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电子器件用金铜钎料检测

发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22

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军工检测 其他检测

SJ/T 11028-2015 的分析方法 EDTA容量法测定

本标准规定了测定电子器件用金铜钎料中铜的EDTA容量法。 本标准适用于电子器件用金铜钎料中铜含量的测定。测定范围(质量分数):18%~22

Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry

SJ/T 11028-1996 的分析方法 EDTA容量法测定

Methods of analysis for gold-copper brazing for electronic components - Determination of copper (Volumetric-EDTA method)

SJ/T 11029-1996 的分析方法 EDTA容量法测定镍

Methods of analysis for gold-copper brazing for electronic components - Determination of nickel (Volumetric-EDTA method)

SJ/T 11030-2015 中杂质铅、锌、磷的ICP-AES测定方法

本标准规定了用ICP-AES测定铅、磷、锌的测试方法。 本标准适用于电子器件用金铜及金镍钎料中铅、锌、磷的测定,测定范围(质量分数):铅0.0005 %~0.006%,磷0.0002% ~0.002%,锌0.001 % ~0.008

Test method for lead, phosphorus and zinc in gold copper and gold nickel brazing for electron device by ICP-AES

SJ/T 11030-1996 的分析方法 双硫腙分光光度法测定铅

Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of lead (spectrophotometric dithizone method)

SJ/T 11032-1996 的分析方法 原吸收分光光度法测定锌

Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of zinc (spectrophotometric atomic absorption method)

SJ/T 11031-1996 的分析方法 磷钼蓝分光光度法测定磷

Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of phosphorus (spectrophotometric phosphomolybdate method)

SJ/T 10753-1996 、银及其合

Gold, silver and their alloy brazing for electronic devices

SJ/T 11020-1996 的分析方法 碘量法测定

Methods of analysis for silver-copper brazing for electronic components - Determination of copper (iodimetric method)

ASTM F106-06 焊填属标准规范

1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices

Standard Specification for Brazing Filler Metals for Electron Devices

ASTM F106-12(2017 焊填属标准规范

1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices

Standard Specification for Brazing Filler Metals for Electron Devices

SJ/T 11025-1996 的分析方法 原吸收分光光度法测定铅

Methods of analysis for silver brazing for electronic components - Determination of lead (spectrophotometric-atomic absorption method)

SJ/T 11023-1996 的分析方法 原吸收分光光度法测定铋

Methods of analysis for silver brazing for electronic components - Determination of bismuth (spectrophotometric-atomic absorption method)

EN 61190-1-3:2007 连接材.第1-3部分:及助熔和不助熔固体的要求

Attachment materials for electronic assembly - Part 1-3: Requirements for electronic grade solder alloys and fluxed and non-fluxed solid solders for electronic soldering applications (Incorporates Amendment A1: 2010)

EN 61190-1-3:2002 连接材.第1-3部分:及助熔和不助熔固体的要求

Attachment Materials for Electronic Assembly Part 1-3: Requirements for Electronic Grade Solder Alloys and Fluxed and Non-Fluxed Solid Solders for Electronic Soldering Applications

SJ/T 11028-2015 的分析方法 EDTA容量法测定

本标准规定了测定电子器件用金铜钎料中铜的EDTA容量法。 本标准适用于电子器件用金铜钎料中铜含量的测定。测定范围(质量分数):18%~22

Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry

SJ/T 11028-1996 的分析方法 EDTA容量法测定

Methods of analysis for gold-copper brazing for electronic components - Determination of copper (Volumetric-EDTA method)

SJ/T 11029-1996 的分析方法 EDTA容量法测定镍

Methods of analysis for gold-copper brazing for electronic components - Determination of nickel (Volumetric-EDTA method)

SJ/T 11030-2015 中杂质铅、锌、磷的ICP-AES测定方法

本标准规定了用ICP-AES测定铅、磷、锌的测试方法。 本标准适用于电子器件用金铜及金镍钎料中铅、锌、磷的测定,测定范围(质量分数):铅0.0005 %~0.006%,磷0.0002% ~0.002%,锌0.001 % ~0.008

Test method for lead, phosphorus and zinc in gold copper and gold nickel brazing for electron device by ICP-AES

SJ/T 11030-1996 的分析方法 双硫腙分光光度法测定铅

Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of lead (spectrophotometric dithizone method)

SJ/T 11032-1996 的分析方法 原吸收分光光度法测定锌

Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of zinc (spectrophotometric atomic absorption method)

SJ/T 11031-1996 的分析方法 磷钼蓝分光光度法测定磷

Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of phosphorus (spectrophotometric phosphomolybdate method)

SJ/T 10753-1996 、银及其合

Gold, silver and their alloy brazing for electronic devices

SJ/T 11020-1996 的分析方法 碘量法测定

Methods of analysis for silver-copper brazing for electronic components - Determination of copper (iodimetric method)

ASTM F106-06 焊填属标准规范

1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices

Standard Specification for Brazing Filler Metals for Electron Devices

ASTM F106-12(2017 焊填属标准规范

1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices

Standard Specification for Brazing Filler Metals for Electron Devices

SJ/T 11025-1996 的分析方法 原吸收分光光度法测定铅

Methods of analysis for silver brazing for electronic components - Determination of lead (spectrophotometric-atomic absorption method)

SJ/T 11023-1996 的分析方法 原吸收分光光度法测定铋

Methods of analysis for silver brazing for electronic components - Determination of bismuth (spectrophotometric-atomic absorption method)

EN 61190-1-3:2007 连接材.第1-3部分:及助熔和不助熔固体的要求

Attachment materials for electronic assembly - Part 1-3: Requirements for electronic grade solder alloys and fluxed and non-fluxed solid solders for electronic soldering applications (Incorporates Amendment A1: 2010)

EN 61190-1-3:2002 连接材.第1-3部分:及助熔和不助熔固体的要求

Attachment Materials for Electronic Assembly Part 1-3: Requirements for Electronic Grade Solder Alloys and Fluxed and Non-Fluxed Solid Solders for Electronic Soldering Applications

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