发布时间:2024-05-27 17:49:26 - 更新时间:2024年06月29日 15:22
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本标准规定了测定电子器件用金铜钎料中铜的EDTA容量法。 本标准适用于电子器件用金铜钎料中铜含量的测定。测定范围(质量分数):18%~22
Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry
Methods of analysis for gold-copper brazing for electronic components - Determination of copper (Volumetric-EDTA method)
Methods of analysis for gold-copper brazing for electronic components - Determination of nickel (Volumetric-EDTA method)
本标准规定了用ICP-AES测定铅、磷、锌的测试方法。 本标准适用于电子器件用金铜及金镍钎料中铅、锌、磷的测定,测定范围(质量分数):铅0.0005 %~0.006%,磷0.0002% ~0.002%,锌0.001 % ~0.008
Test method for lead, phosphorus and zinc in gold copper and gold nickel brazing for electron device by ICP-AES
Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of lead (spectrophotometric dithizone method)
Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of zinc (spectrophotometric atomic absorption method)
Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of phosphorus (spectrophotometric phosphomolybdate method)
Gold, silver and their alloy brazing for electronic devices
Methods of analysis for silver-copper brazing for electronic components - Determination of copper (iodimetric method)
1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices
Standard Specification for Brazing Filler Metals for Electron Devices
1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices
Standard Specification for Brazing Filler Metals for Electron Devices
Methods of analysis for silver brazing for electronic components - Determination of lead (spectrophotometric-atomic absorption method)
Methods of analysis for silver brazing for electronic components - Determination of bismuth (spectrophotometric-atomic absorption method)
Attachment materials for electronic assembly - Part 1-3: Requirements for electronic grade solder alloys and fluxed and non-fluxed solid solders for electronic soldering applications (Incorporates Amendment A1: 2010)
Attachment Materials for Electronic Assembly Part 1-3: Requirements for Electronic Grade Solder Alloys and Fluxed and Non-Fluxed Solid Solders for Electronic Soldering Applications
本标准规定了测定电子器件用金铜钎料中铜的EDTA容量法。 本标准适用于电子器件用金铜钎料中铜含量的测定。测定范围(质量分数):18%~22
Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry
Methods of analysis for gold-copper brazing for electronic components - Determination of copper (Volumetric-EDTA method)
Methods of analysis for gold-copper brazing for electronic components - Determination of nickel (Volumetric-EDTA method)
本标准规定了用ICP-AES测定铅、磷、锌的测试方法。 本标准适用于电子器件用金铜及金镍钎料中铅、锌、磷的测定,测定范围(质量分数):铅0.0005 %~0.006%,磷0.0002% ~0.002%,锌0.001 % ~0.008
Test method for lead, phosphorus and zinc in gold copper and gold nickel brazing for electron device by ICP-AES
Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of lead (spectrophotometric dithizone method)
Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of zinc (spectrophotometric atomic absorption method)
Methods of analysis for gold-copper and gold-nickel brazing for electronic components - Determination of phosphorus (spectrophotometric phosphomolybdate method)
Gold, silver and their alloy brazing for electronic devices
Methods of analysis for silver-copper brazing for electronic components - Determination of copper (iodimetric method)
1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices
Standard Specification for Brazing Filler Metals for Electron Devices
1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices
Standard Specification for Brazing Filler Metals for Electron Devices
Methods of analysis for silver brazing for electronic components - Determination of lead (spectrophotometric-atomic absorption method)
Methods of analysis for silver brazing for electronic components - Determination of bismuth (spectrophotometric-atomic absorption method)
Attachment materials for electronic assembly - Part 1-3: Requirements for electronic grade solder alloys and fluxed and non-fluxed solid solders for electronic soldering applications (Incorporates Amendment A1: 2010)
Attachment Materials for Electronic Assembly Part 1-3: Requirements for Electronic Grade Solder Alloys and Fluxed and Non-Fluxed Solid Solders for Electronic Soldering Applications