发布时间：2024-05-27 17:49:26 - 更新时间：2024年06月29日 15:22
点击量：0
有样品要送检？试试一键送检，5分钟极速响应
在线提交检测需求
对接客服咨询检测
本标准规定了半导体集成电路快闪存储器电参数、时间参数和存储单元功能测试的基本方法。 本标准适用于半导体集成电路领域中快闪存储器电参数、时间参数和存储单元功能的测试
Semiconductor integrated circuit.Measuring methods for flash memory
IEC电子元器件质量评定体系遵循IEC的章程，并在IEC的授权下进行工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本空白详细规范是半导体器件的一系列空白详细规范之一，并且与下列标准一起使用
Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
서 문 이 규격은 1993년 초판으로 발행된 IEC 60748-2-8(1993-07
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
Semiconductor devices —Integrated circuits — Part 2-11: Digital integrated circuits —Blank detail specification for single supply integrated circuit
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
서 문 이 규격은 1999년에 초판으로 발행된 IEC 60748-2-11(1999
Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
Semiconductor devices. Integrated circuits. Digital integrated circuits
Semiconductor devices and integrated circuits
Semiconductor devices and integrated circuits
本标准规了下列集成电路（IC）分类体系树（见图1）中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
이 규격은 집적 회로 동적 읽기/쓰기 메모리 개별 규격 지침에 대하여 규정한다. 본 개별
Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
Defines, in compliance with the IEC Quality Assessment System for Electronic Components, information to be given for: mechanical description, short
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
本标准规定了半导体集成电路快闪存储器电参数、时间参数和存储单元功能测试的基本方法。 本标准适用于半导体集成电路领域中快闪存储器电参数、时间参数和存储单元功能的测试
Semiconductor integrated circuit.Measuring methods for flash memory
IEC电子元器件质量评定体系遵循IEC的章程，并在IEC的授权下进行工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本空白详细规范是半导体器件的一系列空白详细规范之一，并且与下列标准一起使用
Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
서 문 이 규격은 1993년 초판으로 발행된 IEC 60748-2-8(1993-07
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
Semiconductor devices —Integrated circuits — Part 2-11: Digital integrated circuits —Blank detail specification for single supply integrated circuit
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
서 문 이 규격은 1999년에 초판으로 발행된 IEC 60748-2-11(1999
Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
Semiconductor devices. Integrated circuits. Digital integrated circuits
Semiconductor devices and integrated circuits
Semiconductor devices and integrated circuits
本标准规了下列集成电路（IC）分类体系树（见图1）中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
이 규격은 집적 회로 동적 읽기/쓰기 메모리 개별 규격 지침에 대하여 규정한다. 본 개별
Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
Defines, in compliance with the IEC Quality Assessment System for Electronic Components, information to be given for: mechanical description, short
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
首页
点击咨询
