服务热线:400-635-0567

半导体集成电路TTL电路、CMOS电路检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

点击量:0

军工检测 其他检测

SJ 50597/28-1994 .JC4504型CMOSTTL/CMOS-CMOS平转换器详细规范

Semiconductor integrated circuits.Detail specification for type JC4504 of CMOS Hex TTL/CMOS to CMOS converters

SJ/T 10741-2000 CMOS测试方法的基本原理

本标准规定了半导体集成电路CMOS电路电特性测试方法的基本原理。 本标准适用于半导体集成电路CMOS电路电特性的测试

Semiconductor integrated circuits General principles of measuring methods for CMOS circuits

SJ 20758-1999 CMOS门阵列器件规范

本规范规定了半导体集成电路CMOS型门阵列器件的详细要求。 本规范适用于器件的研制、生产和采购

Semiconductor integrated circuits Specification for COMS gate array devices

SJ 50597/34-1995 .JC4085、JC4086、JC4070、JC4077型CMOS详细规范

Semiconductor integrated circuits.Detail specification for type JC4085,JC4086,JC4070,JC4077 CMOS gates

QJ 257-1977 TTL数字测试方法

Semiconductor TTL Integrated Digital Circuit Testing Method

SJ/T 10735-1996 TTL测试方法的基本原理

Semiconductor integrated circuits General principles of measuring methods for TTL circuits

GB/T 14129-1993 TTL系列和品种PAL系列的品种

本标准规定了半导体集成电路TTL电路PAL系列的品种(以下简称器件)的名称、引出端排列、功能框图、逻辑图和主要特性(包括输入、输出特性和主要电参数)。 器件的质量评定应符合器件有关详细规范的规定。 生产(研制)或选用器件时,应符合本标准的规定。 若特殊说明,本标准涉及的

Series and products for TTL semiconductor integrated circuits-Products of series PAL

BS IEC 60748-11:2000 器件..(混合除外)的分规范

Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated

Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits

BS IEC 60748-11:1991 器件 (混合除外)的分规范

Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits

PN T01305-1992 器件..除混合外的分规范

Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

BS IEC 60748-4:1997 器件..接口

Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS

Semiconductor devices. Integrated circuits. Interface integrated circuits

BS IEC 60748-2:1997 器件..数字

This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits

Semiconductor devices - Integrated circuits - Digital integrated circuits

BS IEC 60748-2:1998 器件 数字

Semiconductor devices. Integrated circuits. Digital integrated circuits

GB/T 20515-2006 器件 第5部分:定制

本标准规了下列集成电路(IC)分类体系树(见图1)中有关半定制集成电路子类的标准

Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits

GJB 597/10-1994 CMOS反相器详细规范

Detailed specifications for CMOS inverters in semiconductor integrated circuits

SJ 50597/28-1994 .JC4504型CMOSTTL/CMOS-CMOS平转换器详细规范

Semiconductor integrated circuits.Detail specification for type JC4504 of CMOS Hex TTL/CMOS to CMOS converters

SJ/T 10741-2000 CMOS测试方法的基本原理

本标准规定了半导体集成电路CMOS电路电特性测试方法的基本原理。 本标准适用于半导体集成电路CMOS电路电特性的测试

Semiconductor integrated circuits General principles of measuring methods for CMOS circuits

SJ 20758-1999 CMOS门阵列器件规范

本规范规定了半导体集成电路CMOS型门阵列器件的详细要求。 本规范适用于器件的研制、生产和采购

Semiconductor integrated circuits Specification for COMS gate array devices

SJ 50597/34-1995 .JC4085、JC4086、JC4070、JC4077型CMOS详细规范

Semiconductor integrated circuits.Detail specification for type JC4085,JC4086,JC4070,JC4077 CMOS gates

QJ 257-1977 TTL数字测试方法

Semiconductor TTL Integrated Digital Circuit Testing Method

SJ/T 10735-1996 TTL测试方法的基本原理

Semiconductor integrated circuits General principles of measuring methods for TTL circuits

GB/T 14129-1993 TTL系列和品种PAL系列的品种

本标准规定了半导体集成电路TTL电路PAL系列的品种(以下简称器件)的名称、引出端排列、功能框图、逻辑图和主要特性(包括输入、输出特性和主要电参数)。 器件的质量评定应符合器件有关详细规范的规定。 生产(研制)或选用器件时,应符合本标准的规定。 若特殊说明,本标准涉及的

Series and products for TTL semiconductor integrated circuits-Products of series PAL

BS IEC 60748-11:2000 器件..(混合除外)的分规范

Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated

Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits

BS IEC 60748-11:1991 器件 (混合除外)的分规范

Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits

PN T01305-1992 器件..除混合外的分规范

Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits

BS IEC 60748-4:1997 器件..接口

Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS

Semiconductor devices. Integrated circuits. Interface integrated circuits

BS IEC 60748-2:1997 器件..数字

This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits

Semiconductor devices - Integrated circuits - Digital integrated circuits

BS IEC 60748-2:1998 器件 数字

Semiconductor devices. Integrated circuits. Digital integrated circuits

GB/T 20515-2006 器件 第5部分:定制

本标准规了下列集成电路(IC)分类体系树(见图1)中有关半定制集成电路子类的标准

Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits

GJB 597/9-1990 CMOS开关(JC4066)详细规范

Semiconductor integrated circuit CMOS switch (JC4066) detailed specification

下一篇: 硅炭检测
检测流程
填写并提交定制服务需求表
技术评估和方案讨论
对选定的试验方法进行报价
合同签定与付款
按期交付检测报告和相关数据
想了解更多检测项目
请点击咨询在线工程师
点击咨询
联系我们
服务热线:400-635-0567
地址:北京市丰台区航丰路8号院1号楼1层121
邮编:10000
总机:400-635-0567
联系我们

服务热线:400-635-0567

投诉建议:010-82491398

报告问题解答:010-8646-0567-8

周期、价格等

咨询

技术咨询