半导体发光器件检测

SJ 2355.1-1983 半导体发光器件测试方法.总则

General procedures of measurement for light-emitting deivces

SJ 2355.6-1983 半导体发光器件测试方法.光通量的测试方法

Method of measurement for luminous flux of light-emitting devices

SJ 2355.4-1983 半导体发光器件测试方法.结电容的测试方法

Methods of measurement for junction capacitance of light-emitting devices

SJ 2355.2-1983 半导体发光器件测试方法.正向压降的测试方法

Method of measurement for forward voltage drop of light-emitting devices

SJ 2355.3-1983 半导体发光器件测试方法.反向电流的测试方法

Method of measurement for reverse current of light-emitting devices

SJ 2355.5-1983 半导体发光器件测试方法.法向光强和半强度角的测试方法

Method of measurement for luminous intensity and half-intensity angle of light-emitting devices

SJ 2355.7-1983 半导体发光器件测试方法.发光峰值波长和光谱半宽度的测试方法

Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices

SJ 2684-1986 半导体发光(可见光)器件外形尺寸

Physical Demensions For Light Emitting Device Of Semiconductor

PD IEC TR 60747-5-12:2021 半导体器件 光电器件 发光二极管 LED效率测试方法

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies

GJB 2146A-2011 半导体发光二极管器件通用规范

General specification for semiconductor light-emitting diode devices

BS IEC 60747-5-8:2019 半导体器件 光电器件 发光二极管 发光二极管光电效率的测试方法

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes

BS IEC 60747-5-15:2022 半导体器件-光电器件 发光二极管 基于电反射光谱的平带电压测试方法

1   Scope This part of IEC 60747‑5 specifies the measuring methods of flat-band voltage of single GaN-based light emitting

Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy

BS IEC 60747-5-9:2019 半导体器件 光电器件 发光二极管 基于温变电致发光的内量子效率测试方法

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

BS IEC 60747-5-11:2019 半导体器件 光电器件 发光二极管 发光二极管辐射和非辐射电流的测试方法

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes

SJ/T 11393-2009 半导体光电子器件 功率发光二极管空白详细规范

Semiconductor optoelectronic devices-Blank detail specification for power light-emitting diodes

SJ 2355.1-1983 半导体发光器件测试方法.总则

General procedures of measurement for light-emitting deivces

SJ 2355.6-1983 半导体发光器件测试方法.光通量的测试方法

Method of measurement for luminous flux of light-emitting devices

SJ 2355.4-1983 半导体发光器件测试方法.结电容的测试方法

Methods of measurement for junction capacitance of light-emitting devices

SJ 2355.2-1983 半导体发光器件测试方法.正向压降的测试方法

Method of measurement for forward voltage drop of light-emitting devices

SJ 2355.3-1983 半导体发光器件测试方法.反向电流的测试方法

Method of measurement for reverse current of light-emitting devices

SJ 2355.5-1983 半导体发光器件测试方法.法向光强和半强度角的测试方法

Method of measurement for luminous intensity and half-intensity angle of light-emitting devices

SJ 2355.7-1983 半导体发光器件测试方法.发光峰值波长和光谱半宽度的测试方法

Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices

SJ 2684-1986 半导体发光(可见光)器件外形尺寸

Physical Demensions For Light Emitting Device Of Semiconductor

PD IEC TR 60747-5-12:2021 半导体器件 光电器件 发光二极管 LED效率测试方法

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies

GJB 2146A-2011 半导体发光二极管器件通用规范

General specification for semiconductor light-emitting diode devices

BS IEC 60747-5-8:2019 半导体器件 光电器件 发光二极管 发光二极管光电效率的测试方法

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes

BS IEC 60747-5-15:2022 半导体器件-光电器件 发光二极管 基于电反射光谱的平带电压测试方法

1   Scope This part of IEC 60747‑5 specifies the measuring methods of flat-band voltage of single GaN-based light emitting

Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy

BS IEC 60747-5-9:2019 半导体器件 光电器件 发光二极管 基于温变电致发光的内量子效率测试方法

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

BS IEC 60747-5-11:2019 半导体器件 光电器件 发光二极管 发光二极管辐射和非辐射电流的测试方法

Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes

SJ/T 11393-2009 半导体光电子器件 功率发光二极管空白详细规范

Semiconductor optoelectronic devices-Blank detail specification for power light-emitting diodes