光电子材料检测

GOST R 52250-2004 电子工程材料.光刻工艺抗蚀剂.通用规范

Electronic engineering materials. Resists for lithography processes. General specifications

ISO 18118:2004 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性因子的使用指南

This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative

Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

KS D ISO 18118:2005 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性因子的使用指南

이 규격은 오제(Auger) 전자 분광기와 X선 광전자 분광기를 사용하여, 균질 재료의 정

Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

ISO 18118:2015 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性因子的使用指南

This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative

Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

JIS T 0306:2002 用X射线光电子光谱法分析金属生物材料形成的源膜的状态

この規格は，金属系生体材料の表面に形成する不動態皮膜をX線光電子分光法(XPS又はESCAともいう。)を用いて，状態分析する方法について規定する

Analysis of state for passive film formed on metallic biomaterials by X-ray photoelectron spectroscopy

BS ISO 18118:2005 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性系数的使用指南

This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative

Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS ISO 18118:2015 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性系数的使用指南

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS ISO 19668:2017 表面化学分析 X射线光电子能谱 均质材料中元素检测限的估计和报告

Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials

ISO 19668:2017 表面化学分析.X射线光电子能谱学.均匀材料中元素检测极限的估算和报告

This document specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data

Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials

KS D ISO 18118-2005(2020 表面化学分析俄歇电子能谱和X射线光电子能谱均匀材料定量分析用实验测定的相对灵敏度因子的使用指南

Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h

JIS K 0167:2011 表面化学分析.俄歇电子光谱和X射线光电子能谱学.匀质材料定量分析用实验室测定相对敏感因子的使用指南

Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

AS ISO 18118:2006 表面化学分析．俄歇电子能谱法和X射线光电子光谱法．均质材料定量分析中实验测定的相对灵敏系数使用指南

Adopts ISO 18118:2004 to give guidance on the measurement and use of experimentally determined relative sensitivity factors for quantitative analysis

Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS EN 60811-402:2012 电缆和纤维光缆.非金属材料试验方法.电子设备用机电元件检验.水吸收试验

Electric and optical fibre cables. Test methods for non-metallic materials. Miscellaneous tests. Water absorption tests

BS ISO 18554:2016 表面化学分析. 电子光谱. 采用X射线光电子能谱分析法对材料进行分析的X射线的意外降解的识别, 评估和修正程序

Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy

ISO 18554:2016 表面化学分析. 电子光谱. 采用X射线光电子能谱分析法对材料进行分析的X射线的意外降解的识别, 评估和修正程序

Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy

GOST R 52250-2004 电子工程材料.光刻工艺抗蚀剂.通用规范

Electronic engineering materials. Resists for lithography processes. General specifications

ISO 18118:2004 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性因子的使用指南

This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative

Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

KS D ISO 18118:2005 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性因子的使用指南

이 규격은 오제(Auger) 전자 분광기와 X선 광전자 분광기를 사용하여, 균질 재료의 정

Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

ISO 18118:2015 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性因子的使用指南

This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative

Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

JIS T 0306:2002 用X射线光电子光谱法分析金属生物材料形成的源膜的状态

この規格は，金属系生体材料の表面に形成する不動態皮膜をX線光電子分光法(XPS又はESCAともいう。)を用いて，状態分析する方法について規定する

Analysis of state for passive film formed on metallic biomaterials by X-ray photoelectron spectroscopy

BS ISO 18118:2005 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性系数的使用指南

This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative

Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS ISO 18118:2015 表面化学分析.俄歇电子光谱法和X射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性系数的使用指南

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS ISO 19668:2017 表面化学分析 X射线光电子能谱 均质材料中元素检测限的估计和报告

Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials

ISO 19668:2017 表面化学分析.X射线光电子能谱学.均匀材料中元素检测极限的估算和报告

This document specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data

Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials

KS D ISO 18118-2005(2020 表面化学分析俄歇电子能谱和X射线光电子能谱均匀材料定量分析用实验测定的相对灵敏度因子的使用指南

Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h

JIS K 0167:2011 表面化学分析.俄歇电子光谱和X射线光电子能谱学.匀质材料定量分析用实验室测定相对敏感因子的使用指南

Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

AS ISO 18118:2006 表面化学分析．俄歇电子能谱法和X射线光电子光谱法．均质材料定量分析中实验测定的相对灵敏系数使用指南

Adopts ISO 18118:2004 to give guidance on the measurement and use of experimentally determined relative sensitivity factors for quantitative analysis

Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS EN 60811-402:2012 电缆和纤维光缆.非金属材料试验方法.电子设备用机电元件检验.水吸收试验

Electric and optical fibre cables. Test methods for non-metallic materials. Miscellaneous tests. Water absorption tests

BS ISO 18554:2016 表面化学分析. 电子光谱. 采用X射线光电子能谱分析法对材料进行分析的X射线的意外降解的识别, 评估和修正程序

Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy

ISO 18554:2016 表面化学分析. 电子光谱. 采用X射线光电子能谱分析法对材料进行分析的X射线的意外降解的识别, 评估和修正程序

Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy