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Semiconductor devices microelectromechanical devices Part 19: Electronic compass
Semiconductor devices. Micro-electromechanical devices. Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (Endorsed by AENOR in November of 2013.)
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 19 : compas électroniques
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013
Electronic components – Long-term storage of electronic semiconductor devices – Part 7: Micro-electromechanical devices
Electronic components. Long-term storage of electronic semiconductor devices. Micro-electromechanical devices
本标准描述了用半导体制造的微机电系统(MEMS)的总规范，规定了用于IECQ-CECC体系质量评定的一般规程，给出了电、光、机械和环境特性的描述和测试的总则。 本标准适用于各类MEMS器件[如传感器、射频MEMS，但不包括光MEMS、生物MEMS、微全分析系统(Micro-TAS)和微能源MEMS
Semiconductor devices.Micro-electromechanical devices.Generic specification for MEMS
Specification for verification of capacitor parameter testers for semiconductor discrete devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 7 : dispositifs microélectromécaniques
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices (Endorsed by Asociación Española de Normalización in April of 2021.)
Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Semiconductor devices microelectromechanical devices Part 19: Electronic compass
Semiconductor devices. Micro-electromechanical devices. Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (Endorsed by AENOR in November of 2013.)
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 19 : compas électroniques
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013
Electronic components – Long-term storage of electronic semiconductor devices – Part 7: Micro-electromechanical devices
Electronic components. Long-term storage of electronic semiconductor devices. Micro-electromechanical devices
本标准描述了用半导体制造的微机电系统(MEMS)的总规范，规定了用于IECQ-CECC体系质量评定的一般规程，给出了电、光、机械和环境特性的描述和测试的总则。 本标准适用于各类MEMS器件[如传感器、射频MEMS，但不包括光MEMS、生物MEMS、微全分析系统(Micro-TAS)和微能源MEMS
Semiconductor devices.Micro-electromechanical devices.Generic specification for MEMS
Specification for verification of capacitor parameter testers for semiconductor discrete devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 7 : dispositifs microélectromécaniques
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices (Endorsed by Asociación Española de Normalización in April of 2021.)
Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
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