发布时间：2024-05-27 17:49:26 - 更新时间：2024年06月29日 15:22
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本标准规定了半导体光电二极管和光电晶体管(以下简称“器件”)光电参数的测试方法。本标准适用于半导体光电二极管和光电晶体管光电参数的测试。本标准不适用PIN、雪崩光电二极管的测试
Measuring methods for semiconductor photodiode and phototransistor
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Microwave diodes and transistors
1 Scope This part of IEC 60747 gives requirements for the following categories of discrete devices
Semiconductor devices. Discrete devices - Microwave diodes and transistors
本标准规定发光二极管晶粒的共同要求事项、检验方法及个别格格式
Light Emitting Diode Dice
마이크로파 다이오드와 트랜지스터 중에서 마이크로파 전계 효과 트랜지스터에 관한 표준을
Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification
Semiconductor devices Discrete devices Part 4: Microwave diodes and transistors
Gives standards for the following discrete devices: - variable capacitance diodes and snap-off diodes; - mixer diodes and detector diodes; - avalanche
Semiconductor devices; discrete devices; part 4: microwave diodes and transistors
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
이 규격은 다음과 같은 반도체 개별 소자에 관한 표준을 규정한다.-가변 커패시턴스 다이
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
Semiconductor devices — Discrete devices Part 4 : Microwave diodes and transistors
本标准规定了半导体光电二极管和光电晶体管(以下简称“器件”)光电参数的测试方法。本标准适用于半导体光电二极管和光电晶体管光电参数的测试。本标准不适用PIN、雪崩光电二极管的测试
Measuring methods for semiconductor photodiode and phototransistor
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Microwave diodes and transistors
1 Scope This part of IEC 60747 gives requirements for the following categories of discrete devices
Semiconductor devices. Discrete devices - Microwave diodes and transistors
本标准规定发光二极管晶粒的共同要求事项、检验方法及个别格格式
Light Emitting Diode Dice
마이크로파 다이오드와 트랜지스터 중에서 마이크로파 전계 효과 트랜지스터에 관한 표준을
Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification
Semiconductor devices Discrete devices Part 4: Microwave diodes and transistors
Gives standards for the following discrete devices: - variable capacitance diodes and snap-off diodes; - mixer diodes and detector diodes; - avalanche
Semiconductor devices; discrete devices; part 4: microwave diodes and transistors
This part of IEC 60747 gives requirements for the following categories of discrete devices: – variable capacitance diodes and snap-off diodes
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
이 규격은 다음과 같은 반도체 개별 소자에 관한 표준을 규정한다.-가변 커패시턴스 다이
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
Semiconductor devices－Discrete devices－Part 4：Microwave diodes and transistors
Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
Semiconductor devices — Discrete devices Part 4 : Microwave diodes and transistors
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