发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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The pH of an adhesive may be a factor whereby the adherends or the adhesive itself may be adversely affected in time by the acidity
Standard Test Method for Hydrogen Ion Concentration of Dry Adhesive Films
Concentrated kaolin. Method for determination of hydrogen ions concentration of water suspension
The pH of an adhesive may be a factor whereby the adherends or the adhesive itself may be adversely affected in time by the acidity
Standard Test Method for Hydrogen Ion Concentration of Dry Adhesive Films
1.1 This test method covers determination of the hydrogen ion concentration (pH), acidity, or alkalinity, of organic adhesives in the cured dry
Standard Test Method for Hydrogen Ion Concentration of Dry Adhesive Films
5.1 The pH of an adhesive may be a factor whereby the adherends or the adhesive itself may
Standard Test Method for Hydrogen Ion Concentration of Dry Adhesive Films
本标准规定了用二次离子质谱法(SIMS)对硅衬底单晶体材料中氮总浓度的测试方法。本标准适用于锑、砷、磷的掺杂浓度<0.2% (1×1020 at·cm-3)的单晶样品,其中氮的浓度大于等于1×1014 at ? cm<上标-3
Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry
作为血糖标志物之一的唾液葡萄糖因时效性更强,可反映血糖实时信息,受到了研究者的广泛研究。但唾液葡萄糖含量低(仅为血糖水平的1/100~1/50)、且成分复杂,早期研究借鉴血糖检测的酶方法检测唾液葡萄糖,难以满足复杂基质中微量唾液葡萄糖检测精度的需求。色谱法是利用混合物在固定相上的吸附能力/亲和力大小
Determination of glucose concentration in human saliva-Ion chromatography
本标准适用于掺杂化镓单晶中载流子浓度的测量。测量范围: n-GaAs 1.0*1017cm-3~1.0*1019cm-3 p-GaAs 2.0*1018cm-3~1.0*1020cm<上标-3
Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
Ionic Analysis of Circuit Boards Ion Chromatography Method
This test procedure is designed to measure the level of anionic (including weak organic acid anions) and cationic contamination on the surface
Ionic Analysis of Circuit Boards@ Ion Chromatography Method
Ionic Analysis of Circuit Boards@ Ion Chromatography Method
本标准规定了用二次离子质谱法(SIMS)对重掺硅衬底单晶体中氧浓度总量的测试方法。本标准适用于硼、锑、砷、磷的掺杂浓度<0.2% (1×1020 at·cm-3)的硅材料。特别适用于电阻率在0.001 2 Ω·cm~1.0Ω?cm的p型硅材料和电阻率在0.008Ω ? cm~0.2
Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry
本标准规定了离子色谱法测定发电厂水、汽样品中乙醇胺(ETA)浓度的方法。本标准适用于火力发电厂及核电站二回路水汽系统中ETA浓度的测定
Analytical method for ethanolamine in steam and water in power plant ion chromatography
Air negative (oxygen) ion concentration level
The pH of an adhesive may be a factor whereby the adherends or the adhesive itself may be adversely affected in time by the acidity
Standard Test Method for Hydrogen Ion Concentration of Dry Adhesive Films
Concentrated kaolin. Method for determination of hydrogen ions concentration of water suspension
The pH of an adhesive may be a factor whereby the adherends or the adhesive itself may be adversely affected in time by the acidity
Standard Test Method for Hydrogen Ion Concentration of Dry Adhesive Films
1.1 This test method covers determination of the hydrogen ion concentration (pH), acidity, or alkalinity, of organic adhesives in the cured dry
Standard Test Method for Hydrogen Ion Concentration of Dry Adhesive Films
5.1 The pH of an adhesive may be a factor whereby the adherends or the adhesive itself may
Standard Test Method for Hydrogen Ion Concentration of Dry Adhesive Films
本标准规定了用二次离子质谱法(SIMS)对硅衬底单晶体材料中氮总浓度的测试方法。本标准适用于锑、砷、磷的掺杂浓度<0.2% (1×1020 at·cm-3)的单晶样品,其中氮的浓度大于等于1×1014 at ? cm<上标-3
Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry
作为血糖标志物之一的唾液葡萄糖因时效性更强,可反映血糖实时信息,受到了研究者的广泛研究。但唾液葡萄糖含量低(仅为血糖水平的1/100~1/50)、且成分复杂,早期研究借鉴血糖检测的酶方法检测唾液葡萄糖,难以满足复杂基质中微量唾液葡萄糖检测精度的需求。色谱法是利用混合物在固定相上的吸附能力/亲和力大小
Determination of glucose concentration in human saliva-Ion chromatography
本标准适用于掺杂化镓单晶中载流子浓度的测量。测量范围: n-GaAs 1.0*1017cm-3~1.0*1019cm-3 p-GaAs 2.0*1018cm-3~1.0*1020cm<上标-3
Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
Ionic Analysis of Circuit Boards Ion Chromatography Method
This test procedure is designed to measure the level of anionic (including weak organic acid anions) and cationic contamination on the surface
Ionic Analysis of Circuit Boards@ Ion Chromatography Method
Ionic Analysis of Circuit Boards@ Ion Chromatography Method
本标准规定了用二次离子质谱法(SIMS)对重掺硅衬底单晶体中氧浓度总量的测试方法。本标准适用于硼、锑、砷、磷的掺杂浓度<0.2% (1×1020 at·cm-3)的硅材料。特别适用于电阻率在0.001 2 Ω·cm~1.0Ω?cm的p型硅材料和电阻率在0.008Ω ? cm~0.2
Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry
本标准规定了离子色谱法测定发电厂水、汽样品中乙醇胺(ETA)浓度的方法。本标准适用于火力发电厂及核电站二回路水汽系统中ETA浓度的测定
Analytical method for ethanolamine in steam and water in power plant ion chromatography
Air negative (oxygen) ion concentration level