GB/T 31563-2015 金属覆盖层 厚度测量 扫描电镜法
本标准规定了通过扫描电子显微镜(SEM)检测金属试样横截面局部厚度的方式测量金属涂层厚度的方法。它通常是一种破坏性的检测方式，不确定度小于10%，或者0.1 μm。该测量方法也可以用来测量几个毫米厚的涂层，但是对于这类厚涂层建议采用光学显微镜法(GB/T 6462)进行测量
Metallic coatings.Measurement of coating thickness.Scanning electron microscope method
KS D ISO 9220:2009 金属覆盖层.镀层厚度测量.扫描电子显微镜法
이 표준은 주사 전자현미경(SEM)으로 금속 피막 단면을 관찰하여 피막층의 국부 두께를 측
Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
EN ISO 9220:2022 金属覆盖层.镀层厚度测量.扫描电子显微镜法
This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
ISO 9220:1988 金属覆盖层 镀层厚度测量 扫描电子显微镜法
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron
Metallic coatings; measurement of coating thickness; scanning electron microscope method
EN ISO 9220:1994 金属覆盖层.镀层厚度测量.扫描电子显微镜法(ISO 9220-1988)
Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
JB/T 7503-1994 金属覆盖层横截面厚度.扫描电镜测量方法
本标准规定了金属覆盖层横截面厚度扫描电镜测量方法的技术要求。 本标准适用于测量横截面中微米级到毫米级的金属覆盖层厚度
Thickness of cross section of metal coatings Scanning electron microscope measuring method
GB/T 17722-1999 金属盖层厚度的扫描电镜测量方法
本标准规定了各类金制品的金覆盖层厚度的扫描电镜测量方法的技术要求，本标准也适用于电子探针仪测量金覆盖层厚度，适用的厚度测量范围为0.2～10μm。 其他金属材料的覆盖层厚度的测量也可参照执行
Gold-plated thickness measurement by SEM
GB/T 38783-2020 贵金属复合材料覆层厚度的扫描电镜测定方法
本标准规定了各类贵金属复合材料覆层厚度的扫描电镜测量方法。 本标准适用于 10nm～200μm 的覆层厚度测量
Method of coating thickness determination for precious metal composites by scanning electron microscope
BS EN ISO 9220:1989 金属镀层.镀层厚度测量.扫描电子显微镜法
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/EN ISO 1463:1994 金属和氧化覆盖层．覆盖层厚度测量．显微镜法
Denne standard specificerer en metode til m?ling af lokal lag-tykkelse af metalbel?gninger, oxidlag og porcel?n- eller emaljebel?gninger ved unders
Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
SIS SS-ISO 9220:1989 金属涂层．涂层厚度测量．扫描电子显微镜方法
This International Standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections
Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
NF A91-108:1995 金属镀层.镀层厚度的测量.扫描电子显微镜法
Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
DS/EN ISO 9220:1995 金属镀层 镀层厚度的测量 扫描电子显微镜法
This standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108*NF EN ISO 9220:2022 金属镀层 镀层厚度的测量 扫描电子显微镜法
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
KS D ISO 9220-2009(2022 金属镀层镀层厚度的测量扫描电子显微镜法
Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
GB/T 31563-2015 金属覆盖层 厚度测量 扫描电镜法
本标准规定了通过扫描电子显微镜(SEM)检测金属试样横截面局部厚度的方式测量金属涂层厚度的方法。它通常是一种破坏性的检测方式，不确定度小于10%，或者0.1 μm。该测量方法也可以用来测量几个毫米厚的涂层，但是对于这类厚涂层建议采用光学显微镜法(GB/T 6462)进行测量
Metallic coatings.Measurement of coating thickness.Scanning electron microscope method
KS D ISO 9220:2009 金属覆盖层.镀层厚度测量.扫描电子显微镜法
이 표준은 주사 전자현미경(SEM)으로 금속 피막 단면을 관찰하여 피막층의 국부 두께를 측
Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
EN ISO 9220:2022 金属覆盖层.镀层厚度测量.扫描电子显微镜法
This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
ISO 9220:1988 金属覆盖层 镀层厚度测量 扫描电子显微镜法
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron
Metallic coatings; measurement of coating thickness; scanning electron microscope method
EN ISO 9220:1994 金属覆盖层.镀层厚度测量.扫描电子显微镜法(ISO 9220-1988)
Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
JB/T 7503-1994 金属覆盖层横截面厚度.扫描电镜测量方法
本标准规定了金属覆盖层横截面厚度扫描电镜测量方法的技术要求。 本标准适用于测量横截面中微米级到毫米级的金属覆盖层厚度
Thickness of cross section of metal coatings Scanning electron microscope measuring method
GB/T 17722-1999 金属盖层厚度的扫描电镜测量方法
本标准规定了各类金制品的金覆盖层厚度的扫描电镜测量方法的技术要求，本标准也适用于电子探针仪测量金覆盖层厚度，适用的厚度测量范围为0.2～10μm。 其他金属材料的覆盖层厚度的测量也可参照执行
Gold-plated thickness measurement by SEM
GB/T 38783-2020 贵金属复合材料覆层厚度的扫描电镜测定方法
本标准规定了各类贵金属复合材料覆层厚度的扫描电镜测量方法。 本标准适用于 10nm～200μm 的覆层厚度测量
Method of coating thickness determination for precious metal composites by scanning electron microscope
BS EN ISO 9220:1989 金属镀层.镀层厚度测量.扫描电子显微镜法
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/EN ISO 1463:1994 金属和氧化覆盖层．覆盖层厚度测量．显微镜法
Denne standard specificerer en metode til m?ling af lokal lag-tykkelse af metalbel?gninger, oxidlag og porcel?n- eller emaljebel?gninger ved unders
Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
SIS SS-ISO 9220:1989 金属涂层．涂层厚度测量．扫描电子显微镜方法
This International Standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections
Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
NF A91-108:1995 金属镀层.镀层厚度的测量.扫描电子显微镜法
Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
DS/EN ISO 9220:1995 金属镀层 镀层厚度的测量 扫描电子显微镜法
This standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108*NF EN ISO 9220:2022 金属镀层 镀层厚度的测量 扫描电子显微镜法
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
KS D ISO 9220-2009(2022 金属镀层镀层厚度的测量扫描电子显微镜法
Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
编辑：北检院编辑部
