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General principle of measuring methods of microprocessors and peripheral interface circuits' parameters for semiconductor integrated circuits
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for peripheral drivers
本标准规定了半导体集成电路Cμ402型NMOS 4位微处理器质量评定的全部内容。 本标准是参照GB 7509《半导体集成电路微处理器空白详细规范》制订的，并符合GB 4589.1《半导体器件分立器件和集成电路总规范》和GB/T 12750《半导体集成电路分规范(不包括混合电路)》的要求
Detail specification for electronic components semiconductor integrated circuit Cμ402 4-bit microprocesor
本规范规定了半导体集成电路Jμ8086型微处理器的详细要求。 本规范适用于器件的研制、生产和采购
Detail specification of Ju8086 microprocessor for semiconductor integrated circuits
Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
This part of IEC 60748 gives requirements for the following categories or subcategories of interface integrated circuits. Category Ⅰ: - subcategory
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated
Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
General principle of measuring methods of microprocessors and peripheral interface circuits' parameters for semiconductor integrated circuits
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for peripheral drivers
本标准规定了半导体集成电路Cμ402型NMOS 4位微处理器质量评定的全部内容。 本标准是参照GB 7509《半导体集成电路微处理器空白详细规范》制订的，并符合GB 4589.1《半导体器件分立器件和集成电路总规范》和GB/T 12750《半导体集成电路分规范(不包括混合电路)》的要求
Detail specification for electronic components semiconductor integrated circuit Cμ402 4-bit microprocesor
本规范规定了半导体集成电路Jμ8086型微处理器的详细要求。 本规范适用于器件的研制、生产和采购
Detail specification of Ju8086 microprocessor for semiconductor integrated circuits
Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
This part of IEC 60748 gives requirements for the following categories or subcategories of interface integrated circuits. Category Ⅰ: - subcategory
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated
Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
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