SJ/T 2214-2015 半导体光电二极管和光电晶体管测试方法
本标准规定了半导体光电二极管和光电晶体管(以下简称“器件”)光电参数的测试方法。本标准适用于半导体光电二极管和光电晶体管光电参数的测试。本标准不适用PIN、雪崩光电二极管的测试
Measuring methods for semiconductor photodiode and phototransistor
BS IEC 60747-4:2008 半导体装置.分立装置.微波二极管和晶体管
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Microwave diodes and transistors
BS IEC 60747-4:2007+A1:2017 半导体器件 分立器件 微波二极管和晶体管
1 Scope This part of IEC 60747 gives requirements for the following categories of discrete devices
Semiconductor devices. Discrete devices - Microwave diodes and transistors
CNS 13809-1997 发光二极管晶粒
本标准规定发光二极管晶粒的共同要求事项、检验方法及个别格格式
Light Emitting Diode Dice
KS C IEC 60747-4-1:2002 半导体器件.分立器件.第4-1部分:微波二极管和晶体管.微波领域有效晶体管.空白详细规范
마이크로파 다이오드와 트랜지스터 중에서 마이크로파 전계 효과 트랜지스터에 관한 표준을
Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification
STAS SR CEI 747-4-1995 半导体装置．分离装置．第4部分：微波二极管和晶体管
Semiconductor devices Discrete devices Part 4: Microwave diodes and transistors
IEC 60747-4:1991 半导体器件 分立器件 第4部分:微波二极管和晶体管
Gives standards for the following discrete devices: - variable capacitance diodes and snap-off diodes; - mixer diodes and detector diodes; - avalanche
Semiconductor devices; discrete devices; part 4: microwave diodes and transistors
IEC 60747-4:2007 半导体装置.分立装置.第4部分:微波二极管和晶体管
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
KS C IEC 60747-4:2006 半导体器件.分立器件.第4部分:微波二极管和晶体管
이 규격은 다음과 같은 반도체 개별 소자에 관한 표준을 규정한다.-가변 커패시턴스 다이
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
IEC 60747-4:2007+AMD1:2017 CSV 半导体器件分立器件第4部分:微波二极管和晶体管
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
KS C IEC 60747-4:2017 半导体器件分立器件第4部分:微波二极管和晶体管
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
KS C IEC 60747-4:2022 半导体器件.分立器件.第4部分:微波二极管和晶体管
Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
KS C IEC 60747-4-2017 半导体器件分立器件第4部分:微波二极管和晶体管
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
KS C IEC 60747-4-2022 半导体器件.分立器件.第4部分:微波二极管和晶体管
Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
BS IEC 60747-4:2007+A1:2017(2020 半导体器件 — 分立器件 第4部分：微波二极管和晶体管
Semiconductor devices — Discrete devices Part 4 : Microwave diodes and transistors
SJ/T 2214-2015 半导体光电二极管和光电晶体管测试方法
本标准规定了半导体光电二极管和光电晶体管(以下简称“器件”)光电参数的测试方法。本标准适用于半导体光电二极管和光电晶体管光电参数的测试。本标准不适用PIN、雪崩光电二极管的测试
Measuring methods for semiconductor photodiode and phototransistor
BS IEC 60747-4:2008 半导体装置.分立装置.微波二极管和晶体管
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Microwave diodes and transistors
BS IEC 60747-4:2007+A1:2017 半导体器件 分立器件 微波二极管和晶体管
1 Scope This part of IEC 60747 gives requirements for the following categories of discrete devices
Semiconductor devices. Discrete devices - Microwave diodes and transistors
CNS 13809-1997 发光二极管晶粒
本标准规定发光二极管晶粒的共同要求事项、检验方法及个别格格式
Light Emitting Diode Dice
KS C IEC 60747-4-1:2002 半导体器件.分立器件.第4-1部分:微波二极管和晶体管.微波领域有效晶体管.空白详细规范
마이크로파 다이오드와 트랜지스터 중에서 마이크로파 전계 효과 트랜지스터에 관한 표준을
Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification
STAS SR CEI 747-4-1995 半导体装置．分离装置．第4部分：微波二极管和晶体管
Semiconductor devices Discrete devices Part 4: Microwave diodes and transistors
IEC 60747-4:1991 半导体器件 分立器件 第4部分:微波二极管和晶体管
Gives standards for the following discrete devices: - variable capacitance diodes and snap-off diodes; - mixer diodes and detector diodes; - avalanche
Semiconductor devices; discrete devices; part 4: microwave diodes and transistors
IEC 60747-4:2007 半导体装置.分立装置.第4部分:微波二极管和晶体管
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
KS C IEC 60747-4:2006 半导体器件.分立器件.第4部分:微波二极管和晶体管
이 규격은 다음과 같은 반도체 개별 소자에 관한 표준을 규정한다.-가변 커패시턴스 다이
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
IEC 60747-4:2007+AMD1:2017 CSV 半导体器件分立器件第4部分:微波二极管和晶体管
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
KS C IEC 60747-4:2017 半导体器件分立器件第4部分:微波二极管和晶体管
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
KS C IEC 60747-4:2022 半导体器件.分立器件.第4部分:微波二极管和晶体管
Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
KS C IEC 60747-4-2017 半导体器件分立器件第4部分:微波二极管和晶体管
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
KS C IEC 60747-4-2022 半导体器件.分立器件.第4部分:微波二极管和晶体管
Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
BS IEC 60747-4:2007+A1:2017(2020 半导体器件 — 分立器件 第4部分：微波二极管和晶体管
Semiconductor devices — Discrete devices Part 4 : Microwave diodes and transistors
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