GB/T 36477-2018 半导体集成电路 快闪存储器测试方法
本标准规定了半导体集成电路快闪存储器电参数、时间参数和存储单元功能测试的基本方法。 本标准适用于半导体集成电路领域中快闪存储器电参数、时间参数和存储单元功能的测试
Semiconductor integrated circuit.Measuring methods for flash memory
GB/T 17574.10-2003 半导体器件 集成电路 第2-10部分;数字集成电路集成电路动态读/写存储器空白详细规范
IEC电子元器件质量评定体系遵循IEC的章程，并在IEC的授权下进行工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本空白详细规范是半导体器件的一系列空白详细规范之一，并且与下列标准一起使用
Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
KS C IEC 60748-2-8:2002 半导体器件.集成电路.第2部分:数字集成电路.第8节:集成电路静态读、写存储器
서 문 이 규격은 1993년 초판으로 발행된 IEC 60748-2-8(1993-07
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
BS IEC 60748-2-11:1999 半导体器件.集成电路.数字集成线路.单电集成电路可擦、可编程、只读存储器集成电路空白详细规范
Semiconductor devices —Integrated circuits — Part 2-11: Digital integrated circuits —Blank detail specification for single supply integrated circuit
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
KS C IEC 60748-2-11:2002 半导体器件.集成电路.第2-11部分:数字集成线路.可擦可编程只读存储器
서 문 이 규격은 1999년에 초판으로 발행된 IEC 60748-2-11(1999
Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
BS IEC 60748-4:1997 半导体器件.集成电路.接口集成电路
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
BS IEC 60748-2:1997 半导体器件.集成电路.数字集成电路
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
BS IEC 60748-2:1998 半导体器件 集成电路 数字集成电路
Semiconductor devices. Integrated circuits. Digital integrated circuits
KS C IEC 60050-521-2002(2022 半导体器件和集成电路
Semiconductor devices and integrated circuits
KS C IEC 60050-521-2002(2017 半导体器件和集成电路
Semiconductor devices and integrated circuits
GB/T 20515-2006 半导体器件 集成电路 第5部分:半定制集成电路
本标准规了下列集成电路（IC）分类体系树（见图1）中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
KS C IEC 60748-2-10:2001 半导体器件.集成电路.第2部分:数字集成电路.第10节:集成电路动态读/写存储器空白详细规范
이 규격은 집적 회로 동적 읽기/쓰기 메모리 개별 규격 지침에 대하여 규정한다. 본 개별
Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
IEC 60748-2-10:1994 半导体器件 集成电路 第2部分:数字集成电路 第10节:集成电路动态读/写存储器空白详细规范
Defines, in compliance with the IEC Quality Assessment System for Electronic Components, information to be given for: mechanical description, short
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
KS C IEC 60748-2-8-2002(2017 半导体器件集成电路第2部分:数字集成电路第8节:集成电路静态读写存储器空白详细规范
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-2-8-2002(2022 半导体器件集成电路第2部分:数字集成电路第8节:集成电路静态读/写存储器空白详细规范
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
GB/T 36477-2018 半导体集成电路 快闪存储器测试方法
本标准规定了半导体集成电路快闪存储器电参数、时间参数和存储单元功能测试的基本方法。 本标准适用于半导体集成电路领域中快闪存储器电参数、时间参数和存储单元功能的测试
Semiconductor integrated circuit.Measuring methods for flash memory
GB/T 17574.10-2003 半导体器件 集成电路 第2-10部分;数字集成电路集成电路动态读/写存储器空白详细规范
IEC电子元器件质量评定体系遵循IEC的章程，并在IEC的授权下进行工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子元器件需进一步试验而为其他所有参加国同样接受。 本空白详细规范是半导体器件的一系列空白详细规范之一，并且与下列标准一起使用
Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
KS C IEC 60748-2-8:2002 半导体器件.集成电路.第2部分:数字集成电路.第8节:集成电路静态读、写存储器
서 문 이 규격은 1993년 초판으로 발행된 IEC 60748-2-8(1993-07
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
BS IEC 60748-2-11:1999 半导体器件.集成电路.数字集成线路.单电集成电路可擦、可编程、只读存储器集成电路空白详细规范
Semiconductor devices —Integrated circuits — Part 2-11: Digital integrated circuits —Blank detail specification for single supply integrated circuit
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
KS C IEC 60748-2-11:2002 半导体器件.集成电路.第2-11部分:数字集成线路.可擦可编程只读存储器
서 문 이 규격은 1999년에 초판으로 발행된 IEC 60748-2-11(1999
Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
BS IEC 60748-4:1997 半导体器件.集成电路.接口集成电路
Gives the requirements for certain categories or subcategories of interface integrated circuits. To be read in conjunction with BS 6493-1.1:1984, BS
Semiconductor devices. Integrated circuits. Interface integrated circuits
BS IEC 60748-2:1997 半导体器件.集成电路.数字集成电路
This part of IEC 60748 is applicable for the following categories or subcategories of devices: - combinatorial and sequential digital circuits
Semiconductor devices - Integrated circuits - Digital integrated circuits
BS IEC 60748-2:1998 半导体器件 集成电路 数字集成电路
Semiconductor devices. Integrated circuits. Digital integrated circuits
KS C IEC 60050-521-2002(2022 半导体器件和集成电路
Semiconductor devices and integrated circuits
KS C IEC 60050-521-2002(2017 半导体器件和集成电路
Semiconductor devices and integrated circuits
GB/T 20515-2006 半导体器件 集成电路 第5部分:半定制集成电路
本标准规了下列集成电路（IC）分类体系树（见图1）中有关半定制集成电路子类的标准
Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
KS C IEC 60748-2-10:2001 半导体器件.集成电路.第2部分:数字集成电路.第10节:集成电路动态读/写存储器空白详细规范
이 규격은 집적 회로 동적 읽기/쓰기 메모리 개별 규격 지침에 대하여 규정한다. 본 개별
Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
IEC 60748-2-10:1994 半导体器件 集成电路 第2部分:数字集成电路 第10节:集成电路动态读/写存储器空白详细规范
Defines, in compliance with the IEC Quality Assessment System for Electronic Components, information to be given for: mechanical description, short
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
KS C IEC 60748-2-8-2002(2017 半导体器件集成电路第2部分:数字集成电路第8节:集成电路静态读写存储器空白详细规范
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-2-8-2002(2022 半导体器件集成电路第2部分:数字集成电路第8节:集成电路静态读/写存储器空白详细规范
Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
编辑：北检院编辑部
