JJG 480-2007 X射线测厚仪检定规程
本规程适用于 X 射线测厚仪的首次检定、后续检定和使用中检验
X-ray Thickness Gauge
JJG 480-1987 X射线测厚仪检定规程
Verification Regulation of X-Ray Thickness Gauge
JJF 1613-2017 掠入射X射线反射膜厚测量仪器校准规范
Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
JJF 1306-2011 X射线荧光镀层测厚仪校准规范
本规范适用于X射线荧光镀层测厚仪的校准
Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments
KS D ISO 3497-2002(2017 金属涂层 - 涂层厚度的测量 - X射线光谱仪的方法
Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
GOST 22091.4-1986 X射线仪.X射线管电压测量方法
X-ray devices. The methods of measuring of the voltage of X-ray tube
GOST 22091.5-1986 X射线仪.X射线管电流测量方法
X-ray devices. The methods of measuring X-ray tube current
JIS Z 4328:1984 X、γ射线辐射测量仪
Radiation survey meters for X and gamma rays
JB/T 11144-2011 X射线衍射仪
本标准规定了X射线衍射仪的术语和定义、产品分类、技术要求、检验规则、测试方法、标志、包装运输、贮存等。 本标准适用于θ-θ、θ-2θ结构测角仪的多晶X射线衍射仪（以下简称衍射仪
X-ray diffractometer
EJ/T 1100-1999 X射线荧光测井仪
Bore-hole apparatus for X-ray fluorescence analysis
CB-13-1990 X 射线荧光测量镀层厚度
PURPOSE There are a number of techniques currently being used for measuring plating thickness. All have peculiar application and also limitations
X-Ray Fluorescence for Measuring Plating Thickness
JIS Z 4606:2007 射线照相测试用工业X-射线仪
この規格は，X線透過試験用いる工業用X線装置(以下，x線装置という。)について規定する
Industrial X-ray apparatus for radiographic testing
JIS Z 4324:1997 X、γ 射线区域监测仪
この規格は，原子力施設及び放射線利用施設の建屋内の作業環境における，X線及びγ線の1 cm線量当量率を連続的に監視するためのエリアモニタ(以下，モニタという。)について規定する。ただし，バルス状の放射線に使用するモニタには適用しない
Area monitors for X and gamma rays
ECA CB-13-1990 镀层厚度测定的X射线荧光
There are a number of techniques currently being used for measuring plating thickness. All have peculiar application and also limitations, Basic
X-Ray Fluorescence for Measuring Plating Thickness
QB/T 1135-2006 首饰 金 银覆盖层厚度的测定 X射线荧光光谱法
本标准规定了用X射线荧光光谱法测量首饰金、银覆盖层厚度的方法。 本标准适用于首饰及其他工艺品中金、银等覆盖层厚度的测定（覆盖层与基体为非相同材质
Jewellery Measurement of gold and silver coating tickness X-ray fluorescence spectrometric methods
JJG 480-2007 X射线测厚仪检定规程
本规程适用于 X 射线测厚仪的首次检定、后续检定和使用中检验
X-ray Thickness Gauge
JJG 480-1987 X射线测厚仪检定规程
Verification Regulation of X-Ray Thickness Gauge
JJF 1613-2017 掠入射X射线反射膜厚测量仪器校准规范
Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
JJF 1306-2011 X射线荧光镀层测厚仪校准规范
本规范适用于X射线荧光镀层测厚仪的校准
Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments
KS D ISO 3497-2002(2017 金属涂层 - 涂层厚度的测量 - X射线光谱仪的方法
Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
GOST 22091.4-1986 X射线仪.X射线管电压测量方法
X-ray devices. The methods of measuring of the voltage of X-ray tube
GOST 22091.5-1986 X射线仪.X射线管电流测量方法
X-ray devices. The methods of measuring X-ray tube current
JIS Z 4328:1984 X、γ射线辐射测量仪
Radiation survey meters for X and gamma rays
JB/T 11144-2011 X射线衍射仪
本标准规定了X射线衍射仪的术语和定义、产品分类、技术要求、检验规则、测试方法、标志、包装运输、贮存等。 本标准适用于θ-θ、θ-2θ结构测角仪的多晶X射线衍射仪（以下简称衍射仪
X-ray diffractometer
EJ/T 1100-1999 X射线荧光测井仪
Bore-hole apparatus for X-ray fluorescence analysis
CB-13-1990 X 射线荧光测量镀层厚度
PURPOSE There are a number of techniques currently being used for measuring plating thickness. All have peculiar application and also limitations
X-Ray Fluorescence for Measuring Plating Thickness
JIS Z 4606:2007 射线照相测试用工业X-射线仪
この規格は，X線透過試験用いる工業用X線装置(以下，x線装置という。)について規定する
Industrial X-ray apparatus for radiographic testing
JIS Z 4324:1997 X、γ 射线区域监测仪
この規格は，原子力施設及び放射線利用施設の建屋内の作業環境における，X線及びγ線の1 cm線量当量率を連続的に監視するためのエリアモニタ(以下，モニタという。)について規定する。ただし，バルス状の放射線に使用するモニタには適用しない
Area monitors for X and gamma rays
ECA CB-13-1990 镀层厚度测定的X射线荧光
There are a number of techniques currently being used for measuring plating thickness. All have peculiar application and also limitations, Basic
X-Ray Fluorescence for Measuring Plating Thickness
QB/T 1135-2006 首饰 金 银覆盖层厚度的测定 X射线荧光光谱法
本标准规定了用X射线荧光光谱法测量首饰金、银覆盖层厚度的方法。 本标准适用于首饰及其他工艺品中金、银等覆盖层厚度的测定（覆盖层与基体为非相同材质
Jewellery Measurement of gold and silver coating tickness X-ray fluorescence spectrometric methods
编辑：北检院编辑部
