发布时间：2024-05-27 17:49:26 - 更新时间：2024年06月29日 15:22
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本部分定义了带触点的集成电路卡及其相关接口设备特性的测试方法，该方法与GB/T 16649给出的定义相适应。每一测试方法交叉引用一个或多个基础标准，这些基础标准可以是GB/T 14916，也可以是一个或多个定义了应用在识别卡应用的信息存储技术的补充标准。 本部分只定义了带触点的
Identification cards - Test methods - Part 3: Integrated circuit(s) cards with contacts and related interface devices
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit(s) cards with contacts and related interface devices
Identification cards - Test methods - Part 3: Integrated circuit(s) cards with contacts and related interface devices Adopted by INCITS
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
No scope available
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
Identification cards. Test methods. Part 3. Integrated circuit cards with contacts and related interface devices
Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices
Identification cards－Test methods－Part 3：Integrated circuit(s) cards with contacts and related interface device
Specifies the power and signal structures, and the information exchange between an integrated circuit card and an interface device such as a terminal.
Identification cards - Integrated circuit cards - Part 3: Cards with contacts - Electrical interface and transmission protocols
GB/T 16649的本部分规定了ID-1型集成电路卡上每一个触点的尺寸、位置和分配。 GB/T 16649的本部分应与GB/T 16649.1结合使用
Identification cards - Integrated circuit(s) cards with contacts - Part 2: Dimensions and location of the contacts
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices; Technical Corrigendum 1
Identification cards - Test methods - Part 3: Integrated circuit(s) cards with contacts and related interface devices (Adopted by INCITS)
この規格は,JIS X 6301に基づく識別カードの特性評価試験方法について適用する
Identification cards -- Test methods -- Part 3: Integrated circuit(s) cards with contacts and related interface devices
本部分定义了带触点的集成电路卡及其相关接口设备特性的测试方法，该方法与GB/T 16649给出的定义相适应。每一测试方法交叉引用一个或多个基础标准，这些基础标准可以是GB/T 14916，也可以是一个或多个定义了应用在识别卡应用的信息存储技术的补充标准。 本部分只定义了带触点的
Identification cards - Test methods - Part 3: Integrated circuit(s) cards with contacts and related interface devices
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit(s) cards with contacts and related interface devices
Identification cards - Test methods - Part 3: Integrated circuit(s) cards with contacts and related interface devices Adopted by INCITS
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
No scope available
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
Identification cards. Test methods. Part 3. Integrated circuit cards with contacts and related interface devices
Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices
Identification cards－Test methods－Part 3：Integrated circuit(s) cards with contacts and related interface device
Specifies the power and signal structures, and the information exchange between an integrated circuit card and an interface device such as a terminal.
Identification cards - Integrated circuit cards - Part 3: Cards with contacts - Electrical interface and transmission protocols
GB/T 16649的本部分规定了ID-1型集成电路卡上每一个触点的尺寸、位置和分配。 GB/T 16649的本部分应与GB/T 16649.1结合使用
Identification cards - Integrated circuit(s) cards with contacts - Part 2: Dimensions and location of the contacts
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices; Technical Corrigendum 1
Identification cards - Test methods - Part 3: Integrated circuit(s) cards with contacts and related interface devices (Adopted by INCITS)
この規格は,JIS X 6301に基づく識別カードの特性評価試験方法について適用する
Identification cards -- Test methods -- Part 3: Integrated circuit(s) cards with contacts and related interface devices
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