GB/T 36477-2018 半导体集成电路 快闪存储器测试方法
本标准规定了半导体集成电路快闪存储器电参数、时间参数和存储单元功能测试的基本方法。 本标准适用于半导体集成电路领域中快闪存储器电参数、时间参数和存储单元功能的测试
Semiconductor integrated circuit.Measuring methods for flash memory
SJ/T 10739-1996 半导体集成电路 MOS随机存储器测试方法的基本原理
Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
GB/T 6648-1986 半导体集成电路静态读/写存储器空白详细规范(可供认证用)
本规范规定了编制半导体集成电路静态读/写存储器（以下简称器件）详细规范的基本原则
Blank detail specification for semiconductor integrated circuit static read/write memories
GB 6648-1986 半导体集成电路静态读/ 写存储器空白详细规范(可供认证用)
SJ/T 10801-1996 半导体集成接口电路磁芯存储器驱动器测试方法的基本原理
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for magnetic memory drivers
SJ/T 10740-1996 半导体集成电路 双极型随机存储器测试方法的基本原理
Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories
GJB/Z 42.3-1993 军用微电路系列型谱 半导体集成电路 微型计算机与存储器集成电路
GB/T 14119-1993 半导体集成电路双极熔丝式可编程只读存储器空白详细规范
本规范规定了编制半导体集成电路双极熔丝式可编程只读存储器（以下简称器件）详细规范的基本原则
Blank detail specification for semiconductor integrated circuit fusible-link programmable bipolar readonly memories
GB/T 17574.10-2003 半导体器件 集成电路 第2-10部分;数字集成电路集成电路动态读/写存储器空白详细规范
IEC电子元器件质量评定体系遵循IEC的章程，并在IEC的授权下进行工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本空白详细规范是半导体器件的一系列空白详细规范之一，并且与下列标准一起使用
Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
KS C IEC 60748-2-8:2002 半导体器件.集成电路.第2部分:数字集成电路.第8节:集成电路静态读、写存储器
서 문 이 규격은 1993년 초판으로 발행된 IEC 60748-2-8(1993-07
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
BS IEC 60748-2-11:1999 半导体器件.集成电路.数字集成线路.单电集成电路可擦、可编程、只读存储器集成电路空白详细规范
Semiconductor devices —Integrated circuits — Part 2-11: Digital integrated circuits —Blank detail specification for single supply integrated circuit
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
KS C IEC 60748-2-11:2002 半导体器件.集成电路.第2-11部分:数字集成线路.可擦可编程只读存储器
서 문 이 규격은 1999년에 초판으로 발행된 IEC 60748-2-11(1999
Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
GB/T 17574.11-2006 半导体器件 集成电路 第2-11部分:数字集成电路 单电源集成电路电可擦可编程只读存储器 空白详细规范
本部分半导体器件集成电路第2-11部分：数字集成电路 单电源集成电路电可擦可编程只读存储器 空白详细规范，适用于：标志和订货资料、应用说明、功能说明、极限值、工作条件、电特性、编程等
Semiconductor devices Integrated circuits Part 2-11: Digital integrated circuits Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory
IS 12970 Pt.2/Sec.2-1992 半导体器件——集成电路 第2部分数字集成电路——基本额定值和特性 第2部分集成电路存储器
This standard covers the essential ratings and characteristics of digital integrated circuit memories
IEC 60748-2-10:1994 半导体器件 集成电路 第2部分:数字集成电路 第10节:集成电路动态读/写存储器空白详细规范
Defines, in compliance with the IEC Quality Assessment System for Electronic Components, information to be given for: mechanical description, short
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
GB/T 36477-2018 半导体集成电路 快闪存储器测试方法
本标准规定了半导体集成电路快闪存储器电参数、时间参数和存储单元功能测试的基本方法。 本标准适用于半导体集成电路领域中快闪存储器电参数、时间参数和存储单元功能的测试
Semiconductor integrated circuit.Measuring methods for flash memory
SJ/T 10739-1996 半导体集成电路 MOS随机存储器测试方法的基本原理
Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
GB/T 6648-1986 半导体集成电路静态读/写存储器空白详细规范(可供认证用)
本规范规定了编制半导体集成电路静态读/写存储器（以下简称器件）详细规范的基本原则
Blank detail specification for semiconductor integrated circuit static read/write memories
GB 6648-1986 半导体集成电路静态读/ 写存储器空白详细规范(可供认证用)
SJ/T 10801-1996 半导体集成接口电路磁芯存储器驱动器测试方法的基本原理
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for magnetic memory drivers
SJ/T 10740-1996 半导体集成电路 双极型随机存储器测试方法的基本原理
Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories
GJB/Z 42.3-1993 军用微电路系列型谱 半导体集成电路 微型计算机与存储器集成电路
GB/T 14119-1993 半导体集成电路双极熔丝式可编程只读存储器空白详细规范
本规范规定了编制半导体集成电路双极熔丝式可编程只读存储器（以下简称器件）详细规范的基本原则
Blank detail specification for semiconductor integrated circuit fusible-link programmable bipolar readonly memories
GB/T 17574.10-2003 半导体器件 集成电路 第2-10部分;数字集成电路集成电路动态读/写存储器空白详细规范
IEC电子元器件质量评定体系遵循IEC的章程，并在IEC的授权下进行工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本空白详细规范是半导体器件的一系列空白详细规范之一，并且与下列标准一起使用
Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
KS C IEC 60748-2-8:2002 半导体器件.集成电路.第2部分:数字集成电路.第8节:集成电路静态读、写存储器
서 문 이 규격은 1993년 초판으로 발행된 IEC 60748-2-8(1993-07
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
BS IEC 60748-2-11:1999 半导体器件.集成电路.数字集成线路.单电集成电路可擦、可编程、只读存储器集成电路空白详细规范
Semiconductor devices —Integrated circuits — Part 2-11: Digital integrated circuits —Blank detail specification for single supply integrated circuit
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
KS C IEC 60748-2-11:2002 半导体器件.集成电路.第2-11部分:数字集成线路.可擦可编程只读存储器
서 문 이 규격은 1999년에 초판으로 발행된 IEC 60748-2-11(1999
Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
GB/T 17574.11-2006 半导体器件 集成电路 第2-11部分:数字集成电路 单电源集成电路电可擦可编程只读存储器 空白详细规范
本部分半导体器件集成电路第2-11部分：数字集成电路 单电源集成电路电可擦可编程只读存储器 空白详细规范，适用于：标志和订货资料、应用说明、功能说明、极限值、工作条件、电特性、编程等
Semiconductor devices Integrated circuits Part 2-11: Digital integrated circuits Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory
IS 12970 Pt.2/Sec.2-1992 半导体器件——集成电路 第2部分数字集成电路——基本额定值和特性 第2部分集成电路存储器
This standard covers the essential ratings and characteristics of digital integrated circuit memories
IEC 60748-2-10:1994 半导体器件 集成电路 第2部分:数字集成电路 第10节:集成电路动态读/写存储器空白详细规范
Defines, in compliance with the IEC Quality Assessment System for Electronic Components, information to be given for: mechanical description, short
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
编辑：北检院编辑部
