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半导体集成电路电压比较器检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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军工检测 其他检测

SJ/T 10805-2018 测试方法

GJB 597/3-1990 详细规范

SJ/T 10805-2000 .测试方法的基本原理

本规范规定了半导体集成电路电压比较器电特性测试方法的基本原理。 本规范适用于半导体集成电路电压比较器电特性的测试

Semiconductor integrated circuits.General principles of measuring methods for voltage comparators

GB/T 6798-1996 测试方法的基本原理

本标准规定了半导体集成电路电压比较器(以下简称器件)电特性测试方法的基本原理。 本标准适用于半导体集成电路电压比较器电特性的测试

Semiconductor integrated circuits. General principles of measuring methods of voltage comparators

SJ 50597/23-1994 .JJ710型详细规范

Semiconductor integrated circuits.Detail specification for type JJ710 Voltage comparator

SJ/T 10805-1996 接口测试方法的基本原理

Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators

SJ/T 10076-1991 子元件详细规范.CJ 710型

本规范规定了半导体集成电路CJ 710型电压比较器质量评定的全部内容。 本标准符合GB 4589.1《半导体器件分立器件和集成电路总规范》和GB/T 12750《半导体集成电路分规范(不包括混台电路)》的要求

Detail specification for electronic components.Semiconductor integrated circuit Voltage comparator type CJ 710

SJ 50597/29-1994 .JC4585型CMOS4位数值详细规范

Semiconductor integrated circuits.Detail specification for type JC4585 of CMOS 4-Bit magnitude comparator

SJ 50597.1-1994 JT54LS85型LS-TTL四位数值详细规范

Detail specification for type JT54LS85 LS-TTL 4bit magnitude comparator of semiconductor integrated circuit

BS IEC 60748-2-20:2008 件..数字.类规范.低

Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits

QJ/Z 32-1977 放大测试方法

Testing methods for semi-conductor integrated comparison amplifiers

BS IEC 60748-4:1997 件..接口

Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS

Semiconductor devices. Integrated circuits. Interface integrated circuits

BS IEC 60748-2:1997 件..数字

This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits

Semiconductor devices - Integrated circuits - Digital integrated circuits

BS IEC 60748-2:1998 数字

Semiconductor devices. Integrated circuits. Digital integrated circuits

GB/T 20515-2006 第5部分:定制

本标准规了下列集成电路(IC)分类体系树(见图1)中有关半定制集成电路子类的标准

Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits

SJ/T 10805-2018 测试方法

GJB 597/3-1990 详细规范

SJ/T 10805-2000 .测试方法的基本原理

本规范规定了半导体集成电路电压比较器电特性测试方法的基本原理。 本规范适用于半导体集成电路电压比较器电特性的测试

Semiconductor integrated circuits.General principles of measuring methods for voltage comparators

GB/T 6798-1996 测试方法的基本原理

本标准规定了半导体集成电路电压比较器(以下简称器件)电特性测试方法的基本原理。 本标准适用于半导体集成电路电压比较器电特性的测试

Semiconductor integrated circuits. General principles of measuring methods of voltage comparators

SJ 50597/23-1994 .JJ710型详细规范

Semiconductor integrated circuits.Detail specification for type JJ710 Voltage comparator

SJ/T 10805-1996 接口测试方法的基本原理

Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators

SJ/T 10076-1991 子元件详细规范.CJ 710型

本规范规定了半导体集成电路CJ 710型电压比较器质量评定的全部内容。 本标准符合GB 4589.1《半导体器件分立器件和集成电路总规范》和GB/T 12750《半导体集成电路分规范(不包括混台电路)》的要求

Detail specification for electronic components.Semiconductor integrated circuit Voltage comparator type CJ 710

SJ 50597/29-1994 .JC4585型CMOS4位数值详细规范

Semiconductor integrated circuits.Detail specification for type JC4585 of CMOS 4-Bit magnitude comparator

SJ 50597.1-1994 JT54LS85型LS-TTL四位数值详细规范

Detail specification for type JT54LS85 LS-TTL 4bit magnitude comparator of semiconductor integrated circuit

BS IEC 60748-2-20:2008 件..数字.类规范.低

Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits

QJ/Z 32-1977 放大测试方法

Testing methods for semi-conductor integrated comparison amplifiers

BS IEC 60748-4:1997 件..接口

Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS

Semiconductor devices. Integrated circuits. Interface integrated circuits

BS IEC 60748-2:1997 件..数字

This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits

Semiconductor devices - Integrated circuits - Digital integrated circuits

BS IEC 60748-2:1998 数字

Semiconductor devices. Integrated circuits. Digital integrated circuits

GB/T 20515-2006 第5部分:定制

本标准规了下列集成电路(IC)分类体系树(见图1)中有关半定制集成电路子类的标准

Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits

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