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场效应晶体管增强型检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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工业诊断 动物实验 植物学检测 环境试验

DLA SMD-5962-90817 REV C-2007 硅单块 高速结,双操作器,直线电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V

MICROCIRCUIT, LINEAR, OPERATIONAL AMPLIFIER, DUAL, JFET, HIGH SPEED, MONOLITHIC SILICON

SJ 50033/89-1995 半导分立器件.CS6768和CS6770硅N沟道详细规范

Semiconductor discrete device.Detail specification for type CS 6768 and CS 6770 silicon N channel enhancement mode field effect transistor

SJ 50033/88-1995 半导分立器件.CS6760和CS6762硅N沟道详细规范

Semiconductor discrete device.Detail specification for type CS6760 and CS6762 silicon N-channel enhacement mode field-effect transistor

SJ 50033/83-1995 半导分立器件.CS139硅P沟道MOS详细规范

Semiconductor discrete device.Detail specification for type CS139 silicon P-channel MOS enhancement mode field-effect transistor

DLA SMD-5962-90807 REV D-2002 硅单块 操作器,微功率结直线电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, JFET, MICROPOWER, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-90808 REV C-2002 硅单块 操作器,双微功率结直线电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, JFET, MICROPOWER, DUAL, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-90809 REV E-2006 硅单块 操作器,四列微功率结直线电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V

MICROCIRCUIT, LINEAR, JFET, MICROPOWER, QUAD, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

GOST 17466-1980 双极.基本参数

Transistors bipolar and field-effect. Basic parameters

JEDEC JES2-1992 电,砷化镓,总规范

This specification establishes guideline requirements and quality assurance provisions for gallium arsenide power field-effect transistors (FETs

Transistor, Gallium Arsenide Power Fet, Generic Specification

KS C 5202-1980(2000 可靠性保证

RELIABILITY ASSURED FIELD-EFFECT TRANSISTORS

DLA SMD-5962-90861 REV A-1996 硅单块 单一或双或四列操作器,结低功率,直线式微电路

This drawing forms a part of a one part - one part mmber docunentation system (see 6.6 herein). Two product assurance classes consisting of military

MICROCIRCUIT, LINEAR, J-FET LOW POWER, SINGLE/DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

JUS N.R1.353-1979 半导装置的字母符号.双极

Letter symbohfor semiconductor devices. Bipolar andfield-effect transistors.

GB/T 4586-1994 半导器件 分立器件 第8部分:

通常,本标准需要与IEC 747-1-1983《半导体器件 分立器件和集成电路 第1部分:总则》一起使用。在IEC 747-1中,可找到下列的全部基础资料: --术语; --文字符号; --基本额定值和特性; --测试方法

Semiconductor devices. Discrete devices. Part 8: Field-effect transistors

DLA SMD-5962-89659-1990 缓冲器线性混合微电路

THIS DRAWING IS AVAILABLE :OR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE

MICROCIRCUIT, LINEAR, FET BUFFER, HYBRID

GJB/Z 41.4-1993 军用半导分立器件系列

Military semiconductor discrete device series spectrum field effect transistor

DLA SMD-5962-90817 REV C-2007 硅单块 高速结,双操作器,直线电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V

MICROCIRCUIT, LINEAR, OPERATIONAL AMPLIFIER, DUAL, JFET, HIGH SPEED, MONOLITHIC SILICON

SJ 50033/89-1995 半导分立器件.CS6768和CS6770硅N沟道详细规范

Semiconductor discrete device.Detail specification for type CS 6768 and CS 6770 silicon N channel enhancement mode field effect transistor

SJ 50033/88-1995 半导分立器件.CS6760和CS6762硅N沟道详细规范

Semiconductor discrete device.Detail specification for type CS6760 and CS6762 silicon N-channel enhacement mode field-effect transistor

SJ 50033/83-1995 半导分立器件.CS139硅P沟道MOS详细规范

Semiconductor discrete device.Detail specification for type CS139 silicon P-channel MOS enhancement mode field-effect transistor

DLA SMD-5962-90807 REV D-2002 硅单块 操作器,微功率结直线电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, JFET, MICROPOWER, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-90808 REV C-2002 硅单块 操作器,双微功率结直线电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class

MICROCIRCUIT, LINEAR, JFET, MICROPOWER, DUAL, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-90809 REV E-2006 硅单块 操作器,四列微功率结直线电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V

MICROCIRCUIT, LINEAR, JFET, MICROPOWER, QUAD, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

GOST 17466-1980 双极.基本参数

Transistors bipolar and field-effect. Basic parameters

JEDEC JES2-1992 电,砷化镓,总规范

This specification establishes guideline requirements and quality assurance provisions for gallium arsenide power field-effect transistors (FETs

Transistor, Gallium Arsenide Power Fet, Generic Specification

KS C 5202-1980(2000 可靠性保证

RELIABILITY ASSURED FIELD-EFFECT TRANSISTORS

DLA SMD-5962-90861 REV A-1996 硅单块 单一或双或四列操作器,结低功率,直线式微电路

This drawing forms a part of a one part - one part mmber docunentation system (see 6.6 herein). Two product assurance classes consisting of military

MICROCIRCUIT, LINEAR, J-FET LOW POWER, SINGLE/DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

JUS N.R1.353-1979 半导装置的字母符号.双极

Letter symbohfor semiconductor devices. Bipolar andfield-effect transistors.

GB/T 4586-1994 半导器件 分立器件 第8部分:

通常,本标准需要与IEC 747-1-1983《半导体器件 分立器件和集成电路 第1部分:总则》一起使用。在IEC 747-1中,可找到下列的全部基础资料: --术语; --文字符号; --基本额定值和特性; --测试方法

Semiconductor devices. Discrete devices. Part 8: Field-effect transistors

DLA SMD-5962-89659-1990 缓冲器线性混合微电路

THIS DRAWING IS AVAILABLE :OR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE

MICROCIRCUIT, LINEAR, FET BUFFER, HYBRID

GJB/Z 41.4-1993 军用半导分立器件系列

Military semiconductor discrete device series spectrum field effect transistor

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