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微波电路放大器检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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工业诊断 动物实验 植物学检测 环境试验

GJB 8125-2013 测试方法

本标准规定了微波电路放大器(以下简称“放大器”)电参数的测试方法。本标准适用于放大器的电参数测试

Measuring methods for microwave circuits amplifiers

SJ 20645-1997 测试方法

本标准规定了微波放大器电参数的测试方法的基本原理。 本标准适用于低噪声放大器、功率放大器、限幅放大器、可控增益放大器和脉冲放大器的电参数测试

Microwave circuits Measuring methods for amplifiers

BS EN 60747-16-1:2002+A2:2017 半导体集成

Semiconductor devices - Microwave integrated circuits. Amplifiers

BS EN 60747-16-1:2002+A1:2007 半导体件.集成.

This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit

Semiconductor devices — Part 16-1: Microwave integrated circuits — Amplifiers

BS EN 60747-16-1:2002 分立的半导体件和集成.集成.

This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit

Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers

GB/T 20870.1-2007 半导体件 第16-1部分:集成

本部分规定了微波集成电路放大器的术语、基本额定值、特性以及测试方法

Semiconductor devices Part 16-1 Microwave integrated circuits Amplifiers

IEC 60747-16-1:2001/AMD1:2007 半导体件第16-1部分:集成

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

IEC 60747-16-1:2007 半导体件.第16-1部分:集成.

This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

NF C96-016-1/A1*NF EN 60747-16-1/A1:2013 半导体件 第16-1部分:集成

Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers

IEC 60747-16-1:2001+AMD1:2007 CSV 半导体件第16-1部分:集成

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV 半导体件第16-1部分:集成

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

DS/EN 60747-16-1/A1:2007 半导体件 第 16-1 部分:集成

Provides the terminology, the essential ratings and characteristics, as well as the measuring methods, for integrated circuit microwave power

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

DS/EN 60747-16-1:2002 半导体件 第 16-1 部分:集成

This part of IEC 60747 provides the terminology, the ratings and characteristics, as well as the measuring methods for integrated circuit microwave

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

NF C96-016-1/A2*NF EN 60747-16-1/A2:2017 半导体件 第 16-1 部分:集成

Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers

DIN EN 60747-16-1:2007 半导体件.第16-1部分:集成.

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007

GJB 8125-2013 测试方法

本标准规定了微波电路放大器(以下简称“放大器”)电参数的测试方法。本标准适用于放大器的电参数测试

Measuring methods for microwave circuits amplifiers

SJ 20645-1997 测试方法

本标准规定了微波放大器电参数的测试方法的基本原理。 本标准适用于低噪声放大器、功率放大器、限幅放大器、可控增益放大器和脉冲放大器的电参数测试

Microwave circuits Measuring methods for amplifiers

BS EN 60747-16-1:2002+A2:2017 半导体集成

Semiconductor devices - Microwave integrated circuits. Amplifiers

BS EN 60747-16-1:2002+A1:2007 半导体件.集成.

This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit

Semiconductor devices — Part 16-1: Microwave integrated circuits — Amplifiers

BS EN 60747-16-1:2002 分立的半导体件和集成.集成.

This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit

Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers

GB/T 20870.1-2007 半导体件 第16-1部分:集成

本部分规定了微波集成电路放大器的术语、基本额定值、特性以及测试方法

Semiconductor devices Part 16-1 Microwave integrated circuits Amplifiers

IEC 60747-16-1:2001/AMD1:2007 半导体件第16-1部分:集成

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

IEC 60747-16-1:2007 半导体件.第16-1部分:集成.

This part of IEC 60747 provides the terminology, the essential ratings and characteristics, as well as the measuring methods for integrated circuit

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

NF C96-016-1/A1*NF EN 60747-16-1/A1:2013 半导体件 第16-1部分:集成

Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers

IEC 60747-16-1:2001+AMD1:2007 CSV 半导体件第16-1部分:集成

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV 半导体件第16-1部分:集成

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

DS/EN 60747-16-1/A1:2007 半导体件 第 16-1 部分:集成

Provides the terminology, the essential ratings and characteristics, as well as the measuring methods, for integrated circuit microwave power

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

DS/EN 60747-16-1:2002 半导体件 第 16-1 部分:集成

This part of IEC 60747 provides the terminology, the ratings and characteristics, as well as the measuring methods for integrated circuit microwave

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

NF C96-016-1/A2*NF EN 60747-16-1/A2:2017 半导体件 第 16-1 部分:集成

Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers

DIN EN 60747-16-1:2007 半导体件.第16-1部分:集成.

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007

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