发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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本规范规定了半导体集成电路电压比较器电特性测试方法的基本原理。 本规范适用于半导体集成电路电压比较器电特性的测试
Semiconductor integrated circuits.General principles of measuring methods for voltage comparators
本标准规定了半导体集成电路电压比较器(以下简称器件)电特性测试方法的基本原理。 本标准适用于半导体集成电路电压比较器电特性的测试
Semiconductor integrated circuits. General principles of measuring methods of voltage comparators
Semiconductor integrated circuits.Detail specification for type JJ710 Voltage comparator
Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
本规范规定了半导体集成电路CJ 710型电压比较器质量评定的全部内容。 本标准符合GB 4589.1《半导体器件分立器件和集成电路总规范》和GB/T 12750《半导体集成电路分规范(不包括混台电路)》的要求
Detail specification for electronic components.Semiconductor integrated circuit Voltage comparator type CJ 710
Semiconductor integrated circuits.Detail specification for type JC4585 of CMOS 4-Bit magnitude comparator
Detail specification for type JT54LS85 LS-TTL 4bit magnitude comparator of semiconductor integrated circuit
Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
Testing methods for semi-conductor integrated comparison amplifiers
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
Semiconductor devices. Integrated circuits. Digital integrated circuits
本标准规了下列集成电路(IC)分类体系树(见图1)中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
本规范规定了半导体集成电路电压比较器电特性测试方法的基本原理。 本规范适用于半导体集成电路电压比较器电特性的测试
Semiconductor integrated circuits.General principles of measuring methods for voltage comparators
本标准规定了半导体集成电路电压比较器(以下简称器件)电特性测试方法的基本原理。 本标准适用于半导体集成电路电压比较器电特性的测试
Semiconductor integrated circuits. General principles of measuring methods of voltage comparators
Semiconductor integrated circuits.Detail specification for type JJ710 Voltage comparator
Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
本规范规定了半导体集成电路CJ 710型电压比较器质量评定的全部内容。 本标准符合GB 4589.1《半导体器件分立器件和集成电路总规范》和GB/T 12750《半导体集成电路分规范(不包括混台电路)》的要求
Detail specification for electronic components.Semiconductor integrated circuit Voltage comparator type CJ 710
Semiconductor integrated circuits.Detail specification for type JC4585 of CMOS 4-Bit magnitude comparator
Detail specification for type JT54LS85 LS-TTL 4bit magnitude comparator of semiconductor integrated circuit
Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
Testing methods for semi-conductor integrated comparison amplifiers
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
Semiconductor devices. Integrated circuits. Digital integrated circuits
本标准规了下列集成电路(IC)分类体系树(见图1)中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits