ASTM E2859-11(2023 使用原子力显微镜测量纳米粒子尺寸的标准指南
1.1 The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size
Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
GB/T 33714-2017 纳米技术 纳米颗粒尺寸测量 原子力显微术
Nanotechnology—Test method for size of nanoparticles—Atomic force microscopy
UNE-CEN/TS 17629:2021 纳米技术 纳米和微米尺度划痕测试
Nanotechnologies - Nano- and micro- scale scratch testing (Endorsed by Asociación Española de Normalización in July of 2021.)
XP CEN/TS 17629:2021 纳米技术 - 纳米和微米尺度的划痕测试
Nanotechnologies - Essais de rayure aux échelles nano- et micro métriques
MSZ 11401-1984 流动测量微米主要尺寸
EN ISO 19749:2023 纳米技术.用扫描电子显微镜测量颗粒尺寸和形状分布
This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope
Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
BS ISO 19749:2021 纳米技术 用扫描电子显微镜测量颗粒尺寸和形状分布
Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
ISO 19749:2021 纳米技术.用扫描电子显微镜测量颗粒尺寸和形状分布
This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope
Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 19749-2023 纳米技术——用扫描电子显微镜测量颗粒尺寸和形状分布
Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 21363-2023 纳米技术——用透射电子显微镜测量颗粒尺寸和形状分布
Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
PD CEN ISO/TR 11811:2012 纳米技术 纳米和微米摩擦学测量方法指南
Nanotechnologies. Guidance on methods for nano- and microtribology measurements
DIN CEN ISO/TR 11811:2012-12*DIN SPEC 91217:2012-12 纳米技术 纳米和微米摩擦学测量方法指南
Nanotechnologies - Guidance on methods for nano- and microtribology measurements (ISO/TR 11811:2012); German version CEN ISO/TR 11811:2012
BS PD CEN ISO/TR 11811:2012 纳米技术 — 纳米和微米摩擦学测量方法指南
Nanotechnologies — Guidance on methods for nano - and microtribology measurements
BS EN ISO 21363:2022 纳米技术 通过透射电子显微镜测量颗粒尺寸和形状分布
1 Scope This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size
Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS EN ISO 19749:2023 纳米技术 通过扫描电子显微镜测量颗粒尺寸和形状分布
1 Scope This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning
Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
ASTM E2859-11(2023 使用原子力显微镜测量纳米粒子尺寸的标准指南
1.1 The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size
Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
GB/T 33714-2017 纳米技术 纳米颗粒尺寸测量 原子力显微术
Nanotechnology—Test method for size of nanoparticles—Atomic force microscopy
UNE-CEN/TS 17629:2021 纳米技术 纳米和微米尺度划痕测试
Nanotechnologies - Nano- and micro- scale scratch testing (Endorsed by Asociación Española de Normalización in July of 2021.)
XP CEN/TS 17629:2021 纳米技术 - 纳米和微米尺度的划痕测试
Nanotechnologies - Essais de rayure aux échelles nano- et micro métriques
MSZ 11401-1984 流动测量微米主要尺寸
EN ISO 19749:2023 纳米技术.用扫描电子显微镜测量颗粒尺寸和形状分布
This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope
Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
BS ISO 19749:2021 纳米技术 用扫描电子显微镜测量颗粒尺寸和形状分布
Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
ISO 19749:2021 纳米技术.用扫描电子显微镜测量颗粒尺寸和形状分布
This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope
Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 19749-2023 纳米技术——用扫描电子显微镜测量颗粒尺寸和形状分布
Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 21363-2023 纳米技术——用透射电子显微镜测量颗粒尺寸和形状分布
Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
BS PD CEN ISO/TR 11811:2012 纳米技术 — 纳米和微米摩擦学测量方法指南
Nanotechnologies — Guidance on methods for nano - and microtribology measurements
PD CEN ISO/TR 11811:2012 纳米技术 纳米和微米摩擦学测量方法指南
Nanotechnologies. Guidance on methods for nano- and microtribology measurements
DIN CEN ISO/TR 11811:2012-12*DIN SPEC 91217:2012-12 纳米技术 纳米和微米摩擦学测量方法指南
Nanotechnologies - Guidance on methods for nano- and microtribology measurements (ISO/TR 11811:2012); German version CEN ISO/TR 11811:2012
BS EN ISO 21363:2022 纳米技术 通过透射电子显微镜测量颗粒尺寸和形状分布
1 Scope This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size
Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS EN ISO 19749:2023 纳米技术 通过扫描电子显微镜测量颗粒尺寸和形状分布
1 Scope This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning
Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
编辑：北检院编辑部
