAE J1752-3-2017 集成电路的电磁兼容性测量程序集成电路EMC测量程序总则和定义

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

SAE J1752-1-2006 集成电路电磁兼容性(EMC)测量方法总则和定义用电磁兼容性(EMC)测量方法

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J 1752 series

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition

IEC 62228-1:2018 集成电路收发器的电磁兼容性评估. 第1部分:一般条件和定义

This part of IEC 62228 provides general information and definitions for electromagnetic compatibility (EMC) evaluation of integrated circuits (IC

Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions

SJ/T 10831-1996 电子元器件详细规范 半导体集成电路CD7193CP色处理电路

Detailed specifications for electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits

SJ/T 10991-1996 电子元器件详细规范 半导体集成电路CW574CS电子调谐器稳压器

Detailed specifications for electronic components - Semiconductor integrated circuits - CW574CS voltage regulators for electronic tuners